Graphite, GO and the GO-Pr material were characterized via powder X-ray diffraction with a D8 instrument from Bruker, using Cu Kα radiation (λ = 1.5406 Å). The optical absorption was studied by finely dispersing 0.1 mg of graphene oxide flake in DI water to make a stable, transparent dispersion, and studying this using a milli-Q A10 TOC spectrometer in the 200–600 nm range. The molecular structure, i.e. the functional groups, was studied using an FTIR Spectrum 65 instrument from PerkinElmer. Thermal behaviour was tested using SII TG/DTA7300 apparatus. The microstructures of the materials were studied via confocal Raman spectroscopy, using a 532 nm laser as the excitation source, with a WITec Raman microscope. The morphologies and compositions of the materials were studied using a Carl Zeiss FESEM Marline compact microscope equipped with an EDX detector. The size distributions and zeta potentials of aqueous solutions were studied using a Microtrac Zetatrac U2771. Thin film analysis was conducted using Horiba UVi Cell2 apparatus over a range from 1.5000–6.0000 eV at increments of 0.0500 eV. The GO sheet morphology and GO + Pr composite material crystallinity were observed using an FEI Techani F Twin 500 transmission electron microscope.
Raman microscope
Manufactured by WITec
Sourced in Germany
The Raman microscope is a laboratory instrument that combines the capabilities of a high-resolution optical microscope with the analytical power of Raman spectroscopy. It is designed to non-invasively characterize and identify materials at the micro- and nano-scale by measuring their unique Raman spectra.
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Lab products found in correlation
7 protocols using raman microscope
1
Comprehensive Characterization of Graphene Oxide and Composites
2
Raman Spectroscopy of Siderophore Compounds
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The Raman measurements were performed in backscattering geometry using a Raman microscope (WITec GmbH, Ulm, Germany) with 514 nm excitation wavelength using a × 20 magnification objective (Zeiss Plan-Neofluar, × 20, NA = 0.4, Oberkochen, Germany). The laser spot size is approximately 1.6 μm. Detailed information on the setup can be found elsewhere [36 (link)]. The integration time per spectrum was 1 s, while the laser power was 10 mW. For the concentration series for each concentration, three scans (70 μm × 70 μm, 20 × 20 spectra) in one dried droplet were performed. The dried TAFC droplets will exhibit a coffee ring effect. We performed the scans within the spot ca. 10 μm away from the outer margin. In the classification data set with [Fe]TAFC and FerB, we included four samples per analyte with different concentrations. From each sample, four dried droplets were investigated, two on IER substrates and two on standard Raman chips. Per droplet, three line scans (ca. 80 μm) with 50 spectra were performed. As standard Raman chips, silicon wafers sputtered with aluminum were used [37 (link)]. For the IERS measurements, an additional layer of 60 nm Al2O3 was deposited on the aluminum surface. Further details can be found elsewhere [38 (link)].
3
Raman Spectroscopy Detects Deinoxanthin
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After exposure to stress conditions, the detectability of deinoxanthin was determined by Raman spectroscopy. Sample disks were placed under a Raman Microscope (WITec), equipped with a 532 nm laser. Spectra were routinely obtained by employing 3.02 mW of laser power. Line scans were performed using the 10× optical objective and measured over a predetermined distance (10 μm) with 50 spectra accumulated with an integration time of 2 s. Each sample was analyzed by five line scans where the area of analysis was randomly chosen, resulting in a total of 250 scans per sample. Following the line scans, area scans were performed over a square of 50 × 50 μm2, divided into 25 lines per image with 25 points for each line measured and with 2 s integration time. All spectra (875 in total) were evaluated against predetermined quality criteria (Figure 6 ).
4
Raman Spectroscopy of Polymer Samples
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Raman measurements
on the samples were obtained using an α 300R confocal Raman
microscope equipped with a UHTS200 spectrometer and a DV401 charged-coupled
device detector from WITec (Ulm, Germany). Detailed measurement conditions
are reported elsewhere.30 (link)
on the samples were obtained using an α 300R confocal Raman
microscope equipped with a UHTS200 spectrometer and a DV401 charged-coupled
device detector from WITec (Ulm, Germany). Detailed measurement conditions
are reported elsewhere.30 (link)
5
Apatite Layer Formation on AZ31B Alloy
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Immersion tests were conducted for seven days to study the formation of an apatite layer on the surface of uncoated and coated AZ31B samples. The samples were immersed in Hank’s solution. On the third and seventh days, they were extracted and analyzed using Raman spectroscopy. Raman spectra were recorded using a confocal Raman microscope (WiTec, Ulm. Germany) with a spectral resolution of 0.02 cm−1 coupled with an AFM instrument (ALPHA 300RA, WiTec, Ulm, Germany) and with 532 nm excitation laser. The images were analyzed with the WiTec Project Plus 2.08 software.
6
Raman Spectroscopy of Polycarbonate Interfaces
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A Raman microscope (WiTec, Ulm, Germany) in inverse configuration with a stepper-motor driven 63× objective with correction of the transmission thickness was used at a laser wavelength of 488 nm. A glass fiber with 100 µm serves as aperture for measurements of PC/hardener, for measurements at the PC/resin interface an aperture of 25 µm had to be used. The irradiance of the laser was 2.5–2.6 mW. The spectrometer used was a UHTS300 (WiTec, Ulm, Germany) with a grating with 600 grooves per mm. The integration time of the DV 401 spectrometer camera was always 2 s. Resin or hardener was applied to the 72–80 µm thick films of polycarbonate as thick drops with a diameter of a few millimeters. The measuring position was controlled by an optical microscope and set up in such a way that the measurement could begin about 2 min after dripping the fluid. The objective was approached from bottom to top so that the lower air/PC interface was also recorded. This gives a reference position for each measurement, as it was found that the sample moves by a few micrometers when measurements are taken over a few hours.
7
SERS Spectroscopy of Samples
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SERS spectra were recorded using a confocal Raman microscope (WITec GmbH, Ulm, Germany) equipped with a 488 nm excitation laser line. For the irradiation of the samples a 100× Olympus objective (NA 0.9) with a laser power of 35 µW was employed. The same objective was applied for recording the backscattered light with a spectrometer, equipped with 600 lines per mm grating and a 1024 × 127 pixel CCD camera cooled to 208 K. Average SERS spectra were calculated from ten different measurement points with an integration time of 10 s.
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