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Jsm 5510lv

Manufactured by JEOL
Sourced in Japan, United States

The JSM-5510LV is a low-vacuum scanning electron microscope (SEM) designed for a wide range of imaging applications. It provides high-quality, high-resolution images of samples in a low-vacuum environment, allowing for the observation of non-conductive and hydrated specimens without the need for extensive sample preparation.

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23 protocols using jsm 5510lv

1

Morphological Features of Aphid Hind Legs

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To examine the detailed morphological features of hind legs in third, fourth, and fifth (adult) instars of female aphids, the surface structures were observed by SEM. Specimens for SEM observations were prepared as previously described [31 (link)]. Briefly, aphid samples were fixed using a microwave oven, transferred into increasing concentrations of ethanol, and then transferred into hexamethyldisilazane. Subsequently, samples were transferred into t-butanol and freeze-dried using a freeze dryer (ES-2030; Hitachi, Tokyo, Japan), and legs were dissected from the bodies. Then, the legs were coated with gold ion using an ion sputter (E-1010; Hitachi, Tokyo, Japan). Detailed morphological characteristics of legs were then observed by SEM (JSM-5510LV; JEOL, Tokyo, Japan).
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2

Nanoemulgel Particle Characterization

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Ten microliters of different gel preparations were diluted with 3 mL of distilled water and the particle size and polydispersity index were measured by Zetasizer Nano (Malvern Panalytical, Worcestershire, UK). The morphology of the nanoemulgel particles was investigated with a scanning electron microscope (JEOL JSM-5510LV, Tokyo, Japan). The nanoemulgel was diluted with water (1:10). One drop of the diluted sample was mounted on a stub covered with double adhesive tape and coated with gold after drying for visualization.
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3

Characterization of Adenine-Containing Aerogels

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The colloid deposits were imaged with a JEOL model JSM-5510LV scanning electron microscope. The chemical compositions were determined by energy dispersive X-Ray spectrometry (EDS) analysis using a scanning electron microscope (SEM, JEOL 5510 LV, Ltd, Tokyo, Japan) with IXRF Systems 500 digital processing. Analyses were conducted on adenine-containing aerogel samples (prepared as previously described by ethanol-adenine injection) after the addition of silver colloid MgCl2 solutions and complete drying.
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4

Detailed Microscopic Examination of Insect Morphology

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Collected individuals were observed and photographed using a digital camera (Raynox DCR-250 Super MacroScan Conversion lens + Canon EF100mm attached to Canon EOS 8000D) and a stereomicroscope (SZX16; Olympus, Tokyo, Japan) equipped with a digital camera (DP50; Olympus, Tokyo, Japan).
Furthermore, to examine the detailed structures of the ventral surface and leg primordia of the tail ends, observations by scanning electron microscope (SEM) were also carried out. Juveniles in the late preparatory period and the rigidation period were fixed with FAA fixative (ethanol/formalin/acetic acid = 16:6:1) for longer than 24 h and preserved in 70% EtOH for observations by SEM. The samples were dehydrated in increasing concentrations of EtOH and dried using a critical point dryer (Samdri-PVT-3D; Tousimis, Rockville, MD, USA). Dried samples were then coated with gold ions with an E-1010 Ion Sputter (Hitachi, Tokyo, Japan). Ion-coated samples were observed by SEM (JSM-5510LV; JEOL, Tokyo, Japan).
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5

Scanning Electron Microscopy and Atomic Force Microscopy Analysis

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Scanning electron micrographs (SEM) were taken using a JEOL JSM-5510LV scanning electron microscope. The samples were mounted with adhesive conducting tape over an aluminium holder and sputtered with gold for 3 minutes (Agar Sputter Coater). The vacuum within the sputter unit was ca. 1 × 10−3 torr.
AFM images were recorded using a MultiMode atomic force microscope (NanoScope IIIa controller; Veeco). The stage was equipped with a video microscope to position the sample on the J scanner base. The samples were fixed to glass coverslips using sticky tabs over stainless steel sample holders. Before AFM analysis, the samples were observed on the metallic discs using a binocular GX reflective optical microscope equipped with a Motticam 2000 microscope digital camera. All images were recorded in tapping mode using TESP 15 series (HQ:NSC15/Al BS) sharpened silicon probes with nominal spring constant of 40 N m−1 and nominal resonance frequency of 325 kHz (μmasch). The scan rate was changed according to the size of the scan area and the features observed on the surface. The scans were analysed using NanoScope software version 6.13 (Veeco). Each height image was processed using the plane-fitting third-order and the flatten zero-order commands in the software. For the amplitude images, the plane-fitting zero-order command was performed.
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6

Characterization of TPU/CIP Composites

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The tensile properties of the samples were tested using a universal testing machine (5960; INSTRON, Boston, MA, USA) at a strain rate of 50 mm/min according to the GBT1040.1-2018 standard. The dielectric and magnetic permeability parameters of the TPU/CIP composites at 0.3–18 GHz were tested using a vector network analyzer (N5224A; Keysight Technologies, Santa Rosa, CA, USA) by the coaxial method. The electromagnetic-wave RL performance of the printed samples was evaluated using the bow method, with the vector network analyzer in 2–18 GHz. The morphology of the CIP/TPU composite samples was observed through scanning electron microscopy (SEM) (JSM-5510 LV; JEOL, Tokyo, Japan) at an accelerating voltage of 20 kV. The samples were cryofractured in liquid nitrogen, and the fractured surfaces were coated with a layer of gold in a vacuum chamber before SEM visualization.
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7

Characterization of Printed Materials

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The morphology of the specimens was observed by an optical microscope (OLYMPUS SZX10, Olympus Corporation, Tokyo, Japan) and a scanning electron microscope (SEM, JEOL JSM5510LV, Tokyo, Japan) equipped with energy dispersive X-ray spectroscopy (EDX, Oxford 7582, Oxfordshire, UK). The crystal structure was characterized by X-ray diffraction (XRD-6000 Cu-Ka radiation, Shimadzu, Tokyo, Japan). Thermogravimetric analysis and differential thermal analysis (DTA) (DTA-TG, Shimadzu DTG-60H, Shima, Tokyo, Japan) were used in the range from room temperature to 1400 °C in a flowing air atmosphere with a heating rate of 5 °C/min. The UV-vis-NIR spectra were obtained with a Cary 5000 UV-vis-NIR spectrophotometer. X-ray computed tomography (CT) scan of the printed part was carried out by using a high-resolution XCT system Phoenix Nanotom® m (GE Phoenix, Lewistown, PA, USA). The density was measured by the Archimedes’ method in water. To calculate the amount of shrinkage of the SLS parts, the dimension of cubic parts was measured by digital Vernier caliper.
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8

Changes in Surface Roughness by Polishing

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In three specimens each for the three polishing conditions (400-grit, 800-grit, and 1500-grit), changes in Ra by polishing were measured every 10 s for 50 s. The Ra of specimens was measured using a surface profilometer (Surfcom 130A, Accretech, Tokyo, Japan), which scanned a sample length of 6.0 mm at 0.6 mm/s with a cut-off value of 0.8 mm. Three scans were recorded at three different locations for each specimen, and the average of three mean Ra measurements was selected as the score for each specimen. Microscopic observations were conducted on 400-grit and 1500-grit specimens before and after polishing for 50 s using a scanning electron microscope (SEM, JSM-5510LV, JEOL, Tokyo, Japan) operating at an accelerating voltage of 20 kV.
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9

Hydrogel Cross-Section Morphology Analysis

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Lyophilized hydrogels were carefully sectioned, fixed on a metal holder and coated with gold. The cross-section morphology of the hydrogel was observed by using a scanning electron microscope (JSM-5510LV, JEOL, Japan).
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10

Actinobacteria Spore Morphology Analysis

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Marine sediment-derived Actinobacteria were examined morphologically in terms of their mycelium production, specifically substratum mycelium (pigmentation) and aerial mycelium (spores). Spore size was measured using scanning electron microscopy (SEM). The spores were washed twice with PBS (0.1 M, pH 7.4), centrifuged, and fixed with glutaraldehyde solution (2.5% in PBS) for 1.5 h at 4°C. The fixed spores were dehydrated using gradient concentration of ethanol (30, 50, 85, 95, 100%) and twice with t-butyl alcohol before freezing at −20°C for 5 min. The spores were viewed under a scanning electron microscope, SEM (JEOL JSM 5510LV) (Fatima et al., 2019 (link)).
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