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Jec 1200 sputter coater

Manufactured by JEOL
Sourced in Japan

The JEC-1200 is a sputter-coater designed for the deposition of conductive and protective coatings on samples for scanning electron microscopy (SEM) and other applications. The core function of the JEC-1200 is to create a thin, uniform coating on the surface of samples, improving their conductivity and contrast for high-quality imaging.

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2 protocols using jec 1200 sputter coater

1

Scanning Electron Microscopy of Cell Destruction

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The stalk samples were used to observe cell destruction before and after different pretreatments via scanning electron microscopy (SEM). The dried samples were fixed on a specimen holder with aluminium tape, then sputtered with gold in a JEOL JEC-1200 sputter-coater (Tokyo, Japan). All specimens were examined with a JEOL JSM-5600 LV scanning electron microscope (Tokyo, Japan) under high vacuum and at an accelerating voltage of 5.0 kV (10 µm, 500× magnification).
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2

Microstructural Analysis of M. sinensis Stalk

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The microstructure of the raw and pretreated stalk samples of M. sinensis was observed by SEM (Tang et al., 2019 (link)). The dried samples of M. sinensis were fixed in a specimen holder with aluminum tape. The surface of the samples was then sputtered by gold using a JEOL JEC-1200 sputter-coater (Tokyo, Japan). The specimens were then examined with a JEOL JSM-5600 LV scanning electron microscope (Tokyo, Japan) under a high vacuum. An accelerating voltage of 5.0 kV was used for the observations.
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