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Ru200 diffractometer

Manufactured by Rigaku
Sourced in Japan

The RU200 is a compact X-ray diffractometer designed for phase identification and quantitative analysis of polycrystalline materials. It utilizes a rotating anode X-ray source to generate high-intensity X-rays for efficient data collection. The RU200 is capable of performing a range of diffraction experiments, including powder diffraction, thin-film analysis, and in-situ studies.

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4 protocols using ru200 diffractometer

1

Structural and Thermal Characterization of Materials

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Raman spectra were recorded using a confocal Raman spectrometer (Alpha300S, WITec, Ulm, Germany) with a 633-nm wavelength incident laser light. The crystallographic structures of the materials were determined by a wide-angle X-ray diffraction (WAXRD) system (Rigaku RU-200 diffractometer, Shibuya-ku, Japan) equipped with a Ni-filtered Cu Kα source (40 kV, 100 mA, λ = 0.15418 nm). Bragg's equation ( = 2dsinθ) was used to calculate the d spacing between the layers. X-ray photoelectron spectroscopy (XPS) was performed to determine the oxidation status of carbon using a Thermo Fisher X-ray photoelectron spectrophotometer (Waltham, MA, USA) employing an Al Kα X-ray source (1,486.6 eV). Thermogravimetric analysis (TGA) was performed to analyze the thermal behavior of the samples using a TGA analyzer (Q50, TA Instruments, New Castle, DE, USA) with a 10°C min−1 heating rate in a nitrogen atmosphere. Number of average molecular weight ( M¯n ), weight average molecular weight ( M¯w ), and molecular weight distribution (MWD) were determined using a Waters GPC instrument (Milford, MA, USA) equipped with a 2414 differential refractive index detector and two (HR 2 and HR 4) Waters μ-Styragel columns. Spectral grade THF was used as an eluent at a flow rate of 1.0 ml min−1, and the molecular weight calibrations were carried out using polystyrene standards.
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2

Characterization of Polycrystalline Samples

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All reagents and starting solvents achieved from commercial channels were of analytical grade. The C, H, and N microanalyses were implemented on a PerkinElmer 2400 CHN analyzer. Fourier transforms infrared (FT-IR) spectra were recorded in the range of 400–4000 cm−1 using KBr pellets on an EQUINOX55 FT/IR spectrophotometer. The phase purity of the bulk or polycrystalline samples were confirmed by powder X-ray diffraction (PXRD) measurements executed on a Rigaku RU200 diffractometer at 60 kV, 300 mA, and Cu Kα radiation (λ = 1.5406 Å), with a scan speed of 5° min−1 and a step size of 0.02° in 2θ. Magnetic measurements were accomplished using a Quantum Design MPMS-XL7 superconducting quantum interference device (SQUID) magnetometer on polycrystalline samples (restrained in eicosane to prevent torquing at high fields). The measured magnetic data were corrected for the diamagnetism of the constituent atoms using Pascal's tables.
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3

Physicochemical Characterization of Bulk Samples

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All chemicals and solvents were of reagent grade, obtained from commercial sources without further purification. Fourier transform infrared (FT-IR) spectra were recorded in the range 400–4000 cm−1 using KBr pellets on an EQUINOX55 FT/IR spectrophotometer. Elemental analysis (C, H, N) was performed with a PerkinElmer 2400 CHN elemental analyzer. The phase purity of the bulk or polycrystalline samples was confirmed by powder X-ray diffraction (PXRD) measurements executed on a Rigaku RU200 diffractometer at 60 kV, 300 mA, and Cu Kα radiation (λ = 1.5406 Å), with a scan speed of 5° min−1 and a step size of 0.02° in 2θ. Thermal gravimetric analyses (TGA) were performed by using a NETZSCH STA 449F3 instrument at a heating rate of 10 °C min−1 from 30 to 800 °C and under a N2 stream using an empty Al2O3 crucible as the standard. The fluorescence spectra were obtained using a Hitachi F-7000 fluorescence spectrophotometer at room temperature. UV-Vis spectroscopic studies were collected on shimadzu WFH-203B spectrophotometer.
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4

Comprehensive Characterization of Novel Materials

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All the materials and reagents were obtained commercially without further purification. The FT-IR spectra were recorded in the range of 400–4000 cm−1 using KBr pellets on an EQUINOX55 FT/IR spectrophotometer. Elemental analysis (C, H, N) was implemented on a Perkin-Elmer 2400 CHN elemental analyzer. The phase purity of the bulk or polycrystalline samples were confirmed by powder X-ray diffraction (PXRD) measurements executed on a Rigaku RU200 diffractometer at 60 kV, 300 mA, and Cu Kα radiation (λ = 1.5406 Å), with a scan speed of 5° min−1 and a step size of 0.02° in 2θ. Diffuse reflectance spectra were obtained by a U-41000 spectrophotometer applying BaSO4 powder as a 100% reflectance reference. Magnetic measurements were performed in the temperature range of 1.8–300 K with an applied field of 1000 Oe, using a Quantum Design MPMS-XL-7 SQUID magnetometer on polycrystalline samples. The diamagnetic corrections for the compounds were estimated using Pascal's constants. Alternating current (ac) susceptibility experiments were performed using an oscillating ac field of 2.0 Oe at ac frequencies ranging from 1 to 1000 Hz. The magnetization was measured in the field range 0–7 T.
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