Raman tests were performed on a Thermo Fischer DXR spectrometer, with a 532 nm laser and a spectral resolution of less than 2 cm−1. Raman spectra were analyzed based on the structure of D-mannitol and compared with the standard spectra from the SDBS database and the reported literature [12 ,14 (link)].
Dxr spectrometer
Manufactured by Thermo Fisher Scientific
The DXR spectrometer is a versatile analytical instrument designed for Raman spectroscopy. It is capable of providing high-quality Raman spectra of a wide range of samples.
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6 protocols using dxr spectrometer
1
Raman Spectroscopic Analysis of D-Mannitol
2
Raman Spectroscopic Analysis of D-Mannitol
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Raman tests were performed on a Thermo Fischer DXR spectrometer, with a 532 nm laser and a spectral resolution of less than 2 cm−1. Raman spectra were analyzed based on the structure of D-mannitol and compared with the standard spectra from the SDBS database and the reported literature [12 ,14 (link)].
3
Comprehensive Material Characterization
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The UV-vis absorbance spectra were obtained for the dry-pressed disk samples using a Scan UV-vis spectrophotometer (Varian, Cary 500) equipped with an integrating sphere assembly, using BaSO4 as the reflectance sample. The spectra were recorded at room temperature in air within the range 200–800 nm. The electron paramagnetic resonance (EPR) spectra were measured using JEOL JES-FA200 EPR spectrometer at 100 K. Fourier transform infrared (FTIR) spectra were recorded with KBr disks containing the powder sample with the FTIR spectrometer (Nicolet Magna 550). Raman spectra were identified by using a Thermo-scientific DXR spectrometer in the range of 100–1000 cm−1 at 532 nm. The instrument employed for XPS studies was a Perkin-Elmer PHI 5000C ESCA system with Al Kα radiation operated at 250 W. The shift of the binding energy due to relative surface charging was corrected using the C 1s level at 284.6 eV as an internal standard. The morphologies were observed by transmission electron microscopy (FEI Tecnai G20, 200 kV). X-ray diffraction (XRD) patterns were recorded in the range 20–60° (2θ) using D/MAX-2550 diffractometer (Rigaku, Japan) with Cu Kα radiation (λ = 1.5406 Å).
4
Raman Spectra of Samples
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Raman spectra were recorded on a Thermo Scientific DXR spectrometer (fine laser power: powercontrolled and reported at samples in 0.1 mW increments) with a 760 nm laser source, between wavelengths of 100 and 1200 cm -1 .
5
Characterization of Material Composition
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The phase
composition was determined by X-ray diffraction (XRD, HaoYuan DX-2700BH)
and Raman spectroscopy (Raman, Thermo Scientific DXR Spectrometer).
Morphological characteristics and chemical distribution were examined
using a transmission electron microscope (TEM, JEOL-2100) equipped
with an energy-dispersive X-ray spectroscope (EDX). The surface chemical
state was tested using an X-ray photoelectron spectroscope (XPS, Axis
Supra) with Al Kα radiation. All the binding energies were calibrated
using the C 1s peak as a standard. Electron paramagnetic resonance
(EPR, JES-FA200 spectrometer) was used to test Ti vacancies.
composition was determined by X-ray diffraction (XRD, HaoYuan DX-2700BH)
and Raman spectroscopy (Raman, Thermo Scientific DXR Spectrometer).
Morphological characteristics and chemical distribution were examined
using a transmission electron microscope (TEM, JEOL-2100) equipped
with an energy-dispersive X-ray spectroscope (EDX). The surface chemical
state was tested using an X-ray photoelectron spectroscope (XPS, Axis
Supra) with Al Kα radiation. All the binding energies were calibrated
using the C 1s peak as a standard. Electron paramagnetic resonance
(EPR, JES-FA200 spectrometer) was used to test Ti vacancies.
6
Comprehensive Materials Characterization Protocol
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X-ray diffraction (XRD) was measured using Cu Kα radiation with the 2θ range from 5 to 80° at a scan rate of 5° min−1 on D/MAX2500PC. Raman spectra were recorded by Thermo Scientific™ DXR spectrometer operating at 532 nm. X-ray photoelectron spectroscopy (XPS) was evaluated by Perkin-Elmer PHI 5000C. The field-emission scanning electron microscopy (FE-SEM) was performed on JSM-7001F. The Ultraviolet-visible diffuse reflectance spectrophotometer (UV-vis DRS) on UV2450 from 200 to 800 nm with BaSO4 as reference standard. Photoluminescence (PL) emission measurements were carried out by a QuantaMaster™ 40 with an excitation wavelength of 420 nm. The electron spin resonance (ESR) measurements were recorded on a JES FA200 Spectrometer using the 5, 5-dimethyl-1-pyrroline-N-oxide (DMPO) as the radical capture reagent.
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