S 4700
The S-4700 is a field emission scanning electron microscope (FE-SEM) manufactured by Hitachi. It provides high-resolution imaging and analytical capabilities for a wide range of applications. The S-4700 utilizes a field emission electron source to produce a stable, high-brightness electron beam, enabling high-resolution imaging of samples.
Lab products found in correlation
680 protocols using s 4700
Comprehensive Material Characterization
Morphological and Elemental Characterization of CO2 Electrolysis Cathodes
Cross-sections of the CsH2PO4/SiP2O7 electrolyte and the (Cu–Ru)–ZrO2 cathode before and after the galvanostatic CO2 electrolysis test at 50 mA cm−2 and 220°C were observed with the SEM (Hitachi S-4700). Cross-sections of the (Cu–Pd)–ZrO2, Cu–ZrO2, and (Cu–Ru)–SiO2 cathodes after the CO2 electrolysis tests were also observed. Elemental mappings were recorded with an EDX detector (Horiba Super Xerophy).
Comprehensive Characterization of CZTSSe Solar Cells
Characterization of Nano-Au Colloids
The suspension stability of nano-Au colloids can be determined by their Zeta potential [20 ,21 (link)]. A high Zeta potential indicates an even distribution of nanoparticles in DW and high suspension stability, whereas a low Zeta potential suggests low suspension stability and causes nanoparticles to collide with each other and precipitate. In addition, because like electric charges repel each other, a Zeta potential with an absolute value of 30 mV indicates high suspension stability in nanoparticles [22 (link)].
Characterization of Polymer Membrane Materials
Liposome Morphology Analysis by Cryogenic FE-SEM
Characterization of MWCNT Electrode Electrolyte Infilling
Characterization of CZTSSe Solar Cells
Plasma Treatment Effects on Surface Properties
Characterization of Zirconia Nanoparticles
To confirm the addition of zirconia nanoparticles and their surface structure, platinum was coated on the surface using a sputter coater (E-1030, Hitachi Co. Ltd, Tokyo, Japan) in a vacuum for 60s, and the surface was observed using field emission scanning electron microscopy (FE-SEM; S-4700, Hitachi Co. Ltd, Tokyo, Japan). The elemental composition was analyzed using energy-dispersive X-ray spectroscopy (EDX; S-4700, Hitachi Co. Ltd, Tokyo, Japan).
The shape and surface roughness of the specimens were observed using a nanosurface 3D optical profiler (3DOP; NV-E1000, Nano System Inc, Daegu, Korea) (n = 3). The degree of surface hydrophilicity was measured using a contact angle analyzer (video-based contact angle measuring device, Phoenix 300, SEO Co. Ltd, Suwon, Korea) (n = 3).
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