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Xl30 esem feg environmental

Manufactured by Philips

The XL30 ESEM-FEG is an environmental scanning electron microscope (ESEM) with a field emission gun (FEG) designed for high-resolution imaging and analysis of samples in their natural state. It provides a versatile platform for studying a wide range of materials without the need for extensive sample preparation.

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2 protocols using xl30 esem feg environmental

1

Nematode Structural Imaging via ESEM

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Axenic L3 larvae were prepared and exsheathed on poly-L-lysine coated slides using the methods described above. To preserve the integrity of N. americanus structural architecture during ESEM imaging, partially exsheathed adhered nematodes were fixed (glutaraldehyde 3% v/v, 12 hours), rinsed (ultrapure deionised water 50ml, 3 times) and partially sublimated, to remove surface water, under ESEM vacuum. Samples were imaged using a Philips XL30 ESEM-FEG environmental scanning electron microscope (20 kV, 10.1 mm working distance).
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2

Morphological Effects of mCP ECM on INS1E Cells

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To study the effect of the mCP ECM proteins on INS1E cell morphology, samples were fixed in 4% (w/v) paraformaldehyde in PBS for 1 h at room temperature after 1, 3, and 7 days of culture. Subsequently, samples were dehydrated using an increasing concentration series of ethanol from 70% to 100% for 30 min in each step. Afterwards, samples were prepared for scanning electron microscopy using a Balzer's CPD 030 and BAL-TEC critical point dryer, and gold coated by a sputter coater (Cressington, UK). Electron micrographs were made using an XL30 ESEM-FEG environmental scanning electron microscope (Philips/FEI, The Netherlands). Furthermore, to verify cell growth, samples from each experimental condition were fixed in 4% (w/v) paraformaldehyde in PBS for 1 h at room temperature during cell culture at 3 and 7 days and imaged using standard bright-field phase contrast microscopy (Nikon TE300, Japan).
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