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Sigma 500 vp field emission scanning electron microscope

Manufactured by Zeiss
Sourced in Germany

The Sigma 500-VP Field-Emission Scanning Electron Microscope (SEM) is a high-performance imaging and analysis instrument designed for advanced materials research and development. It features a field-emission electron source, providing high-resolution imaging capabilities. The Sigma 500-VP SEM enables detailed examination of a wide range of sample types at the nanoscale level.

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2 protocols using sigma 500 vp field emission scanning electron microscope

1

Nanoparticle Size Characterization by SEM

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A small droplet (1–2 μL) of either SLN or SLN-Nisin were allowed to dry on glass coverslips overnight under vacuum. The next day, the dried samples were sputter coated with a 1 nm fine grained Pd–Au layer on an EM ACE600 sputter coater (Leica, Germany) and evaluated under a Sigma 500-VP Field-Emission Scanning Electron Microscope (SEM) (Zeiss, Germany). The average diameter was calculated using ImageJ and based on the images obtained. PDI was obtained by the following equation, according to Raval et al. [35 ]:
PDI=(σ/d)2
Where d represents the average diameter of the nanoparticles and σ represents their standard deviation.
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2

Nisin-Loaded SLN Cytotoxicity in HSC-3 Cells

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HSC-3 cells were seeded in 12-well plates (1 × 106 cells/well) containing glass cover slips and allowed to adhere overnight. HSC-3 cells were challenged with 100 μg/mL of Nisin, SLN-Nisin or an equivalent volume of SLN for 24 h.) were added to the cells for 24 h. After this, cells were rinsed with PBS and 10% glutaraldehyde for 20 min at room temperature and dehydrated using increasing ethanol solutions (30%, 50%, 70%, 85% and 95% v/v) for 10 min each. The next day, samples were sputter coated with a 1 nm fine-grained Pd–Au layer on an EM ACE600 sputter coater (Leica, Germany) and evaluated under a Sigma 500-VP Field-Emission Scanning Electron Microscope (SEM) (Zeiss, Germany).
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