X pert pro mrd x ray diffractometer

The following instrumental studies were performed in order to characterize the prepared adsorbent: SEM, EDX, XRD, FTIR and BET. The SEM and EDAX analyses were determined with a Quanta 3D instrument AL99/D8229 (FEI Company, Hillsboro, OR, USA). X–ray powder diffraction was conducted using an X’Pert PRO MRD X–ray diffractometer (PANalytical, Almelo, The Netherlands). The experiment was recorded by monitoring the diffraction pattern appearing in the 2θ range from 10° to 90°. Infrared absorption spectra (400–4000 cm⁻¹) were analyzed with a Thermo Scientific Nicolet 6700 FT-IR spectrometer (Thermo Fisher Scientific, Waltham, MA, USA). BET surface area analysis was performed via Quantachrome instruments (Boynton Beach, FL, USA).

Scanning electron microscopy images were taken with a Carl Zeiss Supra 40 field emission scanning electron microscope at an acceleration of 5 kV. Transmission electron microscopy images were acquired using a Hitachi HT7700 transmission electron microscope. Fourier transform infrared spectroscopy (FT-IR) spectra were acquired by a Bruker Vector-22 FT-IR spectrometer at room temperature. X-ray diffraction of patterns were carried out on a PANalytical X’pert PRO MRD X-ray diffractometer equipped with Cu Kα radiation (λ = 1.54056 Å). The X-ray microtomography was conducted on Zeiss Xradia 520 for the 3D microstructural information. The raw data were reconstructed using the software Dragonfly by assembling the static images in sequence. Atomic force microscope images were taken with a Bruker Dimension FastScan.

SEM images were taken with a Carl Zeiss Supra 40 field emission scanning electron microscope (2–5 kV, depending on the sample state). All samples were measured in the form of aerogels that were prepared by freeze-drying of the purified wet nanocomposite pellicles. All aerogel samples were sputtered with gold for 30 s at a constant current of 30 mA before observation. Transmission electron microscopy (TEM) images were acquired using a JEOL JEM-ARM200F transmission electron microscope (200 kV). XRD data were measured by a PANalytical X'pert PRO MRD X-ray diffractometer equipped with Cu Kα radiation (λ = 1.54056 Å). The samples were tested in the form of films prepared by hot-pressing of the purified wet nanocomposite pellicles. UV–vis spectra were recorded on UV-2501PC/2550 at room temperature (Shimadzu Corporation, Japan). TGA data were measured in a nitrogen atmosphere with a TA Instruments SDT Q600 thermogravimetric analyzer. All the samples were tested in the form of films.