X maxn sdd 50 mm2 edxs detector

Infrared (IR)
spectra were recorded on a Perkin Elmer Spectrum 2 FT-IR instrument
(optical resolution of 0.5 cm^–1) in attenuated total
reflectance (ATR) measurement mode (analyses in the 400–4000
cm^–1 range, performed by averaging four acquisitions
per sample).
pXRD analyses were performed on an X’Pert
MPD diffractometer using Cu Kα₁ radiation (λ
= 1.5406 Å) with the operating voltage and current maintained
at 40 kV and 25 mA, respectively. Diffractograms were recorded between
5 and 60° in 2θ, with a step size of 0.017° (with
a count time per step of ∼50 s).
SEM analyses were carried
out on a Zeiss Evo HD15 scanning electron
microscope equipped with an Oxford Instruments X-MaxN SDD 50 mm² EDXS detector. Before the SEM analyses, samples were deposited
on a double-sided conducting carbon tape and then metallized with
carbon.

pXRD analyses were performed on an X'Pert MPD diffractometer using CuK_α1 radiation (λ = 1.5406 Å) with the operating voltage and current maintained at 40 kV and 25 mA, respectively. X-ray diffractograms were recorded between 5° and 60° in 2θ, with a step size of 0.017° (with count time per step of ∼50 s).
SEM analyses were carried out on a Zeiss Evo HD15 scanning electron microscope equipped with an Oxford Instruments X-MaxN SDD 50 mm² EDXS detector. Before the SEM analyses, samples were deposited on double-sided conducting carbon tape and then metallised with carbon.