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Iv x ray diffractometer

Manufactured by Rigaku
Sourced in Japan

The IV X-ray diffractometer is a laboratory instrument used to analyze the crystalline structure of materials. It utilizes X-ray diffraction technology to obtain information about the atomic arrangement and composition of solid samples.

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2 protocols using iv x ray diffractometer

1

Characterization of Silver Nanoparticles

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The UV-visible spectra were recorded on a Presee TU-1950 spectrophotometer (Purkinje, Beijing, China) at a resolution of 1 nm to scan the samples in a wavelength range from 200 to 900 nm. A JSM-7800F field emission scanning electron microscope (FESEM) (JEOL, Tokyo, Japan) was used to image and study the size and morphology of AgNPs. The morphology, size, and electron diffraction pattern (SAED) of the silver nanoparticles were imaged using a JEM-2800 transmission electron microscope (TEM) (JEOL, Tokyo, Japan) with an accelerating voltage of 300 kV. X-ray diffraction pattern (XRD) images of dry nanoparticle powder was obtained using an Ulitama IV X-ray diffractometer (Rigaku, Tokyo, Japan) at the angle range of 2θ (10–80°) [24 (link)]. The Fourier transfer infrared (FTIR) spectra were obtained on a Bruker Tensor 37 (Bruker-AXS GmbH, Karlsruhe, Germany) FTIR instrument. The elemental compositions were detected using energy dispersive X-ray spectrometer (EDS) using x-act with INCA® and Aztec® EDS analysis software (Oxford Instruments, London, UK).
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2

Comprehensive Characterization of Nanoparticles

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The surface morphology of the NPs was investigated by high-resolution transmission electron microscopy (TEM, JEM-2100, JEOL Corporation, Tokyo, Japan) and field emission scanning electron microscopy (SEM, JSM-7500F, JEOL Corporation, Tokyo, Japan). X-ray diffraction (XRD) was recorded with a Rigaku Uitima IV X-ray diffractometer. Nitrogen adsorption–desorption isotherms were recorded with a nitrogen adsorption–desorption analyzer (Bel Japan Inc., Tokyo, Japan). The simulation atomic coordinates are freely available for download from the Cambridge Crystallographic Data Centre. The structures were evaluated with a Fourier-transform infrared spectrometer (FTIR, NICOLET 6700, Thermo Fisher, Waltham, MA, USA). Thermogravimetric analysis (TGA) was carried out on a Mettler-Toledo thermogravimetric analyzer under a nitrogen flow in the range of room temperature to 800 °C. A Malvin nanometer laser particle size analyzer (Zetasizer Nano S90, Malvern Company, Malvern, UK) was used to measure the particle size distribution and zeta potential.
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