Xl30 environmental scanning electron microscope
The XL30 Environmental Scanning Electron Microscope is a versatile imaging instrument that utilizes an electron beam to examine the surface and internal structure of a wide range of materials. It provides high-resolution imaging capabilities under various environmental conditions, including the ability to observe samples in their natural state without the need for complex sample preparation.
Lab products found in correlation
3 protocols using xl30 environmental scanning electron microscope
Visualizing Microbial Morphology by SEM
Nanogap Electrode Fabrication via EBL and FIB
Scanning Electron Microscopy of Cotton Ovules
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