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17 protocols using titan g2

1

Synthesis and Characterization of Penta-twinned Silver Nanowires

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Penta-twinned Ag NWs were synthesized by reducing AgNO3 with ethylene glycol in the presence of polyvinyl pyrrolidone. More details of the NW synthesis process are provided elsewhere45 (link). The solution of Ag NWs was diluted with deionized water and then purified by centrifugation. Single-crystalline Ag NWs were synthesized by physical vapour deposition inside a molecular beam epitaxy system under ultrahigh vacuum condition and substrate temperature of 700 °C. More details of the NW synthesis process are provided elsewhere4 (link).
Conventional TEM observations were performed on JEOL 2010F operated at 200 kV. Atomic-resolution high-angle annular dark-field scanning TEM imaging was performed on a probe-corrected FEI Titan G2 60–300 kV S/TEM equipped with an extreme field emission gun (X-FEG) electron source operated at 200 kV.
Cross-section TEM samples were prepared by embedding Ag NWs into Gatan G1 epoxy with a φ3 Cu tube, cutting the specimen discs with a thickness of ~0.5 mm, mechanically polishing with Allied Multiprep System and finally ion milling the sample via Gatan 791 PIPS while cooling with liquid nitrogen.
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2

In-situ Observation of Nanoscale Sodium-Sulfur Battery

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The nanobattery setup consists of a SeS2@CNT working electrode, metallic Na counter/reference electrodes, and Na2O SE naturally formed on the Na surface. For assembling, SeS2@CNT was dispersed in ethanol, then dropped to an aluminum rod and dried. The metallic Na was scratched onto another side of the aluminum rod. The assembled nanobatteries were constructed on a microelectrochemical systems (MEMS) heating device, which comprises of an electric circuit and a heating circuit. Subsequently, the device was inserted into a Cs‐corrected environmental TEM (FEI, Titan G2, 300 kV) for observation.
The ASS Na–SeS2 batteries were assembled in a home‐made mold with a diameter of 10 mm. The as‐prepared composite cathodes with an area loading of 1.34 mg cm−2, Na3SbS4 electrolyte (100 mg), and Na15Sn4 (50 mg) powders were cold‐pressed under a pressure of 350 MPa for rate and cycling characterizations.
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3

Characterization of Graphene Domains

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To investigate the structure of the graphene formed at different stages, the Pt foil was quickly pulled out of the high-temperature zone after SACVD growth. The furnace was then shut down and the methane flow was stopped after the furnace temperature had decreased to 600 °C. Finally, the Pt foil was taken out and characterized by SEM (Nova NanoSEM 430, acceleration voltage of 5 kV). The small graphene domains and polycrystalline films were transferred onto Si/SiO2 (290 nm) substrates using a improved bubbling transfer method11 (link), in which the Poly(methyl methacrylate) (PMMA) used for transfer had a smaller molecular weight (600 kDa, 4 wt.% in ethyl lactate) and the acetone used for removing PMMA was heated at 50 °C to enhance the solubilities, for morphological and quality analysis by optical microscopy (Nikon LV100D) and Raman spectroscopy (JY HR800, 532 nm laser wavelength, 1 μm spot size, 1 s integration time, laser power below 2 mW). The polycrystalline films were transferred to TEM grids by using a improved bubbling transfer method mentioned above for GB analysis by TEM (FEI Tecnai F20, 200 kV; FEI Tecnai T12, 120 kV; FEI Titan G2 equipped with an image-side spherical aberration corrector, 80–300 kV).
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4

In-Depth Characterization of All-Solid-State Batteries

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XRD was conducted using Rigaku D/MAX‐2500/PC (Cu K α, 40 kV 200 mA) in the range of 10°–70°. In situ TEM characterizations were carried out in a Cs‐corrected TEM (FEI, Titan G2, 300 kV). The electrochemical properties of the ASS batteries were studied on a Neware system. The cyclic voltammetry (CV) tests were conducted on a Princeton 4000 electrochemical workstation by applying a scan rate of 0.1 mV s−1 in the voltage range of 0.5–2.8 V. The GITT tests were charged/discharged at a current density of 0.017 C for 1 h then resting for 2 h. The in situ EIS were conducted in a frequency range of 1 Hz to 5 MHz at voltages of 1.4, 1.2, 1.0, 0.8, and 0.5 V during discharging process and 1.8, 2.0, 2.2, 2.4, 2.6, and 2.8 V during charging process at room temperature.
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5

Atomic-Resolution STEM Imaging of Materials

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A cross-sectional specimen for HR STEM was prepared in an FEI Dual Beam Nova 600i instrument incorporating a focused ion beam and a scanning electron microscope in the same chamber. Using 30-kV ion milling, platinum deposition, and lift-out with a micromanipulator, a thin cross section of material was secured on an Omniprobe TEM grid and thinned down to electron transparency with low-energy ions. HR STEM images were acquired using a probe side aberration-corrected FEI Titan G2 80 to 200 kV with an X-FEG electron source. Bright-field (BF) imaging and high-angle annular dark-field (HAADF) imaging were performed at 200 kV using a probe convergence angle of 21 mrad, an HAADF inner angle of 48 mrad, and a probe current of ~80 pA. The lamellae were aligned with the basal planes parallel to the incident electron probe. Correct identification of each atomic layer within BF and HAADF images was achieved by elemental analysis with EDX spectrum imaging.
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6

Characterization of Platinum Cluster Optical Properties

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The optical properties of Pt clusters were characterized using a spectrofluorometer (RF-5301, Shimadzu, Japan) and a UV-1800 spectrophotometer (Shimadzu, Japan). The Pt cluster sizes and zeta potential were recorded on a Zetasizer Nano (ZS90, UK) instrument. The molecular formula of Pt clusters was analyzed by matrix-assisted laser desorption/ionization time-of-flight mass spectrometry (MALDI-TOF MS, ABI MALDI-TOF, United States) in the positive ion linear mode by using sinapinic acid as the matrix. The TEM image was obtained using an FEI Titan G2 (300 kV) transmission electron microscope.
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7

Momentum-Resolved 4D-STEM Imaging of PbZr0.2Ti0.8O3

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Momentum-resolved 4D-STEM data of a PbZr0.2Ti0.8O3 specimen have been collected by scanning a focused aberration-corrected electron probe across the sample and recording a full diffraction pattern at each scan position with an EMPAD detector31 (link). The direction of the incident beam was along the [010] zone axis of the crystal. An FEI Titan G2 scanning transmission electron microscope (STEM) equipped with an aberration corrector for the illumination was operated at 200 keV electron energy. The STEM pixel size was set to 35 pm, and a dwell time of 1 ms was chosen for each STEM pixel, synchronized with the frame recording of the EMPAD detector. The probe semi-convergence angle has been measured to 24.6 mrad, and the pixel size in the recorded diffraction patterns was 0.88 mrad.
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8

Morphological Analysis of Bacterial Interactions with Selenium Nanoparticles

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The morphology,
structure, and location of the NPs after interaction with the bacterial
models were analyzed by environmental scanning electron microscopy
(ESEM) and STEM. The cells of L. sphaericus and S. bentonitica were incubated
with BSA-SeNPs, UD-SeNPs, CS-SeNPs, and AgNPs separately, to a final
concentration of 100 μM for 24 h at 160 rpm and 28 °C.
Once again, the untreated cell cultures served as controls.
For ESEM analysis, sample preparation was performed, as described
by Ruiz-Fresneda et al. (2018)23 (link) with minor
modifications. Analysis was performed with a Quanta 400 instrument
(FEI, USA) equipped with an EDX detector and a backscattered electron
detector. Secondary electrons were excited at 5 kV and a working distance
of 6–8 mm.
For STEM analysis, ultra-thin sections of
the samples were prepared
following the procedures of Merroun et al. (2005).43 (link) The analysis of the samples was performed with a transmission
electron microscope Titan G2 (FEI, USA), operated at 300 kV and equipped
with a Super-X EDX detector, and a high-angle annular dark-field detector
(HAADF). Structural characterization of the Se nanostructures was
performed by high-resolution TEM combined with selected-area electron
diffraction (SAED).
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9

Thermoelectric Performance Characterization

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The electrical conductivity and Seebeck coefficient were measured simultaneously (ULVAC-RIKO ZEM-3 system, Japan). High-temperature thermal properties were determined by measuring thermal diffusivity with a laser flash system (LFA-467 HT HyperFlash®, Germany). Specific heat was measured with a differential scanning calorimeter (Netzsch DSC 214, Germany). The thermal conductivity, κ, was calculated from κ=αCpρ , where α, ρ, and Cp are thermal diffusivity, density, and specific heat. The density is measured using the Archimedes method. The uncertainties in electrical conductivity, thermal conductivity, Seebeck coefficient, and zT are ±5, ±2, ±5, and ±7%, respectively. The microstructure of alloys and uni couple module junctions is characterized by field emission scanning electron microscopy (FESEM, FEI Verios G4), energy dispersive spectroscopy (EDS, Oxford Aztec), and electron backscattered diffractometry (EBSD, FEI Apero S, Oxford AztecCrystal). The carrier density and mobility were measured by LakeShore Hall Effect System (8400 Series HMS, LakeShore). The TEM is performed using FEI Titan G2.
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10

Characterization of Carbon Quantum Dots

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UV-visible electronic absorption spectra measurements were carried out using an Agilent Cary 100-UV-visible Spectrophotometer. The fluorescence emission spectra of the samples were measured using a Horiba Fluoromax 4C spectrofluorometer (HORIBA, Edison, NJ, USA). Fluorescence lifetime experiments were performed using a Horiba Jobin Yvon instrument (HORIBA, Edison, NJ, USA) in a Time-Correlated Single Photon Counting (TCSPC). A nano-LED of 390 nm was used as a source of excitation for CQDs. LUDOX AM30 (Sigma-Aldrich/ St. Louis, MO, USA) colloidal silica scattering medium was used for the instrument response function. The pulse repetition rate of TCSPC was fixed at 1 MHz. The average size of CQDs was carried out by using an FEI Titan G2 (Hillsboro, OR, USA) 300 kV high-resolution transmission electron microscope (HR-TEM). Surface functionality characterization was carried out by X-ray photoelectron spectroscopy (XPS) using PHI 5000 Versaprobe II (ULVAC-PHI, Enzo Chigasaki, Japan), FEI.
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