Ceramic samples of xBMT-PT with x = 0.10, 0.20, 0.30, 0.40, 0.50, 0.63, 0.65, and 0.70 were prepared following the conventional solid-state synthesis route, details of which can be found elsewhere25 (link). Room-temperature powder x-ray diffraction data (Stoe Stadi-MP powder X-ray diffractometer) were collected to verify the formation of a single perovskite phase. Electron microprobe analyses (wavelength-dispersive Cameca Microbeam SX100 SEM-system) averaging over 50 points from each compound were conducted to confirm the expected chemical compositions (see Supplementary Material Fig. S1 ). Commercially available powder of PbTO3 (Sigma Aldrich, purity ~99.9%) was used as a reference sample in Raman spectroscopic analyses.
Stadi mp powder x ray diffractometer
Manufactured by STOE
The Stadi-MP powder X-ray diffractometer is a laboratory instrument designed to analyze the crystalline structure of solid materials. It uses X-rays to identify and quantify the different crystalline phases present in a powdered sample. The core function of the Stadi-MP is to provide detailed information about the atomic and molecular structure of the analyzed material.
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Lab products found in correlation
2 protocols using stadi mp powder x ray diffractometer
1
Synthesis and Characterization of BMT-PT Ceramics
2
Perovskite X-ray Diffraction Characterization
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Powder
X-ray diffractions
patterns of the ground perovskite were collected using a STOE STADI
MP powder X-ray diffractometer. The diffractometer was running in
Bragg–Brentano mode with 2θ–θ geometry,
a linear position-sensitive detector, and a copper K-α1 (λ
= 1.540 60 Å) source. The diffraction patterns were measured
for an acquisition time of 1200 s per sample and collected values
over −16° to 61° (2θ).
X-ray diffractions
patterns of the ground perovskite were collected using a STOE STADI
MP powder X-ray diffractometer. The diffractometer was running in
Bragg–Brentano mode with 2θ–θ geometry,
a linear position-sensitive detector, and a copper K-α1 (λ
= 1.540 60 Å) source. The diffraction patterns were measured
for an acquisition time of 1200 s per sample and collected values
over −16° to 61° (2θ).
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