Equinox 55 fourier transform infrared spectrometer
The EQUINOX 55 is a Fourier transform infrared (FTIR) spectrometer manufactured by Bruker. It is designed to record infrared spectra of various samples. The EQUINOX 55 uses an interferometer to generate and detect infrared radiation, allowing for the measurement of the absorption or transmission of infrared light through a sample.
Lab products found in correlation
8 protocols using equinox 55 fourier transform infrared spectrometer
Characterization of Novel Nanomaterials
Characterization of CNS Cement Samples
Synthesis and Characterization of 1,2,4-Oxadiazole Derivatives
CCDC number of compound
Comprehensive Characterization of Compound
The thermal analysis experiment and the glass transition temperature (Tg) were performed with a model TG-DSC STA 499 F3 instrument (NETZSCH, Germany). Single crystal X-ray experiment was carried out on a Bruker Apex II CCD diffractometer equipped with graphite monochromatized Mo Kα radiation (λ = 0.71073 Å) using ω and φ scan mode. Structures were solved by the direct method using SHELXTL and refined by means of full-matrix least-squares procedures on F2 with the programs SHELXL-97. All nonhydrogen atoms were refined with anisotropic displacement parameters. The sensitivity towards impact (IS) and friction (FS) were determined according to BAM standards.
Comprehensive Characterization of Material Samples
Comprehensive Analytical Characterization
13C and 1H NMR spectra were measured with AV 500 NMR spectrometer (Bruker, Switzerland). Infrared spectra were measured by an EQUINOX 55 Fourier transform Infrared spectrometer (Bruker, Germany). Elemental analyses were performed with the vario EL cube elemental analyzer (Elementar, Germany).
The thermal analysis experiments were performed with a model TGA/DSC 1 instrument (METTLER, Switzerland). Single crystal X-ray experiment was carried out on a Bruker Apex II CCD diffractometer equipped with graphite monochromatized Ga and Cu Kα radiation using ω and φ scan mode. Structures were solved by the direct method using SHELXTL and refined by means of full-matrix least-squares procedures on F2 with the programs SHELXL-97. All nonhydrogen atoms were refined with anisotropic displacement parameters. The sensitivity towards impact (IS) was determined according to BAM standards.
Comprehensive Characterization of Nanoparticles
Copper(II) Nitrate-based Electrochemical Sensor
The structural properties of the prepared materials were characterized using X-ray diffraction pattern (XRD, X’Pert PRO diffractometer, Cu kα1 radiation, Panalytical Company, Almelo, The Netherlands) and Fourier transform infrared spectroscopy (FT-IR, Equinox-55 Fourier transform infrared spectrometer, Bruker, Karlsruhe, Germany). The morphological properties were studied using scanning electron microscopy (Nova NanoSEM 450 microscope, FEI Company, Eindhoven, The Netherlands) and transmission electron microscopy (Tecnai G2 F30 microscope, FEI Company, Eindhoven, The Netherlands).
Electrochemical tests were performed on a CHI 660E electrochemical workstation (Shanghai Chenhua Instrument Co., Ltd., Shanghai, China) using a conventional three-electrode system. A Cu-TCPP/graphene/GCE (diameter: 3 mm) as the working electrode, a saturated calomel electrode (SCE) as the reference electrode, and a platinum wire as the counter electrode were used.
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