After incubation, the plug was gently washed twice using sterile phosphate-buffered saline (PBS) (pH 7.0). The specimens were removed from the plug and then fixed with 2.5% glutaraldehyde overnight at 4 °C. Subsequently, the specimens were washed twice with PBS, dehydrated with an ascending series of ethanol (50–100% (v/v)), dried to a critical point, and subsequently sputtered with gold palladium. The biofilms were observed using SEM at 300× and 1000× magnifications (EPMA-1610; Shimazu, Kyoto, Japan) [39 (link)].
Epma 1610
Manufactured by Shimadzu
Sourced in Japan
The EPMA-1610 is an Electron Probe Micro-Analyzer (EPMA) manufactured by Shimadzu. It is a powerful analytical instrument used for the quantitative elemental analysis of solid samples at the micro-scale level. The EPMA-1610 utilizes a focused electron beam to excite the sample, and the emitted X-rays are analyzed to determine the elemental composition of the analyzed area.
Automatically generated - may contain errors
Lab products found in correlation
Miniflex 600, by Rigaku (2 mentions)
Quantum 2000, by Physical Electronics (1 mentions)
Multipak software, by Physical Electronics (1 mentions)
S 4700 sem, by Hitachi (1 mentions)
H 7600, by Hitachi (1 mentions)
Oca25 contact angle meter, by Dataphysics (1 mentions)
Fdr axp55, by Sony (1 mentions)
K alpha x ray photoelectron spectrometer, by Thermo Fisher Scientific (1 mentions)
Palmsens4 potentiostat, by PalmSens (1 mentions)
Jem 2100f, by JEOL (1 mentions)
S 4800, by Hitachi (1 mentions)
Epon 812, by TAAB (1 mentions)
D max 2400, by Rigaku (1 mentions)
Tecnai g2 f20, by Thermo Fisher Scientific (1 mentions)
Tecnai t12, by Thermo Fisher Scientific (1 mentions)
18 protocols using epma 1610
1
Scanning Electron Microscopy of Biofilms
2
Biofilm Structure Characterization by SEM
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Samples were prepared as previously described [15 (link),16 (link)]. An SEM (EPMA-1610, Shimazu, Kyoto, Japan) was used to observe the biofilm structure at magnifications of ×300 and ×1000. Two discs were prepared for each experimental group. Three randomly selected fields per experimental group were observed at both magnifications.
3
Brazed Joint Microstructure Analysis
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The brazed joints used for microstructure analysis were prepared according to the standard metallographic techniques. Specimens for cross-sectional investigation were cut with a fine cutter, embedded in epoxy resin, and abraded with #320, #500, #800, #1200, #2400, and #4000 emery papers, and subsequently polished with a 1.0 µm Al2O3 suspension. The microstructure analysis of the brazed joint was conducted with an electron probe X-ray microanalyzer (EPMA; EPMA-1610, Shimadzu, Kyoto, Japan) at an acceleration voltage of 15 kV.
4
Surface Analysis of Ti-sputtered YSZ
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The Ti-sputtered YSZ surface was analyzed using X-ray photoelectron spectroscopy (XPS; Quantum 2000, ULVAC, Kanagawa, Japan) at 24 W before and after heat treatment to identify the chemical constituents and elemental states of the YSZ disks. The binding energies were calibrated by the C1s hydrocarbon peak at 285.0 eV. The XPS profiles were analyzed using the MultiPak software (ULVAC).
Secondary electron images (SEIs) were obtained using an electron probe microanalyzer (EPMA-1610, Shimadzu, Kyoto, Japan; EPMA) to observe the morphological characteristics of the fracture surface of the YSZ disks. Elemental mapping was performed on the fracture surfaces of the YSZ disks in the Au and Ti sputtering groups using EPMA.
For EPMA line analysis of the treated surface, a specimen in the Ti sputtering group was diagonally cut and polished, and its cross section was analyzed using EPMA at a voltage of 15 kV and a measurement time of 1.3 h.
Secondary electron images (SEIs) were obtained using an electron probe microanalyzer (EPMA-1610, Shimadzu, Kyoto, Japan; EPMA) to observe the morphological characteristics of the fracture surface of the YSZ disks. Elemental mapping was performed on the fracture surfaces of the YSZ disks in the Au and Ti sputtering groups using EPMA.
For EPMA line analysis of the treated surface, a specimen in the Ti sputtering group was diagonally cut and polished, and its cross section was analyzed using EPMA at a voltage of 15 kV and a measurement time of 1.3 h.
5
Comprehensive Microscopic Analysis of Implants
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Each sample was fixed with 2.5% glutaraldehyde in 0.1 M phosphate buffer (pH 7.4) for 3 hours at 4°C. For SEM observations, samples were cut using a diamond disk and dehydrated in 100% ethanol. After coating with platinum, the samples were examined with a S-4700 SEM (Hitachi High-Tech) at 5 kV. For TEM analysis, the samples were post-fixed and embedded as a previously described51 (link). Ultrathin sections were mounted on 150 mesh grids, stained with uranyl acetate and lead citrate and then examined by a H-7600 (Hitachi High-Tech) transmission electron microscope using an accelerating voltage of 75 kV. An electron probe microanalyzer (EPMA-1610; Shimadzu, Kyoto, Japan) was used for the elemental mapping of calcium (Ca), phosphorus (P), titanium (Ti), chlorine (Cl), magnesium (Mg), sodium (Na) and potassium (K). For the elemental analysis, undecalcified samples were embedded in epoxy resin and trimmed with diamond disks until the sagittal plane containing the centre of the implant was exposed. After polishing, the specimens were sputter-coated with carbon prior to elemental analysis.
6
Comprehensive Electrode Characterization
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The morphologies and microstructures of all electrodes were characterized by scanning electron microscopy (SEM, MIRA3) equipped with an energy dispersive X-ray spectroscopy (EDS, Aztec Energy), transmission electron microscopy (TEM, FEI tecnai G2 F20), and electron probe micro-analyzer (EPMA-1610, SHIMADZU). Phase compositions of the as-prepared samples were investigated by X-ray diffraction (XRD, Rigaku MiniFlex 600). The valence information of elements in all samples was tested by X-ray photoelectron spectroscopy (XPS ESCALAB 250Xi). The contact angle between electrodes and water was measured on a Dataphysics OCA25 contact angle meter. The interfacial adhesion of the electrolytic film on the surface of the electrode was measured by a WS-2005 scratch tester. The hydrogen evolution process of each electrode was recorded with a SONY FDR-AXP55 camera.
7
Elemental Mapping of Mouse Tibia
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An electron probe microanalyzer (EPMA-1610; Shimadzu, Kyoto, Japan) was used for the elemental mapping of Ca, P, and Mg. Undecalcified 6-week-old mouse tibias were embedded in epoxy resin and trimmed with diamond disks until exposure to a sagittal plane. After polishing, the specimens were sputter-coated with carbon before elemental analysis. For each experiment, 256 × 256 pixels mapping were performed. The accelerating voltage and beam current were set to 15 kV and 0.03 μA, respectively, and integrating time was 0.05 seconds at each pixel.
8
Scanning Electron Microscopy of Fractured Surfaces
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The fractured surfaces of the specimens were coated with AgPd and secondary electron (SE) images were acquired using an X-ray probe microanalyzer (EPMA-1610, Shimadzu).
9
Scanning Electron Microscopy of Biofilm
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After treatment, the biofilm structure was observed with a SEM (EPMA-1610, Shimadzu, Kyoto, Japan). Specimens were washed with phosphate buffer and fixed with 2.5% glutaraldehyde for 2 h. After fixation, the fixed specimens were dehydrated using a series of ethanol solutions (10 min each in 60, 70, 80, 90, 95, and 100% ethanol) and then air dried. The samples were sputtered with gold-palladium and examined using the SEM.
10
Characterization of Electrochemical Processes
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Electrochemical experiments were conducted on a PalmSens4 potentiostat operated with PSTrace 5.0 software (PalmSens, The Netherlands). The electrochemical operating cell consisted of a working electrode of a PGE (HB 0.9 mm diameter, Rotring, Germany), a counter electrode of platinum, and a reference electrode of Ag/AgCl. The UV-visible double beam spectrophotometer (Shimadzu EPMA-1610, Tokyo, Japan) was used for the spectrophotometric measurements. The surface chemical composition was characterized using XPS (K-Alpha X-ray photoelectron spectrometer, ThermoFisher Scientific, WI, USA).
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