Membranes modified with Aqp-SH were analyzed for changes in the concentration of sulfur since unmodified PBI, -COOH modified PBI, and PVA-alkyl modified PBI membranes do not contain any sulfur present in their structures. Hence, Aqp-SH modified membranes were analyzed for the sulfur concentration in them as a confirmation for attachment of aquaporins to the membranes. K-Alpha x-ray photoelectron spectrometer (XPS, Thermo Fisher Scientific, Waltham, MA, USA) was used in order to analyze the elemental composition along the cross section of both unmodified and Aqp-SH modified membranes. Depth profiling was performed using an ion beam to etch layers of membrane surfaces and elemental composition was measured after each etching cycle. An ion beam of 200 eV was used to etch the surface. Three etching cycles were performed for 120 s each for elemental analysis along cross sections of membranes.
K alpha x ray photoelectron spectrometer xps
Manufactured by Thermo Fisher Scientific
Sourced in United States
The K-Alpha x-ray photoelectron spectrometer (XPS) is a laboratory instrument used for surface analysis. It provides information about the chemical composition and electronic structure of a material's surface by detecting the energy of photoelectrons emitted from the sample when exposed to X-rays.
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Lab products found in correlation
Sdt q600, by TA Instruments (1 mentions)
Su 70, by Hitachi (1 mentions)
Avantage data system, by Thermo Fisher Scientific (1 mentions)
Gemini 300, by Zeiss (1 mentions)
Themis z, by Thermo Fisher Scientific (1 mentions)
D8 advanced x ray diffractometer, by Bruker (1 mentions)
7800 icp ms instrument, by Agilent Technologies (1 mentions)
Ftir 8400, by Shimadzu (1 mentions)
Jem 2100, by JEOL (1 mentions)
D8 avance x ray diffractometer, by Bruker (1 mentions)
Cf 10, by Daihan Scientific (1 mentions)
Dsa100, by Krüss (1 mentions)
Labram hr evolution, by Horiba (1 mentions)
Spectrum one, by PerkinElmer (1 mentions)
Jsm 6701f, by JEOL (1 mentions)
Tecnai g2 f30 s twin, by Thermo Fisher Scientific (1 mentions)
Xl30 sem, by Philips (1 mentions)
Raman spectrometer, by Renishaw (1 mentions)
11 protocols using k alpha x ray photoelectron spectrometer xps
1
Characterizing Sulfur Content in Aqp-SH Modified Membranes
2
Characterization of Hydroxide Monolith Synthesis
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Microstructure and morphology of the synthesized hydroxide monolith were observed with a scanning electron microscope (SEM, SU-70, Hitachi Ltd., Japan). The element distribution was examined by energy-dispersive X-ray spectroscopy (EDS) attached to the SEM. The phase composition was characterized by powder X-ray diffraction (XRD, PANalytical B.V., Holland). Chemical bonding information was examined by Fourier-transform infrared spectroscopy (FTIR, Nicolet 5700, Thermo Fisher Co., USA). Thermogravimetry-differential thermal analysis (TG-DTA, SDT-Q600, TA Instrument, USA) of the xerogels were executed at a heating rate of 5 °C min−1.To determine the composition and coordination state of the xerogels, X-ray photoelectron spectroscopy (XPS) studies were carried out on a Thermo Scientific K-Alpha + X-ray Photoelectron Spectrometer (XPS). Macropore size distribution of the obtained samples was evaluated by mercury intrusion porosimetry (AutoPore IV 9510, Micromeritics Ins. Ltd., USA).
3
X-ray Photoelectron Spectroscopy of Hydrogels
4
Analyzing Aged PA11 Powder Surface
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A K-alpha X-ray photoelectron spectrometer (XPS) from ThermoFisher Scientific was used to detect the elements present on the surface of the aged PA11 powder particles. The data was further processed using CasaXPS software. A Gaussian/Lorentzian peak shape was selected for the curve fitting of the carbon and oxygen peaks to quantify the changes in nitrogen and oxygen contents.
5
Catalyst Characterization by XRD and XPS
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The X-ray
diffraction patterns (XRD) of the catalysts were analyzed by a Rigaku
Smartlab SE type ray diffractometer equipped with Cu Kα radiation.
Data were collected with the settings of 40 kV and 30 mA at steps
of 0.02° s–1 in the 2θ range of 10°–80°.
A Thermo Scientific K-Alpha X-ray photoelectron spectrometer (XPS)
equipped with an Al Kα excitation source was used to analyze
the elemental composition of the solid surface. The spot size was
400 μm, the working voltage was 12 kV, and the filament current
was 6 mA.
diffraction patterns (XRD) of the catalysts were analyzed by a Rigaku
Smartlab SE type ray diffractometer equipped with Cu Kα radiation.
Data were collected with the settings of 40 kV and 30 mA at steps
of 0.02° s–1 in the 2θ range of 10°–80°.
A Thermo Scientific K-Alpha X-ray photoelectron spectrometer (XPS)
equipped with an Al Kα excitation source was used to analyze
the elemental composition of the solid surface. The spot size was
400 μm, the working voltage was 12 kV, and the filament current
was 6 mA.
6
Comprehensive Structural Characterization of Materials
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X‐ray diffraction (XRD) patterns (2θ, 10°–80°) were measured using a Bruker D8‐Advanced X‐ray diffractometer. Scanning electron microscopy (SEM) was performed using a ZEISS Gemini 300 instrument (200 kV operating voltage). Transmission electron microscopy (TEM) and elemental mapping images were obtained using an HRTEM JEOL 2100F microscope. Aberration‐corrected HAADF‐STEM was operated on a Thermo Fisher Themis Z transmission electron microscope equipped with two aberration correctors. X‐ray photoelectron spectra were obtained using a Thermo Scientific K‐Alpha X‐ray photoelectron spectrometer (XPS) incorporating monochromatic Al Kα (1486.6 eV) radiation at 72 W (12 kV, 6 mA). The binding energies were calibrated using the C 1s peak of adventitious carbon (284.8 eV) as the reference. The metal content was determined by inductively coupled plasma (ICP) mass spectroscopy using an Agilent 7800 ICP‐MS instrument.
7
Characterizing Sulfur Content in Aqp-SH Modified Membranes
8
Comprehensive Instrumentation for Advanced Materials Characterization
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A double-beam UV-Vis spectrophotometer (model: Edinburgh Instruments DS5) equipped with a Xenon flash lamp with a spectral range of 190–1100 nm. A spectrofluorometer (Edinburgh Instruments FS5) having a spectral range up to 1650 nm and fluorescence lifetimes down to 25 ps. A pH meter (model: Jenway-3040). A Daihan Scientific centrifuge device (model: CF-10). Fourier transform infrared (FTIR) (model: Shimadzu-FTIR-8400 S, Japan). The structures of the phases formed were examined using a high-resolution transmission electron microscope (HR-TEM) with an acceleration voltage up to 200 kV (JEM-2100-JEOL, Japan). The oxidation states and species in the prepared materials were determined by a Thermo Scientific™ K-Alpha™ X-ray photoelectron spectrometer (XPS) (Thermo Scientific, USA), using Al-Kα micro-focused monochromator within an energy range up to 4 keV. The X-ray diffraction (XRD) analysis of N/S-doped QDs was performed with a D8-AVANCE X-ray diffractometer (Bruker, Germany) with Cu-Kα radiation (λ = 0.154056 nm) for the identification of the crystalline phase, relative crystallinity, and crystal size of the as-prepared N/S-doped QDs. The XRD analysis was performed in the 2θ range from 3.0° to 80.0° with a 0.020° step at a scan speed of 0.4 s.
9
Characterization of Bionic SERS Substrate
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The morphology of the bionic SERS substrate was observed by scanning electron microscopy (SEM) (JEOL JSM-6701F, Tokyo, Japan). FT-IR spectroscopy (FT-IR, Perkin-Elmer Spectrum-One, Shelton, CT, USA) was used to differentiate the composition and chemical structure of the bionic SERS substrate. The chemical-binding energy of the bionic SERS substrate was carried out by a K-Alpha X-ray photoelectron spectrometer (XPS) (Thermo Fisher Scientific, Waltham, MA, USA). The hydrophilicity of the bionic SERS substrates was recorded by a contact angle goniometer (DSA 100, Krüss GmbH, Hamburg, Germany). Raman spectroscopy (HORIBA, LabRAM HR Evolution) was used to evaluate the SERS spectra of the bionic SERS substrate, with a 632.8 nm He-Ne laser, operated under a 10× objective lens with a detection range of 400–2000 cm−1.
10
Synthesis and Characterization of Cerium Nitrate Nanoparticles
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Cerium nitrate hexahydrate (Ce(NO3)3·6H2O) and carbendazim were obtained from Shanghai Aladdin Bio-Chem Technology Co., Ltd. (Shanghai, China). Sodium hydroxide, ethanol, and ethylene glycol (EG) were obtained from Beijing MREDA Technology Co., Ltd. Tris-HCl solution was obtained from Shanghai Sangon Biotech Co., Ltd. (Shanghai, China). MP, paraoxon, phosphoramidite, and monocrotophos were obtained from Alta Scientific Co., Ltd. (Tianjin, China). All other chemicals and reagents used were of analytical grade.
X-ray diffraction (XRD) patterns were obtained using an X’Pert Pro XRD device from XRD-6100 (SHIMADZU, Kyoto, Japan). High-resolution transmission electron microscopy (HRTEM) images were recorded on a Tecnai G2 F30 S-TWIN (FEI, Hillsboro, OR, USA). Raman spectroscopy was obtained with a laser Raman spectrometer (Horiba Jobin Yvon, Kyoto, Japan). To describe the surface electronic states and compositions, a Thermo Fisher Scientific K-Alpha+ X-ray photoelectron spectrometer (XPS) was used.
X-ray diffraction (XRD) patterns were obtained using an X’Pert Pro XRD device from XRD-6100 (SHIMADZU, Kyoto, Japan). High-resolution transmission electron microscopy (HRTEM) images were recorded on a Tecnai G2 F30 S-TWIN (FEI, Hillsboro, OR, USA). Raman spectroscopy was obtained with a laser Raman spectrometer (Horiba Jobin Yvon, Kyoto, Japan). To describe the surface electronic states and compositions, a Thermo Fisher Scientific K-Alpha+ X-ray photoelectron spectrometer (XPS) was used.
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