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Jem 2800 transmission electron microscope tem

Manufactured by JEOL
Sourced in Japan

The JEM-2800 is a transmission electron microscope (TEM) manufactured by JEOL. It is designed to provide high-resolution imaging and analysis of samples at the nanometer scale. The JEM-2800 utilizes an electron beam to produce magnified images of specimens, allowing users to examine the detailed structure and composition of materials.

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2 protocols using jem 2800 transmission electron microscope tem

1

Characterization of Silver Nanoparticles

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The UV-visible spectra were recorded on a Presee TU-1950 spectrophotometer (Purkinje, Beijing, China) at a resolution of 1 nm to scan the samples in a wavelength range from 200 to 900 nm. A JSM-7800F field emission scanning electron microscope (FESEM) (JEOL, Tokyo, Japan) was used to image and study the size and morphology of AgNPs. The morphology, size, and electron diffraction pattern (SAED) of the silver nanoparticles were imaged using a JEM-2800 transmission electron microscope (TEM) (JEOL, Tokyo, Japan) with an accelerating voltage of 300 kV. X-ray diffraction pattern (XRD) images of dry nanoparticle powder was obtained using an Ulitama IV X-ray diffractometer (Rigaku, Tokyo, Japan) at the angle range of 2θ (10–80°) [24 (link)]. The Fourier transfer infrared (FTIR) spectra were obtained on a Bruker Tensor 37 (Bruker-AXS GmbH, Karlsruhe, Germany) FTIR instrument. The elemental compositions were detected using energy dispersive X-ray spectrometer (EDS) using x-act with INCA® and Aztec® EDS analysis software (Oxford Instruments, London, UK).
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2

Comprehensive Characterization of Nanomaterials

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UV–Vis absorption spectroscopy was measured on an Agilent Cary 5000 spectrophotometer. The absolute PLQY was measured by using an instrument combining an integrating sphere and a computer-controlled spectrometer (Labsphere). Time-resolved PL was measured on a HORIBA FL-3 3D fluorescence spectrometer. Fourier transforms infrared (FTIR) spectra were acquired in the transmission mode or ATR mode using a Nicolet iS50 FTIR spectrometer. For NMR analysis, 5 mg of NC solids were dissolved in CDCl3 or d6-DMSO and the signals were recorded on a Bruker AVANCE III-500 spectrometer. Zeta potential was measured with a Malvern Nano-Z zeta-potential analyzer. A JEOL JEM-2800 transmission electron microscope (TEM) was employed for TEM investigations. To measure ECL spectroscopy, NCs were drop-coated on a Pt electrode. Pt wire and Ag/AgCl were the counter electrode and reference electrode, respectively. The electrolyte was 0.1 mol L−1 phosphate-buffered saline (PBS, pH = 7.4) containing 50 mmol L−1 K2S2O8. ECL spectra were measured at −2.0 V (vs. Ag/AgCl). ICP-OES was measured on a Shimadzu ICPE-9810 multitype ICP emission spectrometer. Samples for ICP-OES measurement were prepared by digesting samples in aqua regia.
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