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Nanoscope iiia scanning probe microscope

Manufactured by Digital Instruments
Sourced in United States

The Nanoscope® IIIa Scanning Probe Microscope is a high-performance instrument used for nanoscale imaging and analysis. It employs scanning probe microscopy techniques to capture detailed topographical and material property information of samples at the atomic and molecular scale.

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3 protocols using nanoscope iiia scanning probe microscope

1

Measuring Ag Nanobelts Thickness by AFM

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The thickness of ca. 10 nanobelts was measured for each sample by atomic force microscopy (AFM). A multimode Nanoscope IIIa scanning probe microscope (Digital Instruments) mounted with Si tips with tip radius less than 10 nm and force constant at ca. 40 N/m was operated in a tapping mode. The resonant frequency and scanning rate were set at ca. 300 kHz and 1 Hz respectively. AFM specimen was the same as that used for TEM experiments, i.e. droplets of Ag nanobelts suspended in ethanol were dried on the carbon-coated copper grid.
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2

Characterization of Graphene Oxide Materials

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Zeta potentials were measured using a Nano-S90 ZetaSizer (Malvern Instruments, Malvern, UK). Ultraviolet (UV)/visible spectra were analyzed by conducting a wavelength scan in a UV/vis spectrophotometer (PerkinElmer U-2800, Waltham, MA, USA). Transmission electron microscopy (TEM) (H7600, Hitachi) was used for cross-sectional analysis of the GO dispersion, which was added to a carbon-coated copper grid and dried under infrared radiation. GO dispersion-adsorbed mica squares were used for atomic force microscopy (AFM) analysis using a Nanoscope® IIIa Scanning Probe Microscope (Digital Instruments, Buffalo, NY, USA). Fourier transform infrared (FTIR) spectroscopy analyses were performed using a Thermo Scientific Nicolet Nexus 670 FTIR spectrophotometer (Thermo Scientific, Waltham, MA, USA). Powder X-ray diffraction (XRD) patterns were recorded using an XRD (X’Pert PRO MPD Diffractometer, PANalytical, Almelo, the Netherlands).
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3

Comprehensive Physicochemical Characterization of CaCO3-Based Nanomaterials

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Particle size, polydispersity index (PDI), and zeta potential of CaCO3, CaCO3/Rapa, and CD9-Lac/CaCO3/Rapa were analyzed using a Zetasizer Nano ZS (Malvern Instruments, Malvern, UK) equipped with Nano DTS software (version 6.34). Morphological analyses of CaCO3/Rapa and CD9-Lac/CaCO3/Rapa were carried out using TEM and AFM. TEM (H7600, Hitachi, Tokyo, Japan) analysis of carbon-coated copper grid loaded with CaCO3/Rapa or CD9-LAC/CaCO3/Rapa dispersion was conducted using 2% phosphotungstic acid solution as negative stain. Similarly, CaCO3/Rapa or CD9-LAC/CaCO3/Rapa deposited on ultraflat mica square plates (Ted Pella, Inc., USA) were used for AFM analysis with a Nanoscope® IIIa Scanning Probe Microscope (Digital Instruments, USA). Furthermore, FTIR analyses of dried Lac-PEG-COOH conjugate and CD9-Lac/CaCO3/Rapa were carried out using a Thermo Scientific Nicolet Nexus 670 FTIR spectrophotometer.
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