Where d represents the average diameter of the nanoparticles and σ represents their standard deviation.
Sigma 500 vp field emission scanning electron microscope
The Sigma 500-VP Field-Emission Scanning Electron Microscope (SEM) is a high-performance imaging and analysis instrument designed for advanced materials research and development. It features a field-emission electron source, providing high-resolution imaging capabilities. The Sigma 500-VP SEM enables detailed examination of a wide range of sample types at the nanoscale level.
Lab products found in correlation
2 protocols using sigma 500 vp field emission scanning electron microscope
Nanoparticle Size Characterization by SEM
Nisin-Loaded SLN Cytotoxicity in HSC-3 Cells
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