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Ultra plus microscope

Manufactured by Zeiss
Sourced in Germany

The Ultra Plus microscope is a high-performance optical microscope designed for advanced scientific and research applications. It features a range of advanced optics and imaging capabilities to provide users with clear and detailed visual data.

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15 protocols using ultra plus microscope

1

Characterizing CNT Powders via SEM

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Scanning electron microscopy (SEM) was applied to characterize the ground CNT powders using a ZEISS Ultra Plus microscope (Carl Zeiss GmbH, Jena, Germany) with a field emission cathode combined with an SE2 detector.
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2

Characterization of Alginate Aerogel Beads

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Alginate aerogel beads were characterized in terms of external and inner porous structure by scanning electron microscopy (SEM, Zeiss Ultra Plus microscope, Zeiss, Oberkochen, Germany). Aerogels were iridium-sputtered under vacuum during ca. 10 min prior to imaging to minimize charging and to improve the image quality.
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3

Characterization of CNC-SB Composite Films

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The size of the CNC nanorod
was analyzed by transmission electron microscopy using an FEI Tecnai
G2S-Twin F20 system with a field emission gun operating at 200 kV.
The absorption spectra of the SB solution and transmittance of composite
CNC/SB films were measured by a Thermo Scientific Genesys 10 UV Spectrophotometer.
The films were mounted perpendicular to the beam path. The transmittance
of the left- and right-handed circularly polarized light for the composite
film was probed using left- and right-handed circularly polarized
filters in the range of 400–700 nm. The reflectance of the
CNC/SB films were detected on Cary 5000 UV–vis-NIR spectrophotometer,
equipped with an integrating sphere, in reflection mode. The cross-section
scanning electron microscopy (SEM) analysis of the composite CNC/SB
films was performed by a Zeiss Ultra Plus microscope at an accelerating
voltage of 3 kV. The films were coated with a thin layer of carbon.
Polarized optical microscopy (POM) images were obtained using Olympus
BX51-P microscope with crossed polarizers.
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4

Anodization and Characterization of TiO2 Fibers

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Anodization of Ti wires was performed with a precise WY-3D power supply (Nanjing, China). TiO2 nanoparticles were annealed in an air atmosphere at high temperatures in a OTF-1200X tubular furnace with a Prog/Controller (Kejing, Hefei, China). A CHI832D electrochemical analyzer (Chenhua, China) was used for electropolymerization of PPy. The fabricated fibers were characterized by an Ultra Plus microscope (Zeiss, Oberkochen, Germany) with an Aztec-X-80 energy dispersive X-ray spectrometer. SPME was carried out in a DF-101S thermostat with controlled temperature and magnetic stirring (Changcheng, Zhengzhou, China). The analyses were carried out on a Waters 600E multi-solvent delivery system (Milford, MA, USA) equipped with a Waters 2487 dual λ absorbance detector and a Zorbax Eclipse Plus C 18 column (150 mm × 4.6 mm, 5 μm, Agilent, USA). Chromatographic data was processed with a N2000 workstation (Zhejiang University, China). Desorption was performed in a commercially available SPME-HPLC interface (Supelco, PA, USA). Ultrapure water was obtained from a Sudreli SDLA-B-X water purification system (Chongqing, China).
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5

SEM Imaging of BiVO4 Microparticles

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For SEM imaging, dilute dispersions of BiVO4 microparticles in ethanol were drop‐casted onto silicon wafer pieces and attached to a specimen support with conductive carbon tape. Samples were dried overnight and imaged on a Zeiss Ultra Plus microscope with an acceleration voltage of 3 kV.
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6

Multimodal Characterization of MIL-53(Al)

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Attenuated total reflectance-Fourier transform infrared (ATR-FTIR) spectra were recorded for MIL-53(Al) on a PerkinElmer Spectrum Two IR spectrometer (with UATR Two attachment). TGA measurements were carried out on a DISCOVERY TGA Thermogravimetric Analyzer. Approximately 5 mg of each sample was placed on a platinum pan which was heated under a flow of air at a rate of 10 °C min–1 up to 700 °C. Field-emission SEM (FE-SEM) images were obtained using a Zeiss ULTRA plus microscope (working distance ∼9 mm; acceleration voltage 20 kV). N2 sorption isotherms were recorded on a 3Flex Surface Characterisation Analyser (Micromeritics Instruments Inc.).
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7

Anodization and Characterization of TiO2 Nanofibers

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Anodization of Ti wires was performed with a precise WY-3D power supply (Nanjing, China). TiO2 nanoparticles were annealed in air atmosphere at different temperatures in OTF-1200X tubular furnace with a Prog/Controller (Kejing, Hefei, China). The fabricated fibers were characterized by an Ultra Plus microscope (Zeiss, Oberkochen, Germany) with an Aztec-X-80 energy dispersive X-ray spectrometer (Oxford, UK). SPME was carried out in a DF-101S thermostat with controlled temperature and magnetic stirring (Changcheng, Zhengzhou, China). The analyses were carried out on a Waters 600E multi-solvent delivery system (Milford, MA, USA) equipped with a Waters 2487 dual λ absorbance detector and a Zorbax Eclipse Plus C 18 column (150 mm × 4.6 mm, 5 μm, Agilent, USA). Chromatographic data was processed with a N2000 workstation (Zhejiang University, China). Desorption was performed in a commercially available SPME-HPLC interface (Supelco, PA, USA). Ultrapure water was obtained from a Sudreli SDLA-B-X water purification system (Chongqing, China).
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8

Characterization of Functionalized Carbon Fibers

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The selected carbon fibers were investigated by scanning electron microscopy (SEM) prior to and after oxy-fluorination to study changes in surface morphology. To characterize the treated samples, carbon fibers were placed on a specimen holder with a carbon pad to ensure conductibility without any further treatment for surface functionalization. Here, a Quanta 250 FEG ESEM™ from Thermo Fisher Scientific (Waltham, MA, USA) was used at 14.00 kV and 200 Pa. Fiber surface studies before and after single fiber pull-out were performed by scanning electron microscopy using the SE2 detector of an ULTRA PLUS microscope (Carl Zeiss Microscopy GmbH, Jena, Germany).
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9

Characterization of CHI-HAp-Collagen Membrane

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The HAp powder and the obtained CHI–HAp–collagen membrane were characterized using X–ray powder diffraction (XRD; Philips PW1050 diffractometer with CuKα1,2 radiation). Field emission scanning electron microscopy (FE-SEM) was performed on a Carl Zeiss ULTRA Plus microscope. Infrared spectroscopy (ATR FT-IR) was carried out on a Nicolet iS10 FT-IR Spectrometer (Thermo Scientific Instruments, Waltham, MA, USA) in the spectral range from 400 to 4000 cm−1.
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10

Characterization of PEEK/CNF Composites

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The as-received CNFs were observed using ultra-high-resolution field emission gun scanning electron microscopy (FEG-SEM, NOVA 200 Nano SEM, FEI Company, Hillsboro, OR, USA) and a transmission electron microscope (TEM, JEOL JEM-2100) operating a LaB6 electron gun at 80 kV. TEM images were acquired with a “One-View” 4k × 4k CCD camera at minimal under-focus to achieve visibility of the CNF surface layers. Compression-moulded plates of the PEEK/CNF composite were cryo-fractured in liquid nitrogen and the surface was covered with 3 nm platinum before examining using a scanning electron microscope (SEM) (Ultra plus microscope, Carl Zeiss GmbH, Germany, field emission cathode) at 3 kV.
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