Dimension icon atomic force microscopy
The Dimension Icon atomic force microscopy (AFM) is a lab equipment product manufactured by Bruker. It is designed to provide high-resolution, three-dimensional imaging and measurement of surface topography at the nanoscale level.
3 protocols using dimension icon atomic force microscopy
Multimodal Characterization of Nanomaterials
Multimodal Characterization of Nanomaterials
Nanoscale Topography Analysis of Nanocoils
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