Sigma vp feg sem
The Sigma VP FEG-SEM is a high-performance field emission scanning electron microscope (FEG-SEM) manufactured by Zeiss. It is designed to provide high-resolution imaging and analytical capabilities for a wide range of samples. The Sigma VP FEG-SEM features a Schottky field emission gun, which delivers a stable and bright electron beam for enhanced image quality and resolution. The instrument is equipped with various detectors and accessories to enable comprehensive analysis of samples.
5 protocols using sigma vp feg sem
Microstructural Analysis of Cement Materials
SEM and EDS Analysis of Pulp-Capping Biocomposite
Characterization of Protein-Loaded Nanomaterials
Characterization of Surface Wettability and Nanostructures
using a Rame-Hart 200-00 Std.-Tilting B. goniometer. Static contact
angles were measured using 6 μL water droplets. ImageJ Drop
Analysis was used to analyze the droplets. SEM images were obtained
using a Zeiss Sigma VP FEG-SEM at 10 kV in high-vacuum mode. Raman
spectroscopy was conducted using an iRaman Plus. The thiol conversion
was monitored by measuring the area of the thiol absorption peak at
2576 cm–1. Conversions were calculated with the
ratio of the peak area to the peak area prior to polymerization. All
reactions were performed under ambient conditions. Transmission electron
micrographs (TEMs) (Digital Imaging with Gatan model 785 ES1000W Erlangshen
CCD Camera) were taken with a Zeiss 900 TEM operating at 50 kV. UV–vis
spectra were obtained by using a PerkinElmer Lambda 35 UV–vis
spectrometer. Optical microscope images were obtained by using an
Olympus BX52 digital optical microscope system. Dynamic light scattering
analysis was conducted using a Microtrac Nanotrac Ultra. Confocal
images were obtained using a Zeiss LSM 510 confocal laser-scanning
microscope with a 543 nm HeNe laser.
Scanning Electron Microscopy of Tissue Sections
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