Aztec eds analysis software

The UV-visible spectra were recorded on a Presee TU-1950 spectrophotometer (Purkinje, Beijing, China) at a resolution of 1 nm to scan the samples in a wavelength range from 200 to 900 nm. A JSM-7800F field emission scanning electron microscope (FESEM) (JEOL, Tokyo, Japan) was used to image and study the size and morphology of AgNPs. The morphology, size, and electron diffraction pattern (SAED) of the silver nanoparticles were imaged using a JEM-2800 transmission electron microscope (TEM) (JEOL, Tokyo, Japan) with an accelerating voltage of 300 kV. X-ray diffraction pattern (XRD) images of dry nanoparticle powder was obtained using an Ulitama IV X-ray diffractometer (Rigaku, Tokyo, Japan) at the angle range of 2θ (10–80°) [24 (link)]. The Fourier transfer infrared (FTIR) spectra were obtained on a Bruker Tensor 37 (Bruker-AXS GmbH, Karlsruhe, Germany) FTIR instrument. The elemental compositions were detected using energy dispersive X-ray spectrometer (EDS) using x-act with INCA^® and Aztec^® EDS analysis software (Oxford Instruments, London, UK).

FEI Helios Nanolab G3 (FEI Company, USA) SEM equipped with an Energy Dispersive X‐ray Spectroscopy (EDS) detector (Oxford Instruments, UK) was used to capture EDS spectra. EDS spectra were taken from the center of each Ti‐PP mesh filament to mitigate any effects associated with fiber orientation. The spectra were obtained with a 10 keV accelerating voltage using a 13 nA probe current at a working distance of 5 mm. Data analysis was automated by the application of Aztec EDS analysis software (Oxford Instruments, UK).