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Fei sirion 200

Manufactured by Thermo Fisher Scientific
Sourced in United States, Japan

The FEI-Sirion 200 is a field emission scanning electron microscope (FE-SEM) designed for high-resolution imaging and analysis of a wide range of materials and samples. It features a cold field emission gun, which provides a high-brightness electron beam and excellent spatial resolution. The FEI-Sirion 200 is capable of producing high-quality images at magnifications up to 1,000,000x, making it suitable for a variety of applications, including materials science, nanotechnology, and life sciences research.

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10 protocols using fei sirion 200

1

Characterization of Mesoporous Fe3O4@CNT Nanocomposite

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The composition of the synthesized mesoporous Fe3O4@CNT was determined with an X-ray powder diffractometer (XRD, Rigaku, Japan) using Cu Kα radiation at 1.5418 Å at a scanning rate of 5° min−1. Scanning electron microscopy (SEM, FEI-Sirion 200), transmission electron microscopy (TEM, JEM-2010), high-resolution transmission microscopy (HRTEM) and selected area electron diffraction (SAED) were used to observe the crystal structure and sizes. Atomic force microscopy (AFM, E-Sweep) was used to obtain three-dimensional images of the as-prepared mesoporous Fe3O4@CNT. The thermal analysis was determined by a thermogravimetric analyzer (Pyris 1 TGA, PerkinElmer, USA) under N2 atmosphere and in air, respectively, at a heating rate of 10 °C min−1 from 20 °C to 900 °C. The specific surface area and pore distribution were analyzed by Brunauer-Emmett-Teller (BET) tests using ASAP 2020 (Micromeritics Instuments) analyzers. The magnetic property of the synthesized Fe3O4@CNT was evaluated by a vibrating sample magnetometer (VSM, Lakeshore 736, USA). The Fourier transform infrared spectroscopy (FTIR) was done by a Perkin Elmer Paragon-1000 spectrometer.
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2

Characterization of Nanostructured Materials

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The morphology of samples was characterized by the transmission electron microscope (JEM-2100F, JEOL, Tokyo, Japan) and the field-emission scanning electron microscope (FEI-Sirion 200). Thermal gravimetic analysis (TGA) was conducted in air at a heating rate of 10 °C min−1. X-ray photoelectron spectroscopic (XPS) measurements were performed on a Kratos AXIS Ultra DLD spectrometer with a monochromatic Al Ka X-ray source. Nitrogen absorption and desorption measurements were performed with an Auto sorb IQ instrument. The surface areas were calculated by the Brunauer-Emmett-Teller (BET) method.
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3

Comprehensive Characterization of Upconversion Nanoparticles

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The crystal structures, sizes, morphologies and elementary compositions were characterized by scanning electron microscopy (SEM, FEI-Sirion 200), Energy Dispersive Spectrometer (EDS), low resolution transmission electron microscopy (TEM, JEM-2010), high-resolution transmission electron microscopy (HRTEM, JEM-2100F) and selected area electron diffraction (SAED, JEM-2100F). The crystalline compositions and phases of as-prepared UCNPs were characterized by an X-ray diffractometer (XRD, D8 ADVANCE, BRUKER-AXS) using Cu Ka radiation at 1.5418 nm at a scanning rate of 10 degrees/min. The specific surface area was obtained by the Brunauer-Emmett-Teller (BET, V-Sorb 2800P) method, and the pore size distribution was calculated by the Barret-Joyner-Halenda (BJH) method. Fourier Transform Infrared Spectroscopy (FTIR) was performed on Nicolet 6700 (Thermo Fisher, America). Thermal gravity analysis (TGA) was measured with Pyris 1TGA (Perkin Elmer, America), and differential scanning calorimetry was performed with a DSC 204F1 (Netzsch, Germany). The X-ray photoelectron spectra were measured with an AXIS ULTRA DLD (Kratos). Upconversion luminescence spectra of samples were obtained on FL4000 fluorophotometer at room temperature in conjunction with a 980 nm diode laser. The UV-vis spectra were measured with a Varian Cary50 UV-visible spectrophotometer and equipped with a 10 mm quartz cell.
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4

Spectroscopic, Crystalline, and Morphological Characterization of Films

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Fourier-transform infrared spectroscopy (FTIR): The functional groups were estimated using a Nicolet 5700 analyzer, Thermo Electron Scientific Instruments Corp., Waltham, MA, USA. The spectra of the films were obtained within a 4000–400 cm−1 wavelength range [20 (link)].
X-ray diffraction (XRD): The crystalline properties of the films were characterized using a D8 Advance analyzer (Germany Bruker Corp., Heidelberg, Germany) equipped with Cu Kα radiation [21 (link)]. The scattering angle was in the 5–45° range with a scan rate of 1°/min.
Scanning electron microscopy (SEM): The morphology of the surface of the films was observed by scanning electron microscopy (SEM, FEI Sirion 200, FEI, Hillsboro, OR, USA) operated at 20 kV. The samples were sputtered with a layer of gold.
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5

Comprehensive Characterization of Functional Materials

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X-ray
diffraction (XRD) spectra were acquired by D/MAX2550/PC using Cu Kα
radiation from 8° to 70° at a scan rate of 5°·min–1 under 35 kV and 200 mA. X-ray photoelectron spectroscopy
(XPS) was recorded using a Kratos AXIS Ultra DLD spectrometer. Raman
spectra were taken on a SENTERRA R200 Raman spectrometer with a 532
nm laser excitation. Nitrogen absorption and desorption measurements
were performed with an Autosorb iQ instrument. The surface areas were
calculated by the Brunauer–Emmett–Teller (BET) method.
Fourier transform infrared (FT-IR) spectroscopy was carried out by
an FTIR spectrophotometer (Bruck EQUINOX55) using the KBr method over
a frequency range of 400–4000 cm–1. The morphology
of samples was characterized by the transmission electron microscope
(JEM-2100F, JEOL, Tokyo, Japan) and the field-emission scanning electron
microscope (FEI-Sirion 200). The composite specimens prepared for
EM wave absorption measurement were toroidal-shaped samples with an
outer diameter of 7.00 mm and an inner diameter of 3.00 mm. The complex
permittivity and permeability values were recorded using an Agilent
85050D vector network analyzer in the frequency range of 2–18
GHz.
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6

Characterization of Ni-Doped Nanotube Samples

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The phase structures of the as-annealed samples were characterized by X-ray diffraction (XRD, D/max 2,550 V). Grazing incident diffraction (GID) with an incident angle of 1° was carried out during the XRD testing. The surface morphologies of the as-anodized and as-annealed nanotube samples were examined using a scanning electron microscope (SEM; FEI SIRION 200, FEI Company, Hillsboro, OR, USA) equipped with energy dispersive X-ray (EDX; Oxford INCA, Oxford Instruments, Abingdon, Oxfordshire, UK). Surface compositions and composition distribution along the depth of the Ni-doped nanotubes were characterized with X-ray photoelectron spectroscopy (XPS; ESCALAB 250, Thermo Fisher Scientific, Hudson, NH, USA).
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7

Zirconium-Silicon Hybrid Sol-Gel Fabrication

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A commercially available zirconium-silicon hybrid sol–gel material (SZ2080), provided by IESL-FORTH (Nikolaou Plastira 100, Crete, Greece), is used in our experiment and is negligibly shrinkable during structuring compared with other photoresists. The pre-baking process used to evaporate the solvent in the SZ2080 is set to a thermal platform at 100 °C for half an hour. After polymerization under illumination of a femtosecond laser, the sample is developed in 1-propanol for 30 min until the entire portion without polymerization is washed away. The images are taken with a secondary electron scanning electron microscope (FEI Sirion 200; FE-SEM, FEI Sirion 200, FEI Company, Hillsboro, OR, USA) operated at 10 keV after depositing ~10 nm gold.
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8

Comprehensive Characterization of Novel Materials

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The phase
and crystallinity of the samples were analyzed by X-ray diffraction
(XRD, Germany Bruker AXS D8 Advance). The morphologies of the samples
were examined by scanning electron microscopy (SEM, USA FEI Sirion
200) and field emission transmission electron microscopy (FETEM, USA
Tecnai G2 F20 S-TWIN). The surface elemental composition and chemical
species were evaluated by X-ray photoelectron spectroscopy (XPS, USA
Thermo Fisher Scientific Thermo ESCALAB 250Xi). The specific surface
area was measured by nitrogen (N2) adsorption-desorption
(BET, USA Micromeritics ASAP2460). The photoluminescence (PL) data
were recorded by using an F-380 (Tianjin Gangdong Technology Development
Co., Ltd. China) to explain the electron transfer situation.
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9

Characterization of Ti-Ni-O Surface

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Surface morphology and composition of the Ti-Ni-O were investigated using a scanning electron microscope (SEM; FEI SIRION 200, FEI Company, Hillsboro, OR, USA) equipped with energy dispersive X-ray analysis (EDXA; OXFORD INCA, Oxford Instruments, Abingdon, Oxfordshire, UK). Phase structures of the as-annealed Ti-Ni-O samples were characterized with a Raman microscope system (Bruker Opties SENTERRA, Bruker Company, Billerica, MA, United States) using an argon ion laser operating at 532 nm.
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10

Structural and Electrochemical Characterization of Ni-PPy Supercapacitors

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Scanning electron microscopy (SEM). SEM observations were performed using an FEI Sirion-200 (FEI Co., USA) field emission scanning electron microscope at an operating voltage of 5 kV. The Ni-PPy samples were directly placed on copper tables without other treatments.
Transmission electron microscopy (TEM). TEM studies of samples were performed using a JEM-ARM200F, equipped with a probe Cs corrector and a cold field emission gun. The accelerating voltage was 200 kV. Before the TEM measurements, Ni-PPy samples were subjected to strong sonication in ethanol for exfoliation of the active materials from the Ni foams. TEM samples were prepared by dropping a drop of the ethanol dispersion of the active materials onto copper grids, followed by drying at 60 °C overnight. Electron diffraction (ED) measurements were performed on the same electron microscope at an operating voltage of 120 kV.
Optical microscopy (OM). The OM observations were performed using a Leica DM4500 B optical microscope. The Ni foams coated with Py and water were directly placed on the objective table.
Electrochemical performance measurements. The performance of flexible all-solid-state supercapacitors were evaluated on an EG & potentiostat/galvanostat Model 2273 advanced electrochemical system. PVA/LiClO 4 was used as the gel (solidstate) electrolyte for the supercapacitors.
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