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51 protocols using d max 2200 pc

1

Comprehensive Characterization of Hardened Cement Paste

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The surface morphology of the samples was analyzed using a scanning electron microscope (SEM) model ZEISS Sigma 300, Carl Zeiss Microscopy GmbH, Oberkochen, Germany and their chemical compositions were investigated using energy-dispersive spectroscopy (EDS, ZEISS Sigma 300, Carl Zeiss Microscopy GmbH, Oberkochen, Germany). XRD analysis was used to characterize the specific composition of the sample product. The identification of phase compositions was conducted using an X-ray diffractometer (XRD, Rigaku-D/max 2200pc, Rigaku Corporation, Tokyo, Japan) with a Cu Ka (k = 1.54 Å) incident radiation. The 2θ scanning range was from 5° to 90° with a scanning speed of 2 °/min. The pore structure of the hardened cement paste was analyzed using mercury intrusion porosimetry (MIP, MicromeritiPC1 AutoPore V 9620, Micromeritics, Norcross, GA, USA). The analysis of functional groups was undertaken using Fourier transform infrared spectroscopy (FT−IR, Thermo Scientific Nicolet iS20, Thermo Fisher Scientific, Waltham, MA, USA).
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2

Comprehensive Characterization of Hardened Cement Paste

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The surface morphology of the samples was analyzed using a scanning electron microscope (SEM) model ZEISS Sigma 300, Carl Zeiss Microscopy GmbH, Oberkochen, Germany and their chemical compositions were investigated using energy-dispersive spectroscopy (EDS, ZEISS Sigma 300, Carl Zeiss Microscopy GmbH, Oberkochen, Germany). XRD analysis was used to characterize the specific composition of the sample product. The identification of phase compositions was conducted using an X-ray diffractometer (XRD, Rigaku-D/max 2200pc, Rigaku Corporation, Tokyo, Japan) with a Cu Ka (k = 1.54 Å) incident radiation. The 2θ scanning range was from 5° to 90° with a scanning speed of 2 °/min. The pore structure of the hardened cement paste was analyzed using mercury intrusion porosimetry (MIP, MicromeritiPC1 AutoPore V 9620, Micromeritics, Norcross, GA, USA). The analysis of functional groups was undertaken using Fourier transform infrared spectroscopy (FT−IR, Thermo Scientific Nicolet iS20, Thermo Fisher Scientific, Waltham, MA, USA).
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3

Characterization of CeO2 Nanoparticles

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CeO2NPs were purchased from Engi-Mat (Lexington, Kentucky, USA). The purity of the cerium oxide nanoparticles was greater than 99.9%. The crystallinity was determined by X-ray diffraction (XRD, Rigaku Corporation, RigakuD/Max-2200 PC, Japan). The surface chemical composition and valence state of CeO2NPs were determined by X-ray photoelectron spectroscopy (XPS, Thermo Scientific, ESCALAB 250, USA). The crystal structure and size were observed by transmission electron microscopy (TEM, Thermo Scientific, FEI Talos L120C, USA). The crystal size observed by XRD was calculated according to the Scherrer equation.36 (link)
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4

Comprehensive Materials Characterization Protocol

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The powder X-ray diffraction (XRD) was recorded on a Rigaku D/Max 2200PC X-ray diffractometer with Cu Kα radiation (λ = 0.15418 nm). X-ray photoelectron spectroscopy (XPS) was performed on Thermal ESCALAB 250 electron spectrometers. The elemental content of the samples was determined through the ICP-MS (X7 Series, Thermo Electron Corporation). Fourier transform infrared (FT-IR) spectra is obtained on a Nicolet 6700 spectrophotometer (Thermofisher). Electron paramagnetic resonance (EPR) spectrometer (A300-10/12, Bruker) was used to observe the generated reactive oxygen species. Total organic carbon (TOC) was measured via an Analytikjena multi N/C analyzer. The Brunauer–Emmett–Teller (BET) specific surface areas and pore-size distributions of the samples were analyzed using a Micromeritics ASAP 2460 system at liquid nitrogen temperature. The in situ Raman was collected using a confocal Raman microscope (ThermoScientificDXR2) with an excitation wavelength of 632 nm and 5.0 mW Laser power. Each Raman spectrum was acquired over an exposure time of 0.05 s and is the number of scans is 50. Electrochemical characterizations were performed with a CHI760E bipotentiostat with a standard three-electrode configuration.
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5

Morphological and Compositional Analysis of Nanofibers

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The morphology of the nanofibers was observed using a field emission scanning electron microscope (FESEM, ZEISS Crossbeam 340, Jena, Germany). Phase identification of the crystalline material was made using an X-ray diffractometer (XRD, Rigaku D/Max 2200 PC, Tokyo, Japan) with CuKα radiation (λ = 1.540 Å, 40 kV and 30 mA). Nitrogen adsorption/desorption measurement was performed to examine the surface area of the nanofiber samples with an automatic gas adsorption instrument (BEL, Belsorp-max, Osaka, Japan). A UV-Vis-NIR Spectrophotometer (UV-3101PC Shimadzu, Kyoto, Japan) was used in this study to measure the optical absorption behaviors of the photocatalyst.
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6

Characterization and Evaluation of GON-Reinforced Cement Composites

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The chemical groups in the GONs were measured by Fourier-transform infrared spectroscopy (FTIR; EQUINOX-55, Bruker, Ettlingen, Germany) and X-ray photoelectron spectroscopy (XPS; XSAM 800, Kratos, Manchester, UK). The microstructure and the size distribution of GONs were examined by atomic force microscopy (AFM; SPI3800N/SPA400, Seiko, Osaka, Japan) and a laser particle analyzer (NANO-ZS90, Zetasizer, Worcestershire, UK). X-ray diffraction (XRD; D/max2200PC, Rigaku, Osaka, Japan) was used to examine the crystalline. The microstructures of GON/cement composites were determined with a scanning electron microscope (SEM; S-4800, Hitachi, Tokyo, Japan). The elemental compositions were determined with an energy-dispersive X-ray spectrometer (EDS) (EDAX, Cassatt, SC, USA), which was coupled with the S-4800 SEM.
The compressive strength was tested with a concrete compressive strength tester (JES-300, Wuxi, China) at a pressure increase rate of 1 MPa/s. The flexural strength of the GON/cement composites was determined using a concrete three-point flexural strength tester (DKZ-500, Wuxi, China) at a pressure increase rate of 0.25 MPa/s. The water penetration, the freeze thawing, and the carbonation experiment were carried out by GB/T5082-2009 (National Standard of China).
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7

Nanoparticle Characterization Techniques

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Transmission electron microscope (JEOL, JEM-2100F, Tokyo, Japan) equipped with an energy dispersive X-ray (EDS) were employed to analyze the nanostructure, morphology, and composition of the as-prepared nanoparticles. Powder X-ray diffraction (XRD) (Bruker, MA, USA) was conducted using a Rigaku D/MAX-2200PC X-ray diffractometer with Cu-Kα radiation (λ = 0.154 nm) at a scan rate of 6°/min. The chemical states of the as-prepared nanoparticles were investigated by X-ray photoelectron spectroscopy (XPS, ULVAC PHI, PHI 5000 VersaProbe, Osaka, Japan). The dissolution amount of nanoparticles was measured via inductively coupled plasma (ICP) (LEEMAN, Direct Reading Echelle ICP, OH, USA) spectrometer.
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8

Advanced Characterization of Flexible Films

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The morphologies of samples were examined using scanning electron microscopy (SEM) with a Hitachi S-4800 instrument, transmission electron microscopy (TEM) with a JEM-3100F model, and scanning transmission electron microscopy (STEM, JEOL JEM-F200 HR). In particular, AC-STEM-HAADF (high-angle annular dark-field) imaging was performed on a Titan 80-300 scanning/transmission electron microscope equipped with a spherical aberration corrector, operating at 300 kV. The structural properties were analyzed using X-ray diffraction (XRD) with a Rigaku D/max-2200 pc instrument, Raman scattering spectroscopy with an HR800 system, Fourier-transform infrared (FTIR) spectroscopy with a NICOLET iS10 instrument, and X-ray photoelectron spectroscopy (XPS) with an ESCALAB 250 analyzer. Additionally, the specific surface area and porosity information were determined using a Brunauer–Emmett–Teller (BET) analyzer, specifically the ASAP 2460 model by Mac, America. The mobility, resistivity, and electronic conductivity of the flexible films were measured using an Ecopia Hall Effect Tester (HMS-7000) at a temperature of 300 K to provide insights into the charge transport properties and electronic conductivity of the flexible films.
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9

Characterization of P(VDF-TrFE) Nanofibers

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The morphologies of the P(VDF-TrFE) nanofibers were examined by scanning electron microscopy (SEM, JSM-5800, JEOL, Akishima, Japan) at an accelerator voltage of 15 kV. Fast Fourier transforms (FFT) was performed on SEM images using the ImageJ software (National Institutes of Health, Bethesda, MD, USA) to determine the degrees of the nanofibers alignment. In order to analyze the compositions and crystallinities of the P(VDF-TrFE) nanofibers, Fourier transform infrared spectroscopy (FTIR, Nicolet iN10 MX, Thermo Fisher Scientific Inc., Waltham, MA, USA) in absorbance mode, and X-ray diffraction (XRD, D/MAX2200PC, Rigaku Corporation, Tokyo, Japan) over the 15–25° 2θ range were employed. A P(VDF-TrFE) spin-coated film was fabricated to study its diversity compared with the electrospun nanofibers. In addition, the P(VDF-TrFE) nanofibers were annealed at 130 and 140 °C for 2 h to investigate the variations in β-phase crystallinity.
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10

Characterization of Graphene Oxide Composites

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The dimensions and surface shape of GVC were observed using an optical microscope (Carl Zeiss Axio Scope A1) with a digital camera. X-ray diffractometry (XRD) measurements were performed using a Rigaku D/MAX-2200PC X-ray diffractometer (Cu Kα radiation, wavelength: 0.154 nm) operated at 40 kV and 100 mA. Data were collected within the range of scattering angles (2θ) of 10–60°. The morphology of the GVC and composites were examined using SEM (HITACHI S-3000N, Hitachi Ltd., Tokyo, Japan).
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