2010 tem microscope
The JEOL 2010 TEM is a transmission electron microscope (TEM) designed for high-resolution imaging and analysis of materials. It operates at an accelerating voltage of 200 kV and is capable of achieving a point resolution of 0.19 nm. The microscope is equipped with a LaB6 electron source and features a wide range of advanced imaging and analytical capabilities.
Lab products found in correlation
3 protocols using 2010 tem microscope
Negative Staining for TEM Peptide Imaging
Negative Staining of Peptide Samples
Peptide Nanostructure Characterization by TEM
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