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V 670ds

Manufactured by Jasco
Sourced in Japan

The V-670DS is a spectrophotometer designed for ultraviolet-visible (UV-Vis) and near-infrared (NIR) spectroscopy. It has a wavelength range of 190 to 2,700 nanometers and can be used for a variety of analytical applications.

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3 protocols using v 670ds

1

Synthesis and Characterization of Compounds 6a and 6b

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NMR: Bruker AVANCE-HD500 (500 MHz), ESI-TOF MS: Bruker micrOTOF II, ultraviolet–visible: JASCO V-670DS, FT-IR: JASCO FT/IR-4200, X-ray: Rigaku XtaLAB Pro P200, Elemental analysis: LECO CHNS-932 VTF-900, Molecular Force-field Calculation: Materials Studio (version 5.5.3, Accelrys Software Inc.). Solvents and reagents: TCI Co., Ltd., Wako Pure Chemical Industries Ltd., Kanto Chemical Co., Inc., Sigma-Aldrich Co., and Cambridge Isotope Laboratories, Inc. Compounds 6a,b and their precursors (5a,b) (see Supplementary Methods and Supplementary Figs 2–6 and 19–22) were synthesized according to previously reported procedures25 (link)38 (link).
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2

Measurement of Superoxide Anions Using WST-1

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To measure superoxide anions, the WST-1 method was used (Ukeda et al., 1999 (link)). WST-1 was added to DPBS at a final concentration of 0.2 mM, and then NC-6300 or EPI was added to the 48-well microplate (1.3 mL) and TP-HIFU irradiation was performed (100 W/cm2, 0.5–3 min) at 25°C. The absorbance at a wavelength of 438 nm was measured using a UV-VIS-near infrared spectrophotometer (V-670DS, JASCO, Tokyo, Japan). Three samples were evaluated for each group, and the average value and standard deviation of absorbance changes were calculated before and after HIFU irradiation.
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3

Characterization of Nanomaterial Samples

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Samples were characterized using X-ray diffraction (XRD; Rigaku, RINT-Ultima III), UV-vis diffuse reflectance spectroscopy (DRS; JASCO, V-670DS), field-emission scanning electron microscopy (FE-SEM; Hitachi, S-4700, and JEOL, JSM-7001F) and field-emission transmission electron microscopy (FE-TEM; JEOL, JEM-2800). The DRS reflectance (R) data were converted to the Kubelka-Munk function using the equation f(R) = (1-R)2/(2 R). The relative weight (WR) of each specimen was determined from the equation WR = (WaW0)/(WbW0), where Wa, Wb, and W0 are the total weight of the powder and the alumina boat after nitridation, the total weight of the powder and alumina boat before nitridation, and the weight of the alumina boat, respectively. Elemental analysis was performed using inductively coupled plasma atomic emission spectroscopy (ICP-AES; Shimadzu, ICPS-8100) and oxygen/nitrogen combustion analysis (ON analysis; Horiba, EMGA-620W/C). Nitrogen adsorption isotherms for the samples were acquired at 77 K with a BELSORP-mini instrument (MicrotracBEL). The relative surface areas of the samples were determined using the Brunauer-Emmett-Teller (BET) model.
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