Jsm 6010la electron microscope
The JSM 6010LA is a scanning electron microscope (SEM) manufactured by JEOL. It is designed to provide high-resolution imaging and analysis of a wide range of samples. The JSM 6010LA utilizes a thermionic electron gun to generate the electron beam and features a large specimen chamber to accommodate various sample types. The instrument is capable of producing detailed, high-quality images with its advanced imaging capabilities.
9 protocols using jsm 6010la electron microscope
SEM Sample Preparation for Wood and EOP Analysis
Specimen Preparation for Electron Microscopy
Scanning Electron Microscopy of Shoot Organogenesis
Microscopic Analysis of Lipid Nanoparticles
of the samples for SEM, drops of the EO-LNP suspensions as well as
drops of redispersed freeze-dried EO-LNPs were adsorbed onto a glass
coverslip and air dried at 25 °C. The cover slips were in turn
attached to aluminum stubs using carbon tape and sputter-coated with
gold in a Balzers MED 010 unit (Oerlikon Balzers, Balzers, Liechtenstein).
SEM analysis was conducted with a JSM 6010LA electron microscope (JEOL
Ltd., Tokyo, Japan).
Scanning Electron Microscopy of LNPs
Collagen Scaffold Preparation and SEM Imaging
Drosophila Microscopic Preparation
Drosophila Head Preparation for SEM
SEM Analysis of Catalysts
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