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X max silicon drift detector

Manufactured by Oxford Instruments
Sourced in United Kingdom

The X-Max silicon drift detector is an advanced energy dispersive X-ray spectroscopy (EDS) detector manufactured by Oxford Instruments. It is designed to provide high-resolution X-ray analysis in a compact and efficient package. The X-Max detector utilizes a silicon drift detector technology to offer improved energy resolution and count rate performance compared to traditional detectors.

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11 protocols using x max silicon drift detector

1

Elemental Analysis of Dried Bacteria

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Bacterial specimens were dried at 45 °C and placed on an aluminum sample holder; the elemental composition was analyzed using an X-Max Silicon Drift Detector (Oxford Instruments, GB) mounted on an EVO40 scanning electron microscope (Carl Zeiss).
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2

Spherical Particle Size Analysis by SEM

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The spheres were sonicated for 5 min in an ultrasonic water bath, and 3 μL of the sphere suspension was placed on a cover glass to dry. The samples were subsequently sputtered with an Au layer using a Quorum Sputter Coater Q150T ES (Quorum Technologies, Ringmer, UK), and then, the samples were analyzed under a JEOL JSM-7001F (JEOL. Ltd, Tokyo, Japan) field emission scanning electron microscope at a 15 kV accelerating voltage. Energy-dispersive X-ray spectroscopy was performed using an X-Max silicon drift detector (Oxford Instruments, Abingdon, UK) and analyzed using INCA Energy software (Oxford Instruments Analytical, High Wycombe, UK).
At least 70 individual spheres were measured on several randomly selected SEM images to calculate an average particle size. The particle sizes were determined with ImageJ 1.46r software by measuring the diameter of separated particles. The values represent the mean from three independent experiments.
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3

Quantifying Trichome Elemental Composition

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Trichomes were viewed using the high vacuum mode setting on the FEI Quanta 450 scanning electron microscope at 5000x magnification. X-ray analysis was performed using a 1μm2 region of interest for approximately 2,000 frames per sample using an X-MAX silicon drift detector and INCA software (Oxford Instruments). Analyses were performed on glh1 trichome cell walls, Columbia inter-papillae regions, and Columbia papillae. Once spectra were acquired for mutant and wild type trichomes, peak heights were measured for calcium. Two-tailed two-sample t-test was performed to compare the elemental make-up of wild type and mutant trichome cell wall surfaces.
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4

Detailed Protein Surface Analysis

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A FEI Versa 3D Dual Beam Scanning Electron Microscope/Focused Ion Beam (Hillsboro, OR) with an XMAX silicon drift detector (Oxford Instruments, Abingdon, Oxfordshire, UK) was used to obtain information regarding the surface morphology, elemental composition, and distribution of elements of the protein samples. SEM data was obtained at an acceleration voltage of 7 kV and a spot size of 4.0 using an Everthart Thornely (ET) detector for image collection. Elemental mapping and energy spectra were acquired and processed with AZtecEnergy software (Oxford Instruments, UK). For sample preparation, a small square piece of ruby red mica sheet (Electron Microscopy Sciences, Hatfield, PA) was mounted onto a standard SEM pin stub specimen mount (Ted Pella, Redding, CA). The grids prepared for TEM analysis were placed on top of the mica and a thin coating (3 nm) of electrically conductive material (gold) was deposited on the sample by a low vacuum sputter coater (Quorum Technology, Laughton, UK).
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5

Analyzing Residual Aluminum Particles

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To investigate, if residual aluminum particles remain on the PCL/HA sheets after the LC process, scanning electron microscopy (SEM) and energy-dispersive X-ray spectroscopy (EDX) were performed. Therefore, manufactured sheets were sputter coated with platinum and subsequently analyzed using a Lyra 3 system (Tescan). Imaging was performed at 5 kV using a secondary electron detector and the associated LycaTC software (Tescan). EDX was performed at 10 kV using an X-Max silicon drift detector (Oxford Instruments) and the associated Aztec software (Oxford Instruments).
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6

Structural Characterization of Cu-In-S Nanostructures

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The Cu–In–S seeds, Cu–In–(Zn)–S/ZnS core/shell structures (after 30 min), Cu–In–(Zn)–S/ZnS core/shell structures (after 60 min) and Cu–In–(Zn)–S/ZnS core/shell structures (after 120 min) were characterized by transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) using a Titan operating at an accelerating voltage of 300 kV. Energy-dispersive X-ray spectroscopy (EDX) were performed at 300 kV with an Oxford instruments X-max silicon Drift Detector. The data was analysed with AZtechEnergy EDX software, allowing for point scans, line scans and mapping scans to be carried out and interpreted.
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7

Surface Characterization of Copper Elastomer

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The chemical composition of the materials’ surfaces was characterized via EDS by using a Magellan 400 XHR SEM outfitted with an Oxford Instruments X-Max Silicon Drift Detector. For these measurements, the samples were again subjected to various strains, fixed with an epoxy resin, and sputter coated with an ~2-nm film of platinum/palladium. The resulting copper elemental maps were analyzed by using the ImageJ (NIH) software package and were consistent with expectations from the SEM experiments. Such characterization further confirmed the chemical identity of the copper domains covering the surface of the elastomer.
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8

Quantitative analysis of disc wear

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After the friction tests, the discs and cylinders were cleaned twice in an ultrasonic bath with n-heptane (Chimie Plus: >99%) for 10 min to remove residual oil. The sample was handled with metallic tweezers without touching the surface of the disc. The wear volumes of the disc and cylinder were measured using an optical white light interferometer (Contour GT-K1, Bruker). The surfaces were observed without any conductive coating by SEM using a FEI XL30-FEG equipped with an Everhardt-Thornley secondary electron detector and operating under high vacuum. The acceleration voltage was set between 2 and 5 kV. Chemical composition analyses were carried out by EDX using an Oxford Instruments X-max silicon drift detector (80 mm² ultra-thin window). Quantitative analysis of the EDX spectra was performed using the Aztec software.
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9

Characterizing Microplastic Samples Using SEM-EDS

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The gated fractions obtained from FACS of control field samples spiked with 13.6 μm PS particles and of site D samples were analysed by SEM and EDS. Liquid samples were vacuum-filtered onto gold-coated polycarbonate Whatman Nuclepore Track-Etched Membranes (pore size 0.2 μm, WHA112106 Aldrich). Samples were imaged with a FEI NovaNanoSEM 230 at 15 kV using a gaseous analytical detector. EDS was done at 30 kV using an Oxford instruments X-Max silicon drift detector.
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10

Comprehensive Materials Characterization Protocol

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UV–vis absorption
spectra were measured by a PerkinElmer Lambda 950 UV/VIS setup. Scanning
electron microscopy (SEM) and energy-dispersive spectroscopy (EDS)
images were measured using a LEO 1550 Gemini instrument, with a voltage
of 10 kV, a WD of 8.5 mm, and an X-Max silicon drift detector (Oxford
Instruments). High-resolution transmission electron microscopy (HRTEM)
was carried out using a JEM 2100F instrument with a voltage of 200
kV. X-ray diffraction (XRD) patterns were measured by a Prefix diffractometer
with Cu Kα1 (λ = 1.54 Å). X-Ray photoelectron
spectroscopy (XPS) was measured by an ESCALab220I-XL spectrophotometer
with Al-Kα radiation.
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