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Carry 5000 uv vis nirspectrometer

Manufactured by Agilent Technologies
Sourced in United States

The Carry 5000 UV–vis–NIR spectrometer is a laboratory instrument designed to measure the absorption or transmission of light in the ultraviolet, visible, and near-infrared regions of the electromagnetic spectrum. It is capable of performing spectroscopic analysis across a wide range of wavelengths.

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2 protocols using carry 5000 uv vis nirspectrometer

1

Raman and DUV-RR Spectroscopy of Samples

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Non-resonant near infrared (λexc = 1064 nm) solid-state FT-Raman spectra were recorded with
a Bruker FT-Raman spectrometer with a spectral resolution of 4 cm–1. As a Raman excitation source, a Nd:YAG laser with
125 mW power at the sample was used at its fundamental frequency.
The Raman light was collected by a liquid nitrogen-cooled Ge detector.
DUV-RR spectroscopy experiments were performed with the help of a
UV Raman setup (Horiba/Jobin-Yvon) equipped with a liquid N2-cooled CCD detector. The DUV-excitation wavelengths λexc = 257 nm and λexc = 244 nm were derived
from an intracavity frequency doubled argon-ion laser (Coherent Inc.)
and focused on the sample (257 nm: PL =
2.20 mW; 244 nm: PL = 0.22 mW) with an
objective lens, and the spectral resolution was 5 cm–1.
The UV–vis absorption spectra of all the measured
sample solutions were recorded with a Carry 5000 UV–vis–NIR
spectrometer (Varian).
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2

Slot-Die Coated OLED Characterization

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Figure 1a shows the commercially available slot-die coater, designed and manufactured by Ossila Ltd. It is equipped with a high precision syringe pump (12 μm·s−1 to 5 mm·s−1) and a motorized substrate table. The table possesses a heating element, which allowed us to control the temperature from room temperature up to 120 °C. Figure 1b shows the picture of slot-die head, which had a width of 50 mm.
The fabricated OLEDs were characterized in the standard way. The current densities of the OLEDS were measured by applying voltages using an Ossila Source Measure Unit-X100, while simultaneously recording luminance using Konica Minolta LS-110 (Konica Minolta Sensing Americas, Inc., NJ, USA) luminance meter.
Absorption and emission spectra of the F8:F8BT film was measured using a Carry 5000 UV-VIS-NIR spectrometer (Varian Inc., Palo Alto, CA, USA) and FLS980 fluorescence spectrometer (Edinburgh Instruments Ltd., Livingston, UK). Thicknesses of the films were measured using a Bruker Dektak 2D profilometer (Bruker Ltd., Coventry, UK). The roughness of the samples was measured with a Flex-Axiom, Nanosurf AFM (Nanosurf GmbH, Langen, Germany).
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