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Jem 2100

Manufactured by Zeiss
Sourced in Germany

The JEM 2100 is a high-performance transmission electron microscope (TEM) manufactured by ZEISS. It is designed to provide high-resolution imaging and analysis capabilities for a wide range of materials science and biological applications. The JEM 2100 features a stable electron optical system, advanced imaging and analytical capabilities, and user-friendly software interface.

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4 protocols using jem 2100

1

In-situ Mechanical Characterization of Nanopillars

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In-situ compression experiments were carried out in both a TEM (JEOL JEM 2100) and an SEM (Zeiss Ultra), while in-situ tensile and bending tests were conducted in the SEM. The JEOL JEM 2100 uses a high-brightness LaB6 electron source. It is equipped with Xarosa (4 k × 4 k) as well as Veleta Ultrascan (2 k × 2 k) cameras. In the TEM, in-situ compression tests of pillars with diameters around 200 nm were carried out by using a Hysitron PI 95 Picoindenter with a flat diamond tip. As the load applied is limited to 1.5 mN for the PI 95 Picoindenter, the requirement for thin sample in the TEM, we carried out the in-situ compression experiment of the larger pillars by using a Hysitron PI 85 L picoindenter inside an SEM, with a specially designed system for applying loads up to 10 mN. This system allows real-time observation of deformation process (i.e. slip band development, slip planes and slip directions). The load was applied to pillars by moving the indenter toward the pillars in the displacement control mode. The displacement rates were 1 nm⋅s−1 and 2 nm⋅s−1 for compression of pillars of around 200 nm in diameter and from 500 nm ~ 2.1 µm in diameter, respectively. For the tensile test, a displacement rate of 1 nm⋅s−1 was used. For the bending test, a higher displacement rate − 4 nm⋅s−1 was used.
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2

Characterization of Cobalt Hydroxide Nanosheets

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A field emission scanning
electron microscope (FE-SEM, Carl Zeiss Sigma VP, Germany) and a high-resolution
transmission electron microscope (HR-TEM, JEM-2100 (HRP)) were utilized
to analyze the morphology of the synthesized Co(OH)2 NS.
HR-TEM was used to characterize the selected area diffraction pattern
(SAED) and the lattice fringe of the Co(OH)2 NS. An X-ray
diffractometer (XRD, Philips) with a Cu Kα radiation (λ
= 1.5406 Å) and a Fourier transform infrared (FTIR) spectrophotometer
(MIDAC, M4000) were used to characterize the structural properties
of Co(OH)2 NS. To calculate IC50 values, luminescence
was read with a Tecan infinite M1000 Pro instrument (Tecan, Männedorf,
Switzerland). Annexin V was evaluated with a BD FACSCantoII instrument
(BD Biosciences, San Jose, CA). Fluorescence images were capture with
a Nikon Ti Eclipse inverted microscope (Nikon, Minato City, Tokyo,
Japan).
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3

Material Characterization by Electron Microscopy and XPS

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The morphologies were examined by JEOL JEM 2100 operating at 200 kV and Zeiss SUPRA-55 operating at 20 kV. XPS were carried out by using Thermo Electron ESCALAB-250. XRD patterns were acquired by Shimadzu XRD-6000 at 10(°)/min.
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4

Comprehensive Characterization of Composite Materials

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Transmission electron microscopy (TEM, JEM-2100) and field emission scanning electron microscopy (SEM, Zeiss Supra 55) were employed to obtain images of composite morphology. The product was analyzed using a Fourier transform infrared (FTIR) spectrometer (Cary 610/670 micro IR spectrometer). Thermogravimetric analysis (TGA) was conducted using a TG209F3 Tarsus instrument (NETZSCH, Germany) at a heating rate of 10 °C min−1, with the ambient temperature raised to 900 °C under a nitrogen atmosphere. X-Ray photoelectron spectroscopy (XPS) measurements were carried out to analyze the element composition of composite materials. Electrochemical tests were conducted on an electrochemical workstation (CH Instruments, 760E). Electrochemical tests in both three-electrode and two-electrode systems are presented in the ESI.
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