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Jsm 5900lv field emission scanning electron microscope

Manufactured by JEOL
Sourced in Japan

The JSM 5900LV Field Emission Scanning Electron Microscope is a versatile laboratory instrument designed for high-resolution imaging and analysis of samples. It utilizes a field emission electron source to generate a focused electron beam that scans the surface of the sample, producing detailed images and data.

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4 protocols using jsm 5900lv field emission scanning electron microscope

1

Evaluating Drug Distribution in Soft Formulations

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Surfaces and cross sections of the freshly prepared patches were scanned using the JSM 5900LV Field Emission Scanning Electron Microscope (Jeol Ltd, Japan) equipped with a tungsten hairpin electron gun and operating at an acceleration voltage of 5–20 kV. As the samples were relatively soft, dipping the samples into liquid nitrogen and crushing the frozen samples in order to obtain the natural morphology of the cross-sections of formulations with various drug loadings. Both kinds of sample were fixed on sample stubs using double adhesive tape. A Polaran SC7640 sputter gold coater (Quorum Technologies, Newhaven, UK) was used to coat the surfaces and cross-sections prior to imaging. EDS (INCA Energy manufactured by Oxford Instruments) connected to the SEM was used to map the distribution of drug clusters using Cl in felodipine as the marker. Samples were tested using both SEM and mapping mode EDS (data can be found in Supplementary Information).
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2

Surface Microstructure Analysis of Formulation Extrudates

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Zeiss EVO HD15 Scanning Electron Microscope built with Lanthanum Hexaboride LaB6 emitter (Zeiss Microscopy GmbH) and JSM 5900LV Field Emission Scanning Electron Microscope (Jeol Ltd., Japan) equipped with a tungsten hairpin electron gun were used to study the surface microstructure of the formulation extrudates. The samples were coated with gold using a Polaran SC7640 sputter gold coater (Quorum Technologies, city, country) prior to imaging.
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3

Microstructural Analysis of Aged Samples

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For the purpose of comparison, fresh and aged samples at different conditions were scanned using JSM 5900LV Field Emission Scanning Electron Microscope (Jeol Ltd, Japan) equipped with a tungsten hairpin electron gun. Surfaces and cross sections (prepared by cutting the samples after dipping into liquid nitrogen) of all samples were investigated for the presence or absence of crystal growth and changes in the microstructure of the matrices. The scanned samples were coated with gold using a Polaron SC7640 sputter gold coater (Quorum Technologies, Newhaven, UK) prior to imaging.
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4

Microstructure Analysis of Placebo and Felodipine Filaments

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A JSM 5900LV Field Emission Scanning Electron Microscope (Jeol Ltd, Japan) equipped with a tungsten hairpin electron gun was used to study the microstructure of different placebo and felodipine loaded filaments and discs. Cross sections of all samples were prepared by cutting the samples after dipping them into liquid nitrogen. All samples were attached to SEM stubs using double adhesive tape and then coated with gold using a Polaran SC7640 sputter gold coater (Quorum Technologies, city, country) prior to imaging.
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