Jem 2100
The JEM 2100 is a high-performance transmission electron microscope (TEM) manufactured by ZEISS. It is designed to provide high-resolution imaging and analysis capabilities for a wide range of materials science and biological applications. The JEM 2100 features a stable electron optical system, advanced imaging and analytical capabilities, and user-friendly software interface.
Lab products found in correlation
4 protocols using jem 2100
In-situ Mechanical Characterization of Nanopillars
Characterization of Cobalt Hydroxide Nanosheets
electron microscope (FE-SEM, Carl Zeiss Sigma VP, Germany) and a high-resolution
transmission electron microscope (HR-TEM, JEM-2100 (HRP)) were utilized
to analyze the morphology of the synthesized Co(OH)2 NS.
HR-TEM was used to characterize the selected area diffraction pattern
(SAED) and the lattice fringe of the Co(OH)2 NS. An X-ray
diffractometer (XRD, Philips) with a Cu Kα radiation (λ
= 1.5406 Å) and a Fourier transform infrared (FTIR) spectrophotometer
(MIDAC, M4000) were used to characterize the structural properties
of Co(OH)2 NS. To calculate IC50 values, luminescence
was read with a Tecan infinite M1000 Pro instrument (Tecan, Männedorf,
Switzerland). Annexin V was evaluated with a BD FACSCantoII instrument
(BD Biosciences, San Jose, CA). Fluorescence images were capture with
a Nikon Ti Eclipse inverted microscope (Nikon, Minato City, Tokyo,
Japan).
Material Characterization by Electron Microscopy and XPS
Comprehensive Characterization of Composite Materials
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