A Hitachi SU6600 scanning electron microscope (SEM) with an accelerating voltage of 5 kV was used for recording SEM micrographs of BP. A dry sample was placed on a carbon grid support attached via double-sided conductive carbon tape to an aluminium holder. Electron Dispersive Spectrometry (EDS) was performed at an accelerating voltage of 15 kV for 300 seconds with a NANOTRACE detector and a NORAN System 7 Analyzer (Thermo Fisher Scientific).
Su6600 scanning
Manufactured by Hitachi
The SU6600 is a scanning electron microscope (SEM) manufactured by Hitachi. Its core function is to provide high-resolution imaging of samples by scanning the surface with a focused beam of electrons. The SU6600 can produce detailed images of the surface topography and composition of a wide range of materials at the micro- and nanoscale.
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Lab products found in correlation
2 protocols using su6600 scanning
1
SEM and EDS Analysis of BP
2
Microscopic Analysis of Nanomaterials
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A Hitachi SU6600 scanning electron microscope (SEM) equipped with a field emission gun (FEG) and transmission electron microscope JEOL JEM 2100 operating at 200 kV (TEM) were used for morphology investigation. High-resolution TEM images including STEM-HAADF (high-angle annular dark-field imaging) analyses for elemental mapping of the products were performed with an FEI Titan HRTEM (high-resolution TEM) microscope operating at 200 kV. For these analyses, a droplet of the dispersion of the material in DMF at a concentration of ∼0.1 mg mL -1 was deposited onto a carbon-coated copper grid and dried. AFM images were obtained using the NTegra Spectra instrument (NT-MDT, Russia) in the tapping mode using NSG30 probes. In total, 5 µL of the ethanolic dispersion (c = 1 mg L -1 ) of the analyzed nanomaterial was deposited on a SiO 2 wafer and left to dry for 30 minutes. The sample was measured immediately after that.
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