Nanoscope iiia multimode afm
The Nanoscope IIIa Multimode AFM is an atomic force microscope (AFM) produced by Bruker. It is designed to provide high-resolution imaging and analysis of surface topography at the nanoscale level. The instrument utilizes a cantilever-based sensing system to detect and measure the interactions between a sharp probe and the sample surface.
5 protocols using nanoscope iiia multimode afm
Tapping Mode AFM Imaging Protocol
Atomic Force Microscopy of GPVI-Fibrinogen Interactions
For expression and purification of recombinant GPVI and fibrinogen/αC fragments, purification of plasma fibrinogen/αC fragments, preparation and purification of X-, D-, E-fragment and D-dimer, FITC labeling of GPVI, SD (sodium dodecyl sulfate-dithiothreitol) test, and additional SPR experiments, see supplemental methods.
Imaging GPVI/Fibrinogen Interactions by AFM
AFM Visualization of Protein-DNA Complexes
AFM Imaging of Protein-DNA Complexes
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