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Sem evo high definition 15 scanning electron microscope

Manufactured by Zeiss
Sourced in Germany

The SEM EVO High Definition 15 Scanning Electron Microscope is a high-performance instrument designed for advanced imaging and analysis. It provides high-resolution, high-magnification scanning electron microscopy capabilities. The core function of this product is to capture detailed images and collect data on the surface structure and composition of various materials and samples.

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2 protocols using sem evo high definition 15 scanning electron microscope

1

Nanoparticle Characterization by DLS and SEM

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Effective hydrodynamic diameters (dh) of the particles were determined by DLS with a NanoBrook Omni spectrometer (Brookhaven, United States) at 25 °C in water, and using Particle Solutions (v2.6) software.
The shape and surface topography of the nanoparticles were determined using a Carl Zeiss SEM EVO High Definition 15 Scanning Electron Microscope (Carl Zeiss, Germany) operating at 15 kV. The samples were mounted on a metal stub with double‐sided adhesive tape and gold‐coated under vacuum in an argon atmosphere prior to observation.
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2

Characterization of Molecularly Imprinted Polymers

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A CEM Discover 2.0 microwave synthesizer was used for the production of the imprinted polymers. While a Bruker Alpha FTIR spectrometer was used to obtain the infrared spectra scanning from between 4000–400 cm−1, with a resolution of 2 cm−1 and 32 scans. The size, shape and surface topography of the MIPS were determined using a Carl Zeiss SEM EVO High Definition 15 Scanning Electron Microscope operating at 10 kV. The samples were mounted on a metal stub with double-sided adhesive tape and gold-coated under vacuum in an argon atmosphere prior to observation. The batch MIP rebinding experiments were performed using UV/vis analysis on a Nanodrop One Spectrophotometer with wavelengths of 230 nm (estradiol), 248 nm (andarine), 275 nm (testosterone), and 300 nm (RAD-140).
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