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Nanosims 50l

Manufactured by Cameca
Sourced in France

The NanoSIMS 50L is a high-resolution secondary ion mass spectrometer designed for nanoscale elemental and isotopic analysis. It provides high spatial resolution and high sensitivity detection of a wide range of elements and isotopes. The core function of the NanoSIMS 50L is to enable precise and quantitative analysis of the chemical composition of materials at the nanometer scale.

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37 protocols using nanosims 50l

1

Multimodal Nanoanalysis of Magnetite Samples

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Both SIMS and nano-SIMS analysis was conducted at the NSF Multiuser Facility of Arizona State University.
SIMS (SI Appendix, Fig. S7): The sample surfaces used to extract the tips for APT analysis, from samples of BM, IM, IM-SDS, BMNPs, and L-MNPs, were analyzed with SIMS after plasma cleaning of the surface. Analyses were done using a CAMECA SIMS 6f instrument (MRP 3,300; lp = 5 nA; 75 μm image field; fourth field aperture). Initially, exploratory measurements were made with a 30 μm spot size and final data were collected using a 4 μm spot size (SI Appendix, Fig. S7). Counts were collected for 12C, 16O, 12C14N, 31P, 32S, and 56Fe, and ratios are reported for 12C/56Fe and 12C/12C14N using the average of 3 analyses per sample (SI Appendix, Table S3).
Nano-SIMS (SI Appendix, Fig. S8): For the magnetosome magnetite sample, a region adjacent to where APT and SIMS analyses were conducted, a high-resolution map (25*25 μm, 256*256 pixels, 5 ms/pixel dwell time, and 30 planes), after adding 20 sift-corrected images, was carried out using a CAMECA NanoSIMS 50 L and a 25 nm Cs+ beam (SI Appendix, Table S3).
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2

NanoSIMS Imaging of Yeast Cells

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The yeast images in Figs 2 and 5 were collected using mass spectrometry imaging of Baker’s Yeast (Red Star Yeast), drop cast (DI water) onto a silicon wafer and dried, performed with high-lateral resolution secondary ion mass spectrometer (NanoSIMS, Cameca NanoSIMS 50L, Gennevilliers Cedex, France), which is housed in the Environmental Molecular Science Laboratory. Sample preparation and analysis was performed similarly to Renslow et al. [34 (link)]. Briefly, prior to analysis the sample was coated with 10 nm of Au to minimize charging during analysis [3 (link)]. High current sputtering was performed with the Cs+ primary ion beam prior to collecting data, where samples were dosed with ~2 x 1016 ions/cm2 to achieve sputtering equilibrium [3 (link)]. A ~1.5 pA Cs+ primary ion beam was used for all analysis, and the 12C12C-, 12C13C-, 12C14N-, and 12C15N-, and 31P- secondary ions were detected simultaneously. The data visualized in this manuscript is the 12C14N- ion count data. The imaging area was 40 μm x 40 μm, acquired at 256 pixels x 256 pixels, with 2 ms/pixel over nine planes.
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3

Spatially Resolved Chemical Imaging with MIMS and SEM

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The MIMS technique is capable of measuring spatially localized concentrations of isotopes in the sample and hence, providing accurate chemical maps (Lechene et al., 2006 (link); Steinhauser et al., 2012 (link); Zhang et al., 2012 (link)). However, the XY spatial resolution in the MIMS is limited to about ~50 nm (Herrmann et al., 2007 ), in comparison the achievable resolution in the SEM is typically about a nm or less (Goldstein et al., 2003 ). To obtain 2D or 3D chemical information from our samples, single or serial sections of 50–250nm were cut and arranged on a Si wafer. Large field of view SEM micrographs of 80–250nm-thick sections of brain, liver and pancreas were acquired using a GeminiSEM (Zeiss, Germany) guided by automated tile acquisition using AtlasAT software (Fibics, Ottawa, Canada) and a pixel size of 4nm. Endogenous islets were imaged with XRM to acquire their 3D coordinates prior to guide islet sectioning using an ultra-microtome and prepared for SEM-AtlasAT mapping. MIMS image acquisition of mapped areas of interest and organelles was done as previously described (Steinhauser et al., 2012 (link); Zhang et al., 2012 (link)). Briefly, brain, liver and pancreas tissue sections containing different mapped cells and organelles of interest were imaged with a NanoSIMS 50L (Cameca, France) using a cesium (Cs) beam and 15N and 14N levels were detected simultaneously.
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4

NanoSIMS Isotopic Ratio Imaging

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Analyses were performed using the NanoSIMS 50L (Cameca). Instrumental conditions for each analysis are described in the results section and figure legends. Ratio images are displayed using a hue saturation intensity transformation with the lower bound of the scale set at natural abundance. For ease of viewing, all ratio scales are multiplied by a factor of 104.
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5

NanoSIMS Imaging of Muscle Samples

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For NanoSIMS (Nanoscale Secondary Ion Mass Spectrometry) imaging, 500 nm sections of resin embedded muscle samples from individuals F1 II: 5, and II: 7 and F2 II:2 were mounted on platinum coated coverslips, and then transferred into a FEI Verios scanning electron microscope (SEM) for backscattered electron (BSE) imaging50 (link). A 1–2 kV electron beam with current of ~ 100pA was used for BSE imaging. Sections were then coated with 5 nm platinum by a SC 7640 Polaron sputter coater, and transferred into the NanoSIMS 50L (CAMECA, France) for chemical analysis. The same areas imaged by SEM were analyzed by the NanoSIMS for chemical distribution. A 16 keV Cs+ primary beam is used to detect 31P, 32S, and 56Fe16O.
For comparative purposes, in addition to myoglobinopathy samples, we performed NanoSIMS analysis in one sample from a patient with Pompe disease containing electron-dense inclusions, two samples showing abundant lipofuscin and two muscle samples from patients affected with distal myopathies with rimmed vacuoles.
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6

NanoSIMS Imaging of Thin Sections

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NanoSIMS imaging was performed with
a NanoSIMS 50L (CAMECA, France) at the Chemical Imaging Infrastructure
at Chalmers University of Technology and University of Gothenburg
on the same thin sections (300 nm) from which TEM images were acquired.
These sections were then coated with a thin layer of Au (conductive
material) to reduce sample charging during the analysis. Prior to
each measurement, a saturation fluence of 1017 Cs+·cm–2 was implanted at the area of interest.
A 16 keV Cs+ primary ions beam of ∼2 pA (D1_2) with
the probe size of 150 nm was used to scan across the sample surface,
providing secondary ion images of the 12C14N, 12C2, 13C12C, and 127I ions. Images contained 8–10 cycles of 256 ×
256 pixels, with a raster size of ∼20 μm × 20 μm,
and a dwell time of 5 ms/pixel. Mass resolving power of 10 000
was obtained, which is sufficient to resolve potential mass interferences.
ROIs were defined by manual thresholding based on vesicles features
in the images.
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7

NanoSIMS Analysis of Nitrogen Isotopes

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Analyses were performed using the NanoSIMS prototype or the NanoSIMS 50L (Cameca). Both instruments use a Cs+ ion source. Samples were polarized at -8 kV and the Cs+ ions hit the sample with a total energy of 16 kV. Analyses were performed on square fields and the dimensions reported in the figure legends. Ratio images are displayed using a hue saturation intensity transformation with the lower bound of the scale set at natural abundance (N15/N14=0.0037). For ease of viewing, all nitrogen ratio scales are multiplied by a factor of 104, such that 0.0037 is reported as 37.
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8

Isotope Enrichment Analysis via NanoSIMS

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A previously described protocol for data acquisition was followed (25 (link)). Briefly, isotope enrichment data were collected on a Cameca NanoSIMS 50L housed in the Center for Microanalysis at the California Institute of Technology. Six masses were collected corresponding to the 1H, 2H, 12C, 13C, 14N12C, and 15N12C ions, for the determination of 2H/1H, 13C/12C, and 15N/14N ratios, respectively, using a tuning similar to that described by Kopf et al. (52 (link)).
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9

Boron Doping Characterization of Silicon Nanowires

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The SIMS used here was Cameca NanoSIMS 50 L. For sample preparation, SiNWs were scratched off from their original substrates using a razor blade and then dissolved in IPA. The SiNWs in IPA solution were drop cast on P-type silicon wafers for SIMS measurements. In SIMS analysis, a primary ion beam (Cs+) was used to pre-sputter and etch the SiNWs and for image analysis, the sputtered secondary silicon and boron ions from the sample were collected and counted. The operating current was 10 pA, the image frames were taken with 2 μm raster size, 64 × 64 pixels, and 1000 μs dwell time/pixel. From the image analysis, we selected the relevant area where the SiNWs were located using ImageJ, and calculated the average boron concentration within the nanowire depth based on the relative scaling factor (RSF) table for the boron ions in silicon matrix (https://pprco.tripod.com/SIMS/Theory.htm). Then the boron concentration cB was calculated following the equation as cB=RSFIBISi , where ISi is silicon counts and IB is the boron counts, both obtained from the SIMS measurements. Note that for each type of nanowire samples, we selected and mixed nanowires from different locations of the wafer and measured more than three bundled nanowires with SIMS, and the results are consistent.
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10

Nanoscale Analysis of Microbial Nutrient Uptake

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During the cruise to the Namibian OMZ, 250-ml water samples were amended with either 13C-labeled DOM (13C-DOM) or 5 μM 15NO2 and 200 μM 13C-HCO13, alongside incubations for rate measurements. After ~29 hours of incubation, samples were fixed with 1% PFA (final concentration) for 8 to 12 hours at 4°C. Subsequently, 11 ml of the sample was filtered onto gold-palladium precoated polycarbonate filters (GTTP, 0.2 μm pore size, 25 mm diameter; Millipore) and stored at −80°C until further analyses in a shore-based laboratory.
Nitrococcus cells were hybridized on a filter with Nitrococcus-specific CARD-FISH probes as described previously (11 (link)) and analyzed with a NanoSIMS 50L (Cameca). To obtain a stable ion emission rate and to clean the sample from any contamination, we presputtered the area of interest with a Cs+ primary ion beam of 100 pA. The cells were analyzed by rastering a primary Cs+ ion beam with a beam current of 0.8 to 1 pA and a beam diameter of <100 nm. Secondary ion images of 12C, 13C, 19F, 12C14N, and 32S were recorded in parallel. The analyzed areas ranged from 10 × 10 μm to 20 × 20 μm with an image size of 256 × 256 pixels and a dwell time of 1 ms per pixel. Tuning of the instrument for high mass resolution (~7000 mass resolving power) reduced the interference for 13C. Data analyses were performed with the freeware Look@NanoSIMS (59 (link)).
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