Glass slides (Menzel Glaser, Braunschweig, Germany) (26 mm × 76 mm × 1 mm) were used as the donor substrate, on the surface of which Ti was deposited by magnetron sputtering using a VSE-PDV-DESK-PRO installation (OOO Vacuum Systems and Electronics, Novosibirsk, Russia). The film surface was studied by atomic force microscopy on a Solver Pro M complex (ZAO Nanotechnology MDT, Moscow, Russia) in order to determine the thickness of the Ti film, which was 50 ± 10 nm.
Immediately prior to laser transfer, a layer of empty gel or gel mixed with yeast was deposited on the surface of the Ti film of the donor substrate (200-μm thick). The gel was an aqueous solution of 2% hyaluronic acid (Mw = 70 kDa, Contipro Pharma, Dolní Dobrouč, Czech Republic).
Opposite the donor substrate with the gel, a 12-well plate (Costar Corning, Corning, NY, USA) was placed and fixed on an automated moving platform. For visual control of the process of formation and the transfer of the gel jets and drops, a Fastcam SA-3 high-speed camera (Photron, Tokyo, Japan) with frontal illumination from a continuous laser with a wavelength of 630 nm was used. After laser exposure, the Ti films were examined using a PHENOM ProX scanning electron microscope (Phenom-World, Eindhoven, The Netherlands) and an HRM-300 Series optical 3D microscope (Huvitz, Anyang-si, Gyeonggi-do, Korea).
Immediately prior to laser transfer, a layer of empty gel or gel mixed with yeast was deposited on the surface of the Ti film of the donor substrate (200-μm thick). The gel was an aqueous solution of 2% hyaluronic acid (Mw = 70 kDa, Contipro Pharma, Dolní Dobrouč, Czech Republic).
Opposite the donor substrate with the gel, a 12-well plate (Costar Corning, Corning, NY, USA) was placed and fixed on an automated moving platform. For visual control of the process of formation and the transfer of the gel jets and drops, a Fastcam SA-3 high-speed camera (Photron, Tokyo, Japan) with frontal illumination from a continuous laser with a wavelength of 630 nm was used. After laser exposure, the Ti films were examined using a PHENOM ProX scanning electron microscope (Phenom-World, Eindhoven, The Netherlands) and an HRM-300 Series optical 3D microscope (Huvitz, Anyang-si, Gyeonggi-do, Korea).