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X max eds detector

Manufactured by Oxford Instruments
Sourced in United Kingdom

The X-MAX EDS detector is an energy-dispersive X-ray spectroscopy (EDS) device designed for use in scanning electron microscopes (SEMs). It is capable of detecting and analyzing the elemental composition of samples at the microscopic level by measuring the energy of X-rays emitted from the sample during electron beam excitation.

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8 protocols using x max eds detector

1

TEM-based EDX Spectroscopy Analysis

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Grids prepared
for TEM visualization were used for EDX spectroscopy analysis. The
EDX spectrum for each sample was acquired in a JEM-2011 transmission
electron microscope (JEOL Ltd., Japan) operating at 200 kV, equipped
with an EDS X-max detector (Oxford Instruments, UK). Spectra were
analyzed using INCA Software (ETAS group, Germany) and represented
with GraphPad Prism 5.0 (GraphPad Software, USA).
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2

Structure of MoS2 Flakes on Si Substrates

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The chemical state and local structure of MoS2 flakes on Si substrates were examined using X-ray absorption fine structure (XAFS) measurements. XAFS spectra were collected at the PEEM/XAS end station at the Solaris National Synchrotron Radiation Centre in Cracow, Poland. XAS beam parameters involved a photon energy range of 300–1600 eV with a relative energy resolution (ΔE/E) not worse than 0.00 025, a beam size at the sample of 0.200 mm horizontally and 0.050 mm vertically and a photon flux at the sample of 109–1010 [ph/s/100 mA]. The sample was mounted on a standard nonmagnetic and conductive Elmitec PEEM sample holder for scanning electron microscopy (SEM)-EDS measurements.
The studies were performed with a scanning electron-ion microscope Crossbeam 540× (Zeiss) equipped with an EDS X-MAX detector (Oxford Instruments) with an active area of 80 mm2. An EDS spectrometer was calibrated for the Cu Kα line and controlled with a Smart SEM (ZEISS) and the Aztec 4.2 (Oxford Instruments) software. The surface morphology was imaged using an SESI and In-Lens detectors (mix signal) at an accelerating voltage of 5 kV, a working distance from the column WD = 5 mm and a stage tilt of 0°.
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3

SEM Analysis of Rock Fragments

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Fresh rock fragments were observed and scanned under a ZEISS ZIGMA SEM microscope coupled to an Oxford Instrument X-MAX EDS detector at the Ecole Normale Supérieure in Paris (France). The accelerating voltage is 15 keV (LaB6 field emission gun). The width of the spot is ∼1 μm. Quantitative compositional analysis is provided by energy dispersive spectra (EDS) using the INCA Software (Oxford Instruments).
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4

Enamel Microanalysis of Premolar

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The labial face of the tooth and the tip of the main cusp were prepared for enamel study according to the protocol described in Flynn & Wahlert [25 ]. Quantitative microanalyses on the uncoated premolar were performed by energy-dispersive X-ray spectrometry (EDS), using a JEOL 6510 LV scanning electron microscope (SEM) coupled to Oxford Instrument X-Max EDS detector, operating at 30 kV.
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5

Electron Microscopy of Sodium Deposition

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SEM and EDS investigations were performed with a Merlin high‐resolution Schottky field emission electron microscope (Zeiss SMT) equipped with a X‐MAX EDS detector (Oxford Instruments). The samples were removed from the cells, washed three times with 50 μL of diglyme followed by drying under reduced pressure at room temperature, and subsequently transferred to the SEM systems. A high vacuum transfer module (Leica) was used to transfer the samples into the SEM system without exposure to the atmosphere. Optical images of the samples were taken with a 12 megapixel camera (iPhone 8, Apple) and the sodium deposition inside the glass cells was monitored with a 2.4 megapixel camcorder (Canon, Legira HFM 46).
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6

Optical Characterization of AC, AC-P25, and Graphite

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The absorption spectra of AC, AC-P25 and graphite were measured in a wavelength range from 300 to 2000 nm using a Cary 5000 ultraviolet-visible-near infrared (UV-vis-NIR) spectrophotometer (Agilent Technologies, Santa Clara, CA, USA). The morphologies of different lens tissue samples were characterized by field emission scanning electron microscopy (FESEM, FEI NOVA NanoSEM 230, USA). Energy dispersive spectrometry (EDS) analysis was also conducted using an X-Max EDS detector (Oxford Instruments, Oxford, UK) coupled to the FESEM instrument to check the elemental compositions of certain regions on the lens tissue samples.
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7

Quantification of Circulating Endothelial Cells

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Blood was drawn from the cubital vein into the VACUETTE tubes (Greiner bio-one, Austria) containing sodium citrate (3.2%). Immediately after this, sample fixation was performed with glutaraldehyde (0.1%, 4.5 mL, Sigma). After sedimentation of some RBCs for 20 minutes at room temperature, 20 µL was collected from the upper layer and placed into 2.5% glutaraldehyde for complete fixation prior to performing scanning electron microscopy. Polycarbonate isopore membrane filters of 0.22 to 0.45 µm diameter were utilized as the matrices for RBC. Then a quarter of the filter was cut out to count the total number of CECs. To control precision of CEC scoring, the cells were recounted by flow cytometry. Specifically, CECs were scored with the method of sequential gaiting, which we modified to count not only intact, but also the damaged endothelial cells (ECs). The cells were examined with a scanning electron microscope (Inspect F50; FEI Company, Eindhoven, The Netherlands) and X-Max EDS-Detector (Oxford Instruments, Abingdon, United Kingdom). Since the scatter in this score of desquamated EC was rather large due to the small volume of the specimens, we assessed the accuracy of the electron microscopy data with flow cytometry.
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8

Branchial Chamber Preparation for SEM

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Branchial chambers from adults held at 1 ‰ were maintained in 70°ethanol and dehydrated through an ethanol series and a 1,1,1,3,3,3-hexamethyldisilazane bath. After being air-dried, samples were observed with a Quanta FEG 200 (FEI, The Netherlands) equipped with an X-MAX EDS detector (Oxford Instruments).
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