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Jsm 7600f fe sem

Manufactured by JEOL
Sourced in Japan

The JSM-7600F is a field emission scanning electron microscope (FE-SEM) manufactured by JEOL. It is designed to provide high-resolution imaging and analysis capabilities for a wide range of materials and applications. The JSM-7600F utilizes a field emission gun to generate a high-brightness electron beam, enabling high-resolution imaging and analysis at low accelerating voltages.

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5 protocols using jsm 7600f fe sem

1

Characterization of PVA-ZnS Nanocomposites

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Transmission FTIR
measurements of PVA and PVA–ZnS nanocomposites were carried
out between 400 and 4000 cm–1 using Shimadzu FTIR
prestige 21 spectrometers through the KBr pellet method. The UV–vis
spectra and the absorbance of dye in solution were obtained on Shimadzu
UV-1800 spectrometer with the range of 200–800 nm. The crystalline
structure of the sample was determined from X-ray diffraction (XRD)
pattern using Cu Kα radiation (model-3040 X'pert PRO, Philips). The
luminescence characteristics were investigated by PL spectroscopy
at room temperature using on Shimadzu RF-3501pc spectrofluorometer.
The morphological investigation and elemental composition of the films
were attained through scanning electron microscopy images recorded
on a JEOL JSM 7600F FESEM equipped with an EDX. The sample preparation
was performed through platinum coating before the measurement. The
thermal properties were evaluated by TGA and DSC. TGA curves were
obtained by measuring 4.0 mg of a sample using a Shimadzu TGA-50 thermogravimetric
analyzer maintaining the heating temperature range between 30 and
850 °C at a rate of 20 °C min–1 under
N2 atmosphere. DSC measurements were carried out on a Shimadzu
TA-60A instrument, following heating and cooling rate at 10 °C
min–1 in the temperature range of 30–250
°C under nitrogen flow (20 mL/min).
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2

Scanning Electron Microscopy with EDX

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Scanning electron microscopy (SEM) images were captured on a JEOL JSM-7600F FE-SEM (Tokyo, Japan) and energy-dispersive x-ray analysis (EDX) were done with an Oxford Instruments X-max80 EDS.
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3

Imaging Hydrated Membrane Microstructure

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Scanning electron microscopy (SEM) images were captured on a JEOL JSM-7600F FE-SEM (Tokyo, Japan). Sample preparation was carried out by subjecting the prepared MMM to sub-zero temperatures by immersion in liquid nitrogen, subsequently freezing and dewatering the membranes. A 5mm × 5mm membrane sample was cut and fixed onto the sample stage using double-sided copper tape. Prior to SEM imaging, the samples were then platinum-coated for 100 s to make it conductive.
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4

SEM Imaging of Bacterial Morphology

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Scanning electron microscopy (SEM) was performed as a report of Reichhardt et al. with minor modifications [41 ]. S. aureus or P. aeruginosa was cultured at 37℃ for 16 h, then the bacterial cells were collected by centrifugation at 13,000 xg for 10 min. The final concentration of bacteria in PBS was fixed at OD600nm of one in PBS, then exposed to the extract BLIS (final concentration: 0.006 mg/mL) and incubated at 37 °C for 24 h. Treatment with 1% SDS and PBS were considered positive and negative controls, respectively. After treatment, cells were harvested by centrifugation at 13,000 xg for 10 min and washed twice with 1x PBS. The samples were fixed overnight in 2.5% (v/v) glutaraldehyde at 4 °C and washed twice with 1x PBS. Cell pellets were dehydrated in a series of graded ethanol (10%, 30%, 50%, 70%, and 90%) for 10 min each and resuspended in 50 µL of 100% ethanol. Then, 20 µL of the mixture was transferred to a sterile 8 mm coverslip in a 24-well plate and allowed to dry for 5–7 min. Finally, 500 µL of 100% ethanol was soaked in each well. After ion spray gold coating, bacteria morphology was observed by ultra-high resolution thermal field emission SEM (JSM-7600 F FESEM (JEOL, Ltd., Tokyo, Japan).
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5

Surface Topography of Pseudoviral Particles

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Field Emission Scanning Electron Microscope (FESEM) was used to measure the surface topography of LV(CoV2-S) and LV(VSV-G). Pseudoviral particles were spread and dehydrated on glass slide overnight, followed by coating with gold nanoparticle for providing conductivity to the samples and images were acquired using JEOL JSM-7600F FESEM.
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