Photoluminescence measurements were carried out using a Horiba Fluorolog Time Correlated Single Photon Counting system equipped with UV/Vis/NIR photomultiplier tube detectors, dual-grating spectrometers, and a monochromatized xenon lamp excitation source. Optical absorption measurements were carried out in a Lambda 950 UV–Vis–IR spectrophotometer. XPS measurements were carried out using a Thermo Scientific K-Alpha system, with a 75-eV pass energy, and binding energy steps of 0.05 eV. All signals are normalized to Pb. Atomic force microscopy and scanning Kelvin probe microscopy were done using an Asylum Research Cypher AFM. Samples were electrically grounded and AC160-R2 silicon probes with a titanium–iridium coating were used. Imaging was done in tapping mode and a nap pass was done to measure the contact potential difference. Spectroscopic ellipsometry was performed using a Horiba UVISEL Plus Extended Range ellipsometer with an ~200-ms integration time, a 10-nm step size, and an ~1-mm-diameter spot size. Three incident angles (60, 65, and 70°) were used. Soda-lime glass slides were used as substrates for each individual material, with their back sides covered with opaque adhesive tape to eliminate back reflections. Fitting was performed using the Horiba DeltaPsi2 software. Dispersion functions composed of four Voigt oscillators achieved fits with χ2 < 1.
Fluorolog time correlated single photon counting system
Manufactured by Horiba
The Fluorolog Time Correlated Single Photon Counting system is a powerful analytical instrument used for the measurement of fluorescence lifetimes. It employs the time-correlated single photon counting (TCSPC) technique to precisely record the time-resolved fluorescence decay of samples. The system provides high-sensitivity detection and accurate time-resolved data acquisition, enabling researchers to gain insights into the photophysical properties of materials and molecules.
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Lab products found in correlation
K alpha xps system, by Thermo Fisher Scientific (3 mentions)
Cypher afm, by Oxford Instruments (1 mentions)
K alpha system, by Thermo Fisher Scientific (1 mentions)
Deltapsi2, by Horiba (1 mentions)
Time correlated single photon counting system, by Horiba (1 mentions)
Fls920, by Edinburgh Instruments (1 mentions)
8 protocols using fluorolog time correlated single photon counting system
1
Characterization of Optoelectronic Materials
2
Photoluminescence and Optical Absorption
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Photoluminescence measurements were done with a Horiba Fluorolog Time Correlated Single Photon Counting system equipped with UV/Vis/NIR photomultiplier tube detectors, dual grating spectrometers, and a monochromatized xenon lamp excitation source. Optical absorption measurements were carried out in a Lambda 950 UV-Vis-IR spectrophotometer.
3
Steady-state and Time-resolved Photoluminescence Analysis
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Steady-state PL and time-resolved PL were measured using a Horiba Fluorolog time-correlated single-photon counting system with photomultiplier tube detectors. Light was illuminated from the top surface of the perovskite film. For steady-state PL measurements, the excitation source is a monochromated Xe lamp (peak wavelength at 520 nm with a line width of 2 nm). For time-resolved PL, we used a green laser diode (λ = 540 nm) as the excitation source, with an excitation power density of 5 mW cm−2. The PL decay curves were fitted with biexponential components to obtain a fast and a slow decay lifetime. The mean carrier lifetimes τ for the biexponential fit were calculated by the weighted average method.
4
Photoluminescence Characterization of Perovskite Crystals
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Photoluminescence measurements were performed using a Horiba Fluorolog Time Correlated Single Photon Counting system with photomultiplier tube detectors. A monochromatized Xe lamp and pulsed laser diodes were used as excitation sources for steady-state and transient measurements, respectively. The time resolution of the transient measurements were limited by the instrument response function of approximately 0.13 ns. In order to reduce the effect of reabsorption in the measurement of carrier lifetime of pure perovskite single crystals, we used reflection mode. In reflection mode, most PL signal was generated and collected close to the crystal surface. Absolute PLQE measurements were carried out in a Quanta-Phi integrating sphere according to standard methods published elsewhere35 (link), where excitation and emission spectra are measured for the sample directly and indirectly illuminated. The measurements inside integrating sphere takes into account the effect of reabsorption and reflection of the samples.
5
Comprehensive Optoelectronic Characterization
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Photoluminescence measurements were carried out using a Horiba Fluorolog Time Correlated Single Photon Counting system equipped with UV–vis–NIR photomultiplier tube detectors, dual grating spectrometers, and a monochromatized xenon lamp excitation source. The PL lifetime data was recorded on using a time‐correlated single‐photon counting system (Horiba). Optical absorption measurements were carried out in a Lambda 950 UV–vis–IR spectrophotometer. Absorption of films was measured by using integral sphere. XPS analysis was performed using a Thermo Scientific K‐Alpha XPS system (300 µm spot size, 75 eV pass energy, and 0.05 eV energy steps). The XPS spectra were calibrated to the C 1s peak at a binding energy of 284.8 eV.
6
Characterization of Luminescent ISC Material
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The crystal structure of ISC was characterized using X-ray diffraction (CuKa excitation). Steady-state PL measurements were carried out on a FLS920 spectrofluorometer by Edinburgh Instruments. The absorption spectrum of the ISC was characterized using a Varian Cary 5000 spectrometer. Quanta 600 FEG was used to acquire SEM images. The IV characteristic (used for the space charge limited current analysis) was measured using a Keithley 6430 sub-femtoamp sourcemeter. During the measurement, the sample was kept in a dark environment, under vacuum. PL decay measurements were performed using a Horiba Fluorolog Time Correlated Single Photon Counting system.
7
Time-resolved photoluminescence spectroscopy
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The time-resolved photoluminescence spectroscopy measurements were performed using the Horiba Fluorolog Time-Correlated Single Photon Counting (TCSPC) system equipped with UV/Vis/NIR photomultiplier tube detectors, dual grating spectrometers, and a monochromatized xenon lamp excitation source. The film was placed at an incident angle of 30° away from the detector to avoid reflections of the incident beam. A 375 nm laser diode was used as a pulsed excitation source, and the time traces were acquired using the TCSPC near-infrared detector. The time window was set appropriately to ensure a complete decay of the photogenerated carriers.
8
Perovskite Photoluminescence Lifetime Analysis
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Perovskite films were deposited onto cleaned glass slides, followed by a Spiro-OMeTAD layer (both layers were coated under the same conditions as used for devices, see above). PL lifetime measurements were performed using a Horiba Fluorolog Time Correlated Single Photon Counting (TCSPC) system with photomultiplier tube detectors. A pulsed laser diode (504 nm, 110–140 ps pulse width) was used as the excitation source with a 400–1600 ns period (0.28 nJ per pulse) was used to capture accurate lifetimes carrier lifetimes. Excitation and emission collection were performed on the bottom (glass) side of the film.
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