Tecnai 20
The Tecnai 20 is an electron microscope designed for high-resolution imaging and analysis of samples. It features a 200 kV electron beam and advanced optics to capture detailed micrographs and perform spectroscopic analysis.
Lab products found in correlation
109 protocols using tecnai 20
Multimodal Characterization of Nanomaterials
Cryogenic TEM Particle Morphology Analysis
was studied
using a FEI Tecnai 20 electron microscope operating at 200 kV. Cryogenic
TEM was done at a Tecnai 20 using a cryo-TEM holder using BeamSpot
5. The samples were prepared using a FEI vitro-bot: a droplet of 3
μL was place on a Formvar/Carbon film 200 mesh copper grid and
blotted twice for 8 s. The grid was immediately plunged into liquid
nitrogen and stored in liquid nitrogen.
Keratinocyte 3D Structure Analysis
Multimodal Characterization of Carbon Dots
Correlative Imaging of Chromatin Structure
Structural Analysis of Dry Collagen Sheets
sheets were washed thrice in cacodylate buffer (0.1
M) at pH 7.4 and fixed in glutaraldehyde (2.5%) and paraformaldehyde
(2%) in cacodylate buffer (0.1 M) at pH 7.4 for 90 min. The samples
were then washed again three times in cacodylate buffer (0.1 M) at
pH 7.4 and with deionized water. Samples were then fixed with osmium
tetraoxide (1%) in cacodylate buffer (0.1 M) at pH 7.4 for 1 h. En bloc staining was done using uranyl acetate (2%) in deionized
water for 1 h. Samples were again washed in deionized water, dehydrated
in a series of ethanol solutions (25–100%), and then embedded
in Quetol/Spurr resin at 30% overnight, 67% for 8 h, 100% overnight,
and polymerized in an oven at 60 °C for 48 h. Post-staining was
done with uranyl acetate (5%) for 15 min, followed by Reynolds lead
citrate for 15 min. Throughout the aforementioned processing steps,
the sheet was sandwiched between two rectangular, centrally slotted
PEEK pieces to ensure that a well-defined sheet orientation (flat,
without wrinkles or folds) was maintained. The resin-embedded sheet
within the central slot was cut out with a scalpel and 60–80
nm thin sections were cut with a microtome (model Leica Ultracut RMC
MT-6000, Leica Mikrosysteme, Vienna, Austria). Sectioned samples were
imaged using a transmission electron microscope (voltage 120 kV, TEM
model Tecnai 20, FEI, Hilsboro, OR, U.S.A.).
Nanoniosome Characterization by AFM and Cryo-TEM
Microstructural Characterization of Porous Materials
Imaging Samples by Transmission Electron Microscopy
Ultrastructural Analysis of Weibel-Palade Bodies
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