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Sigma vp feg sem

Manufactured by Zeiss
Sourced in Germany

The Sigma VP FEG-SEM is a high-performance field emission scanning electron microscope (FEG-SEM) manufactured by Zeiss. It is designed to provide high-resolution imaging and analytical capabilities for a wide range of samples. The Sigma VP FEG-SEM features a Schottky field emission gun, which delivers a stable and bright electron beam for enhanced image quality and resolution. The instrument is equipped with various detectors and accessories to enable comprehensive analysis of samples.

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5 protocols using sigma vp feg sem

1

Microstructural Analysis of Cement Materials

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Scanning electron microscope (SEM) photomicrographs were captured at 150 × magnification for BHA (10%, 20%, 30%, 40%), NHA, MTA and PC65 cements after initial setting and at 21 days immersion in distilled water. Specimens were prepared for observation under SEM by mounting them on aluminium stubs, using double-sided carbon tape. They were coated with ~10 nm of carbon in a Peltier-cooled high-resolution sputter coater (Emitech K575X; EM Technologies Ltd., Tokyo, Japan) fitted with a carbon coater (Emitech 250X; EM Technologies Ltd.). Analysis was conducted by field emission SEM (Zeiss Sigma VP FEG SEM; Zeiss, Tokyo, Japan). SEM-EDS analysis was performed on BHA, NHA, PC and ZrO2 powders and set MTA cement, to evaluate their chemical compositions.
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2

SEM and EDS Analysis of Pulp-Capping Biocomposite

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A scanning electron microscope (SEM) coupled with X-ray analysis (EDS) (JEOL 6700 F FESEM JEOL Ltd., Tokyo, Japan) was used to obtain photomicrographs of the experimental pulp-capping biocomposite after the initial setting, and to identify the elemental composition of the sample. The sample was prepared for observation under SEM by mounting it onto an aluminium stub with double-sided carbon tape and coating the sample with roughly 10 nm of gold–palladium (Au–Pd). SEM imaging and EDX analysis were performed with field emission (Zeiss Sigma VP FEG SEM; Zeiss, Jena, Germany).
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3

Characterization of Protein-Loaded Nanomaterials

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BIS characterization was performed before and after both entrapment and adsorption of the proteins. The particle size and morphology were evaluated with a Zeiss Sigma VP FEG-SEM, Milan, Italy. The surface area and the porosity were analysed by N2 physisorption analysis using Micromeritics ASAP 2010, Milan, Italy. The protein quantification and the catalytic activity were determined by UV-visible analysis with Agilent 8453 UV-visible spectrophotometer, Milan, Italy by measuring the absorbance at 595 nm (for protein quantification) and 500 nm (for cellulase assay). The qualitative analysis of entrapment and adsorbed systems were recorded by Diffuse Reflectance Fourier Transform Infrared Spectroscopy (DRIFT-IR), Milan, Italy with a NEXUS-FT-IR instrument implementing a Nicolet AVATAR Diffuse Reflectance accessory, Milan, Italy.
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4

Characterization of Surface Wettability and Nanostructures

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Contact angle measurements were performed
using a Rame-Hart 200-00 Std.-Tilting B. goniometer. Static contact
angles were measured using 6 μL water droplets. ImageJ Drop
Analysis was used to analyze the droplets. SEM images were obtained
using a Zeiss Sigma VP FEG-SEM at 10 kV in high-vacuum mode. Raman
spectroscopy was conducted using an iRaman Plus. The thiol conversion
was monitored by measuring the area of the thiol absorption peak at
2576 cm–1. Conversions were calculated with the
ratio of the peak area to the peak area prior to polymerization. All
reactions were performed under ambient conditions. Transmission electron
micrographs (TEMs) (Digital Imaging with Gatan model 785 ES1000W Erlangshen
CCD Camera) were taken with a Zeiss 900 TEM operating at 50 kV. UV–vis
spectra were obtained by using a PerkinElmer Lambda 35 UV–vis
spectrometer. Optical microscope images were obtained by using an
Olympus BX52 digital optical microscope system. Dynamic light scattering
analysis was conducted using a Microtrac Nanotrac Ultra. Confocal
images were obtained using a Zeiss LSM 510 confocal laser-scanning
microscope with a 543 nm HeNe laser.
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5

Scanning Electron Microscopy of Tissue Sections

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Following LM imaging, the glass slides were carbon-coated and mounted on a stub in preparation for Scanning Electron Microscopy (SEM) imaging. Two lines of silver paint were applied from the top surface of the slides to the stubs to increase conductivity. Sections were then imaged by detection of back-scattered electrons using a SEM (Sigma VP FEG SEM, ZEISS, Germany) operating at 3.8 kV. Consecutive sections were imaged, aligned, and modelled following the same method described previously for array tomography with LM. In this way, dozens or even hundreds of consecutive sections can be imaged over multiple areas, multiple times.
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