The shape and surface topography of the nanoparticles were determined using a Carl Zeiss SEM EVO High Definition 15 Scanning Electron Microscope (Carl Zeiss, Germany) operating at 15 kV. The samples were mounted on a metal stub with double‐sided adhesive tape and gold‐coated under vacuum in an argon atmosphere prior to observation.
Sem evo high definition 15 scanning electron microscope
The SEM EVO High Definition 15 Scanning Electron Microscope is a high-performance instrument designed for advanced imaging and analysis. It provides high-resolution, high-magnification scanning electron microscopy capabilities. The core function of this product is to capture detailed images and collect data on the surface structure and composition of various materials and samples.
Lab products found in correlation
2 protocols using sem evo high definition 15 scanning electron microscope
Nanoparticle Characterization by DLS and SEM
The shape and surface topography of the nanoparticles were determined using a Carl Zeiss SEM EVO High Definition 15 Scanning Electron Microscope (Carl Zeiss, Germany) operating at 15 kV. The samples were mounted on a metal stub with double‐sided adhesive tape and gold‐coated under vacuum in an argon atmosphere prior to observation.
Characterization of Molecularly Imprinted Polymers
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