Evo ma 25
The EVO MA 25 is a scanning electron microscope (SEM) designed for materials analysis. It provides high-resolution imaging and analytical capabilities to investigate the surface and internal structure of a wide range of materials. The EVO MA 25 is equipped with advanced features that enable users to obtain detailed information about the composition, morphology, and properties of their samples.
Lab products found in correlation
35 protocols using evo ma 25
Scanning Electron Microscopy of Electrospun Membranes
Characterization of PLA and PLLA Microspheres
Vascular Graft Membrane Morphology Analysis
Metallographic Analysis of Aluminum Alloy
All samples were tested in the T4 condition (solubilization, tempering, and natural aging).
The grain size has been determined according to ASTM (American Society for Testing and Materials International, West Conshohocken, PA, USA) size. Reported values correspond to the number of grains per square inch at 100X magnification.
The fracture surfaces were observed by means of a scanning electron microscope (SEM) (Zeiss Evo MA 25). Moreover, a microanalysis using energy-dispersive X-ray spectroscopy (Oxford AZtec Energy X Max 80) was carried out on the fracture surface to detect the elements’ distribution.
Metallic Powder Characterization and LPBF Fabrication
The LPBF fabrication was conducted in a Renishaw AM400 machine equipped with a ytterbium fiber laser with 400 W of maximum power. The processing parameters, based on a previously published work [30 (link)], are shown in
Analyzing Al-based MWCNTs Nanocomposite Morphology
Scanning Electron Microscopy of Materials
Characterizing PTFE Nanofiber Membranes
Characterization of Surface Topography and Wettability
Characterization of CIP Powder Morphology
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