Jsm t330a sem
The JSM-T330A is a scanning electron microscope (SEM) manufactured by JEOL. It is designed for high-resolution imaging and analysis of a wide range of materials. The JSM-T330A operates at an accelerating voltage of up to 30 kV and can achieve a resolution of up to 3.5 nm. The microscope is equipped with a tungsten filament electron source and features a range of imaging and analysis capabilities.
Lab products found in correlation
3 protocols using jsm t330a sem
Basidiomata and Sclerotia Morphology Analysis
Frost-columnar Colony Morphology of G. antarctica
SEM Imaging of Ferroptotic MCA Cells
The cells are then washed three times with distilled water, and the fixed cells were dehydrated in graded ethanol solutions. Prior to SEM observation, the glasses containing the cells were dried in a lyophilizer on an aluminium stage covered with double-sided carbon tape and sputtercoated with a 15 nm thick gold layer (Bal-tec SCD050 Sputter Coater, MA, USA). SEM topography measurements were conducted using a JSM-T330A SEM (JEOL) at the operating voltage of 25 kV.
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