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Carbon coating

Manufactured by Ted Pella
Sourced in United States

Carbon coating is a thin layer of carbon applied to the surface of samples or materials in a vacuum chamber. The primary function of carbon coating is to enhance the conductivity and contrast of the sample, which is essential for high-quality imaging and analysis using electron microscopy techniques.

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2 protocols using carbon coating

1

Characterizing Gold Nanoparticles via TEM

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The size and morphology of AuNP and rHDL-AuNP samples were determined by using TEM. For imaging, the particles were deposited onto a 300-mesh copper grid with a carbon coating (Ted Pella, Inc., Redding, CA, USA) and dried using filter paper before staining with 2% uranyl acetate. The images were obtained with a JEM1200-EX II electron microscope (JEOL, Tokyo, Japan) at 90.0 keV.
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2

Characterization of Tick-Borne Encephalitis Virus

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TBEV samples were applied on standard copper grids for transmission electron microscopy with a carbon coating (Ted Pella, Redding, CA, USA), and treated in a glow discharge atmosphere for 45 s in a Pelco EasyGlow apparatus (Ted Pella, Redding, CA, USA). For NC-TEM, the samples were negatively stained with either a 1% aqueous solution of uranyl acetate or a 2% aqueous solution of ammonium molybdate. Ammonium molybdate was used as a substitute for uranyl acetate in STEM-EELS experiments because the uranium M4,5 line precedes the phosphorus line in the characteristic electron energy loss spectra, and, thus, makes correct approximations of the background component difficult.
TEM images were obtained using a Jeol JEM-2100 electron microscope (JEOL, Japan) equipped with a LaB6 electron source and an accelerating voltage of 200 kV. To obtain characteristic electron energy loss spectra (EELS) and to build maps of the spatial distribution of elements, the dark-field scanning transmission electron microscopy (STEM) mode, in combination with a Gatan GIF Quantum ER spectrometer (Gatan, Pleasanton, CA, USA), was used. To reduce the effects of contamination and to stabilize the sample under the electron beam in STEM, a cooling holder JEOL 21090 (JEOL, Tokyo, Japan), supporting the sample at −180 °C, was used.
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