AFM images were collected using a MultiMode SPM with a Nanoscope III controller (Veeco Instruments, Santa Barbara, CA, USA) operated in tapping-mode in air. The AFM cantilevers used in air had a spring constant of 5 N·m–1 (Veeco cantilevers, TAP150A) with resonance frequencies ranging between 120 and 160 kHz. All the recorded AFM images consist of 512 × 512 pixels with scan frequency ≤1 Hz. Images were simply flattened using the Gwyddion software (36 ) (Version 2.25) and no further image processing was carried out.
Nanoscope 3 controller
Manufactured by Veeco
Sourced in United States
The Nanoscope III controller is a device used in scanning probe microscopy. It is designed to control the scanning motion and data acquisition of a scanning probe microscope, such as an atomic force microscope (AFM) or a scanning tunneling microscope (STM). The Nanoscope III controller provides the necessary electronic interface and control functions to operate these types of microscopes.
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5 protocols using nanoscope 3 controller
1
Tapping-mode AFM Imaging Protocol
2
Tapping-Mode AFM Imaging of H-NS-DNA Complexes
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AFM images were collected using a MultiMode SPM with a Nanoscope III controller (Veeco Instruments, Santa Barbara, CA) operated in tapping-mode in air. The AFM cantilevers used in air had a spring constant of 5 newtons/m (Bruker cantilevers, TAP150A) with resonance frequencies ranging between 120 and 160 kHz. All recorded AFM images consist of 512 × 512 pixels with scan frequency ≤1 Hz. Each H-NS-DNA binding experiment was performed at least in duplicate. AFM images were obtained at several separate locations across the mica surface to ensure a high degree of reproducibility and were used for statistical analysis of H-NS-DNA complexes. Only H-NS-DNA complexes that were completely visible in AFM image were considered for statistical analysis. The images were simply flattened using the Gwyddion software (Version 2.25) without further image processing (52 ).
3
AFM Imaging of Glutathione-Treated Polymersomes
4
Characterization of CS/PAMAM Dendrimer Nanoparticles
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The morphology of the nanoparticles was evaluated through AFM. The CS/PAMAM dendrimer NPs were dissolved in ultrapure water to achieve a final concentration of 1 mg mL -1 and transferred to the surface of a 9.9 mm mica disc (Agar Scientific, England). The samples were evaluated using the Tapping model TM with a MultiMode AFM connected to a NanoScope III controller (Veeco, USA) with noncontact silicon nanoprobes (ca. 300 kHz) from Nanosensors, Switzerland. Images were plane-fitted using the third-degree-flatten procedure included in NanoScope software version 1.5. The particle morphology and size were both analysed with NanoScope 1.5 software.
5
Atomic Force Microscopy of Nicked DNA
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All Atomic Force Microscopy (AFM) samples were prepared in the AFM Buffer consisting of 1 mM Tris and 4 mM MgCl2 (pH = 7.0). Concentrated aliquots of nicked DNA were mixed with AFM buffer to achieve final concentrations of 0.5 ng/μl and 2.2 ng/μl in 20 μl buffer volume. Twenty microlitres drops were then deposited on freshly cleaved mica for 5 min. Afterwards the mica was rinsed with 1 ml of double distilled water and dried under a gentle nitrogen flow.
AFM images were collected using a MultiMode Scanning Probe Microscope (SPM) with a Nanoscope III controller (Veeco Instruments, Santa Barbara, CA, USA) operated in tapping-mode in air. The AFM cantilevers used in air had a spring constant of 5 N/m (Veeco cantilevers, TAP150A) with resonance frequencies ranging between 120 and 160 kHz. All recorded AFM images consisted of 512 × 512 pixels with scan frequency ≤1 Hz. Images were simply flattened using the Gwyddion software (32 ) n (Version 2.25) and no further image processing was carried out.
AFM images were collected using a MultiMode Scanning Probe Microscope (SPM) with a Nanoscope III controller (Veeco Instruments, Santa Barbara, CA, USA) operated in tapping-mode in air. The AFM cantilevers used in air had a spring constant of 5 N/m (Veeco cantilevers, TAP150A) with resonance frequencies ranging between 120 and 160 kHz. All recorded AFM images consisted of 512 × 512 pixels with scan frequency ≤1 Hz. Images were simply flattened using the Gwyddion software (32 ) n (Version 2.25) and no further image processing was carried out.
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