Microstructural observations were initially made using a standard research-grade polarised optical microscope. Selected samples were analysed using a Zeiss Sigma Field-Emission Gun scanning electron microscope in the Otago Micro and Nanoscale Imaging (OMNI) facility at the University of Otago. Backscatter electron (BE) and secondary electron (SE) images were acquired using a 15 keV accelerating voltage and 6.6–8 mm working distance. Electron Backscatter Diffraction (EBSD) data were acquired using an HKL Synergy Integrated EDS/EBSD system (Oxford Instruments) with an accelerating voltage of 30 kV and an aperture of 300 μm. Post-acquisition EBSD data processing was performed in Channel 5 software (Oxford Instruments) and the MTEX toolbox for MATLAB. Energy-Dispersive X-Ray Spectroscopy (EDS) measurements of chemical composition were acquired with an acceleration voltage of 15 kV, a beam current of approximately 1 nA, a live count time of 60 s, and a working distance of 8.5 mm.
Sigma field emission gun scanning electron microscope
Manufactured by Zeiss
The Sigma Field-Emission Gun scanning electron microscope is a high-performance imaging tool designed for advanced materials analysis. It features a field-emission gun that provides a high-brightness electron beam, enabling high-resolution imaging and analysis of a wide range of samples.
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Lab products found in correlation
2 protocols using sigma field emission gun scanning electron microscope
1
Microstructural Characterization of Materials
2
Scanning Electron Microscopy of rGO Foam
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A Zeiss SIGMA field emission gun scanning electron microscope (SEM) with Zeiss in-lens secondary electron detector was operated with a 1.00 kV electron high tension, and with typical working distances in the region of 3 mm. The rGO foam samples themselves have an innate conductivity so no further sample preparation was necessary prior to the electron microscopy, other than mounting the foam onto SEM sample stubs with carbon tape. To mount the samples, the foam was cut and attached to SEM stubs in multiple different orientations with carbon tape to image the sample from multiple directions, including cross-sections. To help clarify SEM images of cell culture samples, they were false coloured in blue to highlight any cell-derived structures.
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