Fei tecnai g2 f20 transmission electron microscope

The crystal structure of the samples was analyzed using a DX-2700 X-ray diffractometer (Dandong Haoyuan Instrument Co. Ltd., Dandong, China, XRD). An FEI-Inspect F50 scanning electron microscope (FEI Company, Hillsboro, OR, USA, SEM) and an FEI-Tecnai G2 F20 transmission electron microscope (FEI Company, Hillsboro, OR, USA, TEM and HRTEM) were used to observe the morphology. An XSAM800 multifunctional surface analysis system was used to analyze the element composition and valence state of samples (Kratos Ltd., Manchester, UK, XPS). A UV-3600 ultraviolet/visible-light spectrophotometer was used to study the optical absorption performance (Shimadzu Group Company, Kyoto, Japan, DRS). Detection of the recombination of photogenerated electrons and holes was investigated using an F-4600 fluorescence spectrometer (Shimadzu Group Company, Kyoto, Japan, PL). The photocurrent response curves, electrochemical impedance spectroscopy, and Mott–Schottky plots were measured using a DH-7000 electrochemical workstation (Jiangsu Donghua Analytical Instrument Co., Ltd., China, PC, EIS and MS).

The crystal structure and phase information were studied using X-ray diffraction (XRD) using a DX-2700 X-ray diffractometer with Cu Kα radiation as the X-ray source. The scan range 2θ was 20°–70° and scan speed was 0.06°/s (Dandong Haoyuan Instrument Co., Ltd., Dandong, China). The XRD data were analyzed using jade 6.0 software. FEI-nspect F50 scanning electron microscope (SEM) and FEI-Tecnai G2 F20 transmission electron microscope (TEM and HRTEM) were used to observe the morphology (FEI Company, Hillsboro, OR, USA); the specific surface area were measured using a V-sorb 2800S analyzer (BET) (Mike Instrument Company, Atlanta, GA, USA); the composition and valence of elements were analyzed using an XSAM800 multifunctional surface analysis system (XPS) (Thermo Scientific K-Alpha, Kratos Ltd., Manchester, UK); the photoluminescence (PL) spectra were measured using an F-4600 fluorescence spectrum analyzer with a Xe lamp at an excitation wavelength of 320 nm (Shimadzu Group Company, Kyoto, Japan); the optical absorption was tested using a UV-3600 ultraviolet–visible photometer (DRS) (Shimadzu Group Company, Kyoto, Japan).

Virions were purified using a two-layer CsCl gradient, as in reference (28 (link)). A sample of phage concentrate from D5 bioreactor effluent (collected following PEG precipitation) was brought up to a final volume of 14 mL with SM buffer. Sample density was adjusted to 1.39 g/mL and loaded above 2 mL 1.7 g/mL CsCl. Samples were then ultracentrifuged at 150,000 × g for 4.5 h at 4°C. The density fractions between 1.41 and 1.50 g/mL were recovered and stored at 4°C. Before TEM imaging, 1 mL of the recovered phage suspension was centrifuged at 25,000 × g for 1 h at 4°C, after which 0.9 mL of supernatant was removed, and pelleted phages resuspended by gentle pipetting. A 5 μL droplet of the phage suspension was placed onto a glow-discharged copper grid with carbon-coated Formvar film and incubated for 30 s at room temperature. The excess solution was drained away on filter paper. Grids were incubated with 1% uranyl acetate for 10 s. Phage particles were viewed on an FEI Tecnai G2 F20 transmission electron microscope (FEI Company, Eindhoven, the Netherlands) and a Gatan Ultrascan 4k CCD camera (Gatan, Pleasanton, CA, USA).