Atomic force microscopy (AFM) images were obtained using tapping mode by a Dimension Icon atomic force microscopy (Bruker, Billerica, MA, USA). Fourier transform infrared (FTIR) spectra were recorded on a Nexus spectrophotometer (Nicolet, Madison, WI, USA) at 4 cm−1 resolution with 32 scans. Zeta potential analyses were performed using a Zetasizer Nano ZS instrument (Malvern, UK). Thermogravimetric analysis (TGA) was conducted on TGA/SDTA851e system (Mettler Toledo, Switzerland) at a heating rate of 5 °C per minute under a nitrogen atmosphere.
Dimension icon atomic force microscopy
Manufactured by Bruker
Sourced in United States
The Dimension Icon atomic force microscopy (AFM) is a lab equipment product manufactured by Bruker. It is designed to provide high-resolution, three-dimensional imaging and measurement of surface topography at the nanoscale level.
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3 protocols using dimension icon atomic force microscopy
1
Multimodal Characterization of Nanomaterials
2
Multimodal Characterization of Nanomaterials
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The FEI Tecnai G2 F30 S-TWIN transmission electron microscope (TEM) (FEI, OR, USA) was used for transmission electron microscopy. The atomic force microscopy (AFM) was obtained using the Bruker Dimension Icon Atomic force microscopy (Bruker Corporation, MA, USA). Raman scattering was performed using the Renishaw inVia microscope (Renishaw, England, UK). Then, the infrared spectra were obtained using the Fourier transform infrared spectroscopy (FT-IR) technique on the NICOLET IS10 FT-IR spectrometer (Thermo Fisher Scientific, MA, USA). The ultraviolet–visible (UV–vis) absorption spectra were measured using the MAPADA UV6300 UV–visible spectrophotometer (Mapada, Shanghai, China). The X-ray photoelectron spectroscopy (XPS) pattern of the samples was measured by a Thermo ESCALAB 250XI scanning XPS microscope (Thermo Fisher Scientific, MA, USA).
3
Nanoscale Topography Analysis of Nanocoils
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A Bruker Dimension Icon Atomic Force Microscopy (AFM) system operating in tapping mode with TESPA-V2 tips was used to scan the nanocoils. A 50 µm wide field of view (FOV) was surveyed at a scan rate of 0.1 Hz to reduce tip and sample wear and improve image quality. The scans were imported into Bruker Nanoscope Analysis 2.0, sectioned, and exported as XZ plane height maps for further processing using Python. Turn width and spacing were determined using a partition threshold of 40 nm above the previous gap minimum. Mean turn width and spacing for all 14 turns and 13 gaps were plotted for comparison.
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