Merlin compact sem

The XRD characterization was conducted with a Rigaku Miniflex600. Raman and PL spectra were performed with a laser micro-Raman spectrometer (Renishaw in Via, 532 nm excitation wavelength). SEM images were obtained on a ZEISS Merlin Compact SEM. The AFM images were taken with an NT–MDT Ntegra Spectra. The XPS measurements were carried out using a Thermo Scientific, ESCALAB 250Xi. The XPS depth analysis was performed at 3 keV with a spot size of 2 mm × 2 mm and the binding energies were calibrated by referencing the C 1 s peak (284.8 eV). The TEM images were obtained using an aberration-corrected transmission electron microscope (FEI Titan Thermis 60–300) operated at 300 kV. The STEM images were obtained using a probe Cs-corrected transmission electron microscope (FEI Titan ChemiSTEM) operating at 200 kV. The positive ion TOF-SIMS spectra were acquired with an ION TOF ToF SIMS 5-100.

The morphologies of the collagen and I-EMC with varying microstructures were captured using a Merlin Compact SEM (Zeiss, Germany). We first processed the prepared collagen and I-EMC through freeze-drying. Subsequently, these were affixed onto the dedicated SEM sample stage using conductive adhesive and were treated via Pt sputtering before observation. Finally, the samples were placed into the SEM sample chamber and observed under an accelerating voltage of 15 kV. To identify the constituent in the samples, the energy-dispersive X-ray spectroscopy (EDS) spectra were obtained using the TEAM EDS point analysis software.