Fei sirion 200
The FEI-Sirion 200 is a field emission scanning electron microscope (FE-SEM) designed for high-resolution imaging and analysis of a wide range of materials and samples. It features a cold field emission gun, which provides a high-brightness electron beam and excellent spatial resolution. The FEI-Sirion 200 is capable of producing high-quality images at magnifications up to 1,000,000x, making it suitable for a variety of applications, including materials science, nanotechnology, and life sciences research.
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10 protocols using fei sirion 200
Characterization of Mesoporous Fe3O4@CNT Nanocomposite
Characterization of Nanostructured Materials
Comprehensive Characterization of Upconversion Nanoparticles
Spectroscopic, Crystalline, and Morphological Characterization of Films
X-ray diffraction (XRD): The crystalline properties of the films were characterized using a D8 Advance analyzer (Germany Bruker Corp., Heidelberg, Germany) equipped with Cu Kα radiation [21 (link)]. The scattering angle was in the 5–45° range with a scan rate of 1°/min.
Scanning electron microscopy (SEM): The morphology of the surface of the films was observed by scanning electron microscopy (SEM, FEI Sirion 200, FEI, Hillsboro, OR, USA) operated at 20 kV. The samples were sputtered with a layer of gold.
Comprehensive Characterization of Functional Materials
diffraction (XRD) spectra were acquired by D/MAX2550/PC using Cu Kα
radiation from 8° to 70° at a scan rate of 5°·min–1 under 35 kV and 200 mA. X-ray photoelectron spectroscopy
(XPS) was recorded using a Kratos AXIS Ultra DLD spectrometer. Raman
spectra were taken on a SENTERRA R200 Raman spectrometer with a 532
nm laser excitation. Nitrogen absorption and desorption measurements
were performed with an Autosorb iQ instrument. The surface areas were
calculated by the Brunauer–Emmett–Teller (BET) method.
Fourier transform infrared (FT-IR) spectroscopy was carried out by
an FTIR spectrophotometer (Bruck EQUINOX55) using the KBr method over
a frequency range of 400–4000 cm–1. The morphology
of samples was characterized by the transmission electron microscope
(JEM-2100F, JEOL, Tokyo, Japan) and the field-emission scanning electron
microscope (FEI-Sirion 200). The composite specimens prepared for
EM wave absorption measurement were toroidal-shaped samples with an
outer diameter of 7.00 mm and an inner diameter of 3.00 mm. The complex
permittivity and permeability values were recorded using an Agilent
85050D vector network analyzer in the frequency range of 2–18
GHz.
Characterization of Ni-Doped Nanotube Samples
Zirconium-Silicon Hybrid Sol-Gel Fabrication
Comprehensive Characterization of Novel Materials
and crystallinity of the samples were analyzed by X-ray diffraction
(XRD, Germany Bruker AXS D8 Advance). The morphologies of the samples
were examined by scanning electron microscopy (SEM, USA FEI Sirion
200) and field emission transmission electron microscopy (FETEM, USA
Tecnai G2 F20 S-TWIN). The surface elemental composition and chemical
species were evaluated by X-ray photoelectron spectroscopy (XPS, USA
Thermo Fisher Scientific Thermo ESCALAB 250Xi). The specific surface
area was measured by nitrogen (N2) adsorption-desorption
(BET, USA Micromeritics ASAP2460). The photoluminescence (PL) data
were recorded by using an F-380 (Tianjin Gangdong Technology Development
Co., Ltd. China) to explain the electron transfer situation.
Characterization of Ti-Ni-O Surface
Structural and Electrochemical Characterization of Ni-PPy Supercapacitors
Transmission electron microscopy (TEM). TEM studies of samples were performed using a JEM-ARM200F, equipped with a probe Cs corrector and a cold field emission gun. The accelerating voltage was 200 kV. Before the TEM measurements, Ni-PPy samples were subjected to strong sonication in ethanol for exfoliation of the active materials from the Ni foams. TEM samples were prepared by dropping a drop of the ethanol dispersion of the active materials onto copper grids, followed by drying at 60 °C overnight. Electron diffraction (ED) measurements were performed on the same electron microscope at an operating voltage of 120 kV.
Optical microscopy (OM). The OM observations were performed using a Leica DM4500 B optical microscope. The Ni foams coated with Py and water were directly placed on the objective table.
Electrochemical performance measurements. The performance of flexible all-solid-state supercapacitors were evaluated on an EG & potentiostat/galvanostat Model 2273 advanced electrochemical system. PVA/LiClO 4 was used as the gel (solidstate) electrolyte for the supercapacitors.
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