Sta300

Thermogravimetric analysis (TGA) for NMCs was performed on a TGA 2950, TA Instruments by heating from room temperature to 800 °C at a rate of 10 °C/min in air. TGA/DTA data of the upcycling mixture was collected by STA300, HITACHI, using a heating rate of 5 °C/min from room temperature to 800 °C in air. Scanning electron microscope (SEM) images were captured on a ZEISS AURIGA CROSSBEAM FIB. X-ray diffraction (XRD) patterns were collected by a PANalytical Empyrean diffractometer, operated at 45 kV and 40 mA using Cu Kα (λ = 0.1542 nm). Inductively coupled-plasma optical emission spectroscopy (ICP-OES) for the elemental analysis was performed on an Agilent 5110 ICP-OES spectrometer. X-ray photoelectron spectroscopy (XPS) experiments were performed with a PHI 3056 spectrometer equipped with an Al anode source operated at 15 KV with an applied power of 350 W and a pass energy of 93.5 eV.