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10 protocols using sta449f3 analyzer

1

Characterization of Crystalline Phases

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The crystalline phases were characterized with X-ray powder diffraction (XRD, Panalytical X’pert PRO MRD, Holland) equipped with Cu Kα radiation. JSM 7600F field emission scanning electron microscope (FE-SEM) was used to observe the morphology. Transmission electron microscopy (TEM) and high-resolution TEM (HR-TEM) observations were carried out with JEM-2100 electron microscope. Thermogravimetry (TG) measurement was performed on a Netzsch STA 449F3 analyzer from 30 to 500 °C at a rate of 10 °C min−1 in N2. The chemical composition was determined by the direct-reading inductively coupled plasma emission spectrometer (ICP-OES, Optima 4300DV, USA) for Na, Fe contents, and by elemental analysis (EA, Vario Micro cube, German) for C, N contents. X-ray photoelectron spectroscopy (XPS) was used to analyze the valence state of elements by Shimadzu/Kratos Axis Ultra-DLD with Al Kα. Nitrogen adsorption/desorption isotherms were conducted on a Micromeritics analyzer (ASAP 2020) at 77 K. The vibration states of existing functional groups were examined via Fourier transform infrared spectroscopy (FTIR, Thermo Nicolet Nexus 670 FTIR spectrometer).
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2

Characterization of CPE Membranes

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The X-ray diffraction (XRD) was performed on a D/MAX-RB diffractometer (Rigaku, Tokyo, Japan) using a Cu Kα radiation (λ = 0.1541 nm) with 2θ from 0° to 10°. N2 adsorption measurements were performed with an ASAP2020 adsorption analyzer (Micromeritics, Atlanta, Georgia, USA) to measure the surface areas and pore sizes. The top and cross-section scopes of the CPE membranes were characterized by scanning electron microscopy (SEM, Hitachi JEM-7500F, ZEISS, Jena, Germany) and transmission electron microscopy (TEM, JEM-2100F, JEOL, Tokyo, Japan); the elemental distribution was analyzed by energy-dispersive X-ray spectroscopy (EDS, ZEISS, Jena, Germany). The chemical structure of the samples was demonstrated through Fourier transform infrared spectroscopy (FT-IR) on a Nicolet6700 spectrometer (Therno Nicolet, Madison, Wisconsin, USA). TGA analysis (NETZSCH-STA449F3 analyzer, Selb, Germany) of the samples was carried out from 30 to 800 °C under N2. The mechanical properties of the as-prepared membranes were obtained from tensile tests using a stretch testing machine (CMT6202, SAAS, Shenzhen, China) at a stretching speed of 50 mm·min−1.
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3

Multimodal Analysis of Magnetic Material

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Using the Nexus 870 FT-IR spectrometer, IR spectroscopy was performed with KBr particles in the range of 400–4000 cm−1. The elemental analyses of C, H, and N were recorded on a PerkinElmer 240C elemental analyzer. TGA was measured from 30 to 800 °C on a NETZSCH STA 449F3 analyzer at a heating rate of 5 °C min−1 under a N2 atmosphere. The ac magnetic susceptibility data were collected using a MPMS-XL7 Squid magnetometer (test conditions: Hac = 5 Oe, Hdc = 0 Oe, frequencies ranging from 1 to 1488 Hz). The dc magnetic susceptibility data were measured in the temperature range of 1.8–300 K. The experimental susceptibilities were corrected for the diamagnetism of the samples as estimated from Pascal's tables31d and the sample holder by a previous calibration. Pulsed-high-field magnetization measurements were performed at 1.9 K using a home-made pulsed field up to 30 T at the Wuhan National High Magnetic Field Center, P. R. China. The sweeping rate for the magnetic field was 5.0 kT s−1 on an average. The low-field magnetization data (on SQUID) were used to calibrate the high-field magnetization curve, which is a standard way to process the high field magnetization data.31e
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4

Characterization of Novel Compounds

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All chemicals were commercially available and used as received without further purification. Elemental analyses (CHN) were performed using a Vario EL elemental analyzer. FT-IR spectra were recorded from KBr pellets over the range of 4000–400 cm−1 on a Nicolet Avatar 360 FT-IR spectrometer. Thermogravimetric curves were measured using a Netzsch STA449 F3 analyzer at a heating rate of 10 °C min−1 from room temperature to 900 °C in air. Fluorescence measurements were carried out with a SHIMADZU RT5301PC spectrofluorophotometer. The lifetimes of the excited states were measured with an Edinburgh Instruments FLS920 fluorescence spectrophotometer. X-ray powder diffraction (XRPD) intensities were measured at 293 K using a D8 Advance (Bruker) diffractometer (Cu-Kα; λ = 1.54056 Å). The simulated PXRD patterns were calculated from the single crystal diffraction data using PowderCell.
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5

Characterization of Graphene Nanoplatelets

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Liquid phase exfoliated graphene nano platelets (GNPs) with around 10 layers were supplied by Nanjing XFNANO Materials Tech Co., Ltd. (China). Poly(styrene-co-maleic anhydride) (SMA-1000) with an approximately 1 : 1 mole ratio was obtained from Cray Valley (France), and its physical and chemical properties are listed in Table 1. Sulfuric acid (95–98%), nitric acid (65%), and N,N-dimethylformamide (DMF) were purchased from Sinopharm Chemical Reagent Co., Ltd.
The synthesized samples were prepared separately for analysis and testing by various methods. Fourier transform infrared (FTIR, Nicolet iS10, Thermo Fisher Scientific, USA) spectroscopy was used to measure the functional groups of the modified GNPs and tested in the range of 500 to 4000 cm−1. Thermogravimetric analysis (TGA) was carried out using an STA449F3 analyzer (Netzsch, Germany) from room temperature to 800 °C at a heating rate of 10 °C min−1 under the nitrogen atmosphere. The microstructure of GNPs was characterized by field emission scanning electron microscopy (FESEM, SU8010, HITACHI, Japan). The absorbance of the dispersion was characterized using a DR6000 ultraviolet-visible (UV-vis) spectrophotometer (Hach, USA) with a selected wavelength of 270 nm.
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6

Characterization of Luminescent Compounds

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All reagents and solvents employed were commercially available and used without further purification. The C, H and N microanalyses were carried out with a PE 2400 Series II elemental analyzer. The IR spectra were recorded with a Shimadzu IR Affinity-1 spectrometer using the KBr pellet technique. Thermogravimetric analysis was performed on a NETZSCH STA 449F3 analyzer. The powder X-ray diffraction (PXRD) measurement was carried out using a Shimadzu XRD-7000 diffractometer with Cu Kα radiation (λ = 1.5418 Å). Photoluminescence spectra were obtained on a Hitachi F-4500 fluorescence spectrophotometer at room temperature.
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7

Multi-Technique Characterization of Materials

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Powder X-ray diffraction patterns of the samples were obtained with Cu Kα radiation (λ = 1.54178 Å) at a scan rate of 4° min−1. Fourier-transform infrared spectroscopy (FT-IR) was conducted on a Nicolet 6700 FT-IR spectrophotometer. Single-component vapor-phase adsorption experiments were performed using a Micromeritics ASAP 2460 equipped with a vapor dosing tube. 1H NMR spectra were recorded using a Bruker Advance 400 NMR spectrometer. The N2 adsorption–desorption isotherm was obtained on 3H-2000PS1/2A series automatic surface and aperture analyzers (BeiShiDe Instruments). Thermogravimetric analysis (TGA) was carried out using a NETZSCH STA 449F3 analyzer in a N2 atmosphere with a flow rate of 10 mL min−1. The samples were heated at a rate of 10 K min−1. MicroED data were collected by transmission electron microscopy (JEM-2100 Plus) and operated at 200 kV with a MerlinEM fast pixelated detector (512 × 512 pixels, pixel size 55 μm). A 3D reciprocal lattice was constructed from the ED frames using XDS, from which the unit cell parameters can be obtained with the indexed reflection and extracted intensities. The adsorption kinetic experiments were conducted on a dynamic vapor sorption analyzer (BSD-DVS).
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8

Physicochemical Characterization of PDDA@Si-GO Nanocomposite

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The zeta potentials of the PDDA@Si and GO solution were measured on a Zeta PALS (American Brookhaven) at room temperature. X-ray powder diffraction (XRD) measurements were measured with an XPERT-PRO diffractometer using Cu Kα radiation (λ = 0.15406 nm) with the 2θ range from 10° to 80°. Thermogravimetric analysis (TGA) was measured with a STA449F3 analyzer (Netzsch, Germany) at air atmosphere with a ramp rate of 10 °C min−1. The N2 absorption/desorption isotherms associated with specific surface area and pore diameter distribution data were performed on a V-Sorb 2800 P analyzer under 77 K. Raman spectroscopy analysis was measured by using the Renishaw (RM 1000-Invia) with the laser (λ = 785 nm) in a wavenumber range of 100–3500 cm−1. Scanning electron microscopy (SEM) was carried out with a FEIINSPECT-Fat with 20 KV accelerating voltage. High-resolution transmission electron microscopy (HRTEM) was acquired on a Libra 200 FE.
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9

Characterization of NiCoMnO4@graphene Composites

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The crystalline structures of the as-prepared composites are characterized by X-ray diffraction (XRD, Rigaku MiniFlex II) using CuKα radiation (λ = 0.15405 nm). The surface morphologies of the NiCoMnO4 and NiCoMnO4@graphene are determined by a field-emission scanning electron microscopy (FESEM; HITACHI, SU-8010) equipped with an energy-dispersive spectroscopy (EDS). The microstructure of NiCoMnO4 is further examined by on a Tecnai G2 F20 S-Twin high resolution transmission electron microscopy. The chemical state and composition are analyzed using X-ray photoelectron spectroscopy (Thermo Scientific ESCALAB 250Xi). Nitrogen adsorption–desorption isotherms are measured at 77 K on a Micromeritics Tristar 3020 analyzer. The specific surface areas are calculated according to the Brunauer–Emmett–Teller method and the pore size distribution is determined based on Barrett Joyner and Halenda model. Thermogravimetric analysis (TGA) of NiCoMnO4@graphene are conducted on a Netzsch STA449F3 analyzer at a heating rate of 5 °C min−1 under an air flow.
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10

Structural Characterization of Metal-organic Frameworks

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Powder X-Ray diffraction (PXRD) patterns of samples were carried out on a D/max 2500 VL/PC diffractometer (Japan) equipped with Cu Kα radiation (λ = 1.54060 Å). FTIR spectra were tested on a Bruker Tensor 27 FT/IR spectrophotometer. Thermogravimetric analyses of crystal samples were measured on a Netzsch STA449F3 analyzer under the oxygen atmosphere with a heating rate of 10 °C min−1. Single-crystal XRD data of Co-PMOF, Fe-PMOF, Ni-PMOF, and Zn-PMOF were measured on a Bruker APEXII CCD diffractometer with graphite-monochromated Mo Kα radiation (λ = 0.71073 Å) at 296 K. All the structures were solved by direct method using SHELXT program and refined on an Olex2 (link) software. Multi-scan technique was used to absorption corrections. The TBA+ ion could not be detected in the structure and some other guest molecules were defined as disorder. The detailed crystallographic information of these crystals was listed in Supplementary Table 2. The CCDC number of Co-PMOF, Fe-PMOF, Ni-PMOF, and Zn-PMOF (NNU-13) were 1832596 [10.5072/ccdc.csd.cc1zjbmg], 1832597 [10.5072/ccdc.csd.cc1zjbnh], 1832598 [10.5072/ccdc.csd.cc1zjbpj], and 1181860 [10.5072/ccdc.csd.cc1ytd38] respectively.
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