X max silicon drift detector
The X-Max silicon drift detector is an advanced energy dispersive X-ray spectroscopy (EDS) detector manufactured by Oxford Instruments. It is designed to provide high-resolution X-ray analysis in a compact and efficient package. The X-Max detector utilizes a silicon drift detector technology to offer improved energy resolution and count rate performance compared to traditional detectors.
Lab products found in correlation
11 protocols using x max silicon drift detector
Elemental Analysis of Dried Bacteria
Spherical Particle Size Analysis by SEM
At least 70 individual spheres were measured on several randomly selected SEM images to calculate an average particle size. The particle sizes were determined with ImageJ 1.46r software by measuring the diameter of separated particles. The values represent the mean from three independent experiments.
Quantifying Trichome Elemental Composition
Detailed Protein Surface Analysis
Analyzing Residual Aluminum Particles
Structural Characterization of Cu-In-S Nanostructures
Surface Characterization of Copper Elastomer
Quantitative analysis of disc wear
Characterizing Microplastic Samples Using SEM-EDS
Comprehensive Materials Characterization Protocol
spectra were measured by a PerkinElmer Lambda 950 UV/VIS setup. Scanning
electron microscopy (SEM) and energy-dispersive spectroscopy (EDS)
images were measured using a LEO 1550 Gemini instrument, with a voltage
of 10 kV, a WD of 8.5 mm, and an X-Max silicon drift detector (Oxford
Instruments). High-resolution transmission electron microscopy (HRTEM)
was carried out using a JEM 2100F instrument with a voltage of 200
kV. X-ray diffraction (XRD) patterns were measured by a Prefix diffractometer
with Cu Kα1 (λ = 1.54 Å). X-Ray photoelectron
spectroscopy (XPS) was measured by an ESCALab220I-XL spectrophotometer
with Al-Kα radiation.
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